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    Untitled

    Abstract: No abstract text available
    Text: Q1-2007 FIT-MTBF REPORT-HBW ASSET 1.5 micron BiPolar Process OPERATING LIFE @ Tj = + 130-150c at rated Voltage Family EA EA EA EA Device SY100E111 SY100E111 SY100E111 SY100E111AEJC Lot. B540EAA B722EE1 B722EF1 2B34006M04 Pkg PLCC-28 PLCC-28 PLCC-28 PLCC-28


    Original     		PDF Q1-2007 130-150c SY100E111 SY100E111AEJC PLCC-28

    B1340

    Abstract: sy10s897 TSMC 0.18 um CMOS 2A243 bcd3 cmos tsmc 0.18 TSMC 0.25Um MIC29203BU Unisem B816E
    Text: Q1-2004-MICREL- PKG STORAGE LIFE TEST BAKE TA = + 150C Package Family PKG Type Lds Device WM W-SOIC W-SOIC W-SOIC WSOIC WSOIC WSOIC WSOIC WSOIC WSOIC WSOIC WSOIC 16 16 16 20 28 28 28 28 28 28 28 MIC2027 MIC2527 MIC2527 MIC2177 MIC1700B SY69952ZC SY69952ZC


    Original     		PDF Q1-2004-MICREL- MIC2027 MIC2527 MIC2177 MIC1700B SY69952ZC SY87701V B1340 sy10s897 TSMC 0.18 um CMOS 2A243 bcd3 cmos tsmc 0.18 TSMC 0.25Um MIC29203BU Unisem B816E

    B144N

    Abstract: No abstract text available
    Text: RELIABILITY REPORT DATE: 5/27/04 QUALITY ENG : PURPOSE: Dana Trinh EA-ASSET 1 Qualification QUAL VEHICLES : PACKAGE TYPE : ASSEMBLY LOC FAB LOC ARRAY PROCESS SY100E111 28L PLCC AMKOR MICREL EA ASSET 1 SY10E416 28L PLCC AMKOR MICREL EA ASSET 1 Product Package


    Original     		PDF SY100E111 SY10E416 SY100S838 SY100S834 JESD-22, JESD78 B144N