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    9172-24 D506 Search Results

    9172-24 D506 Result Highlights (3)

    Part ECAD Model Manufacturer Description Download Buy
    5962-9172701QLA
    Texas Instruments Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 24-CDIP -55 to 125 Visit Texas Instruments Buy
    5962-9172701Q3A
    Texas Instruments Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops 28-LCCC -55 to 125 Visit Texas Instruments Buy
    5962-9172601M3A
    Texas Instruments Scan Test Devices With Octal Buffers 28-LCCC -55 to 125 Visit Texas Instruments Buy