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5962-9172701QLA
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Texas Instruments
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Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125 |
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5962-9172701Q3A
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Texas Instruments
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Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125 |
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TLV71727PDQNR
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Texas Instruments
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150mA, Single Output, Low Noise, Low-Dropout Regulator for Portable Devices 4-X2SON -40 to 85 |
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TLV71727PDQNT
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Texas Instruments
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150mA, Single Output, Low Noise, Low-Dropout Regulator for Portable Devices 4-X2SON -40 to 85 |
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TPS51727RHAR
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Texas Instruments
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Dual-Phase, D-CAP+™ Mode Step Down Power Management IC for 50A+ Applications 40-VQFN -10 to 100 |
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