"EIA 364-28 TEST CONDITION II" Search Results
"EIA 364-28 TEST CONDITION II" Result Highlights (3)
| Part | ECAD Model | Manufacturer | Description | Download | Buy |
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| ECASD61C107M012KA0 | Murata Manufacturing Co Ltd | 7343 (7343M)/100μF±20%/16Vdc/12mOhm |
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| ECASD61A157M010KA0 | Murata Manufacturing Co Ltd | 7343 (7343M)/150μF±20%/10Vdc/10mOhm |
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| DRV401AIDWPRG4 |
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Fluxgate Magnetic Sensor Signal Conditioning IC for Closed-Loop Applications 20-SO PowerPAD -40 to 125 |
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