9410 8 SOIC Search Results

LT6650

Abstract: LT6700 LT685 R170 9410 C 2587 0537
Contextual Info: RELIABILITY DATA LT685 / LT6650 / LT6700 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE HERMETIC PLASTIC DIP SOIC/SOT/MSOP 57 8805 199 9316 153 0337 409 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE PLASTIC DIP

LTC1262

Abstract: LTC1263 9431
Contextual Info: RELIABILITY DATA LTC1262 / LTC1263 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SIDEBRAZE PLASTIC DIP SOIC/SOT/MSOP 79 9613 80 9413 50 9828 209 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE PLASTIC DIP

9952

Abstract: 9613 9410 8 soic 9803 9828 9940 LTC1262 LTC1263
Contextual Info: RELIABILITY DATA LTC1262 / LTC1263 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE SIDEBRAZE PLASTIC DIP SOIC/SOT/MSOP 79 9613 80 9413 50 9828 209 • PRESSURE COOKER TEST AT 15 PSIG, +121°C PACKAGE TYPE SAMPLE SIZE PLASTIC DIP

314-523

Abstract: LT1112 LT1114 R258 11819
Contextual Info: RELIABILITY DATA LT1112 / LT1114 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE PLASTIC DIP SOIC/SOT/MSOP 627 9422 201 9736 828 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE PLASTIC DIP

LT1112

Abstract: LT1114 R258 TO-131 Package
Contextual Info: RELIABILITY DATA LT1112 / LT1114 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE PLASTIC DIP SOIC/SOT/MSOP NEWEST DATE CODE 627 9422 278 9736 905 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH PACKAGE TYPE SAMPLE SIZE OLDEST

9926

Abstract: R040 8443 9842 9926 a LF412 9825 k
Contextual Info: RELIABILITY DATA LT1055/56/57/58 LT1457/62/63/64/65 LF156/356 LF412 OP15/16/215 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE CERDIP FLATPAK/LCC HERMETIC PLASTIC DIP SOIC/SOT/MSOP 1,364 8607 157 9825 4,678 8427 2,643 8428 1,767

LF412

Abstract: R040
Contextual Info: RELIABILITY DATA LT1055/56/57/58 LT1457/62/63/64/65 LF156/356 LF412 OP15/16/215 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE CERDIP FLATPAK/LCC HERMETIC PLASTIC DIP SOIC/SOT/MSOP NEWEST DATE CODE 1,588 8607 237 9825 4,869 8427

L504XXX

Abstract: transistor 9427 m507xxx 9437 transistor CLCC 100 1550371 9434 8 pin integrated circuit
Contextual Info: March 1996 RR-B1A High-Frequency Bipolar Products Reliability Report This report presents the product reliability data for Maxim’s High-Frequency Bipolar analog and digital products. This data was collected from extensive reliability stress tests performed between June 1, 1994 and July 1,

9127 TO-92

Abstract: REF01 LT1019 LT1029 LT580 LT581 REF02
Contextual Info: RELIABILITY DATA LT1019 / LT1029 REF01 / REF02 LT580 / LT581 12/8/2000 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE CERDIP HERMETIC PLASTIC DIP TO-92 49 8701 849 8502 3,215 8519 1,351 9102 5,464 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH

LT1019

Abstract: LT1029 LT580 LT581 REF01 REF02
Contextual Info: RELIABILITY DATA LT1019 / LT1029 REF01 / REF02 LT580 / LT581 8/21/2006 • OPERATING LIFE TEST PACKAGE TYPE SAMPLE SIZE OLDEST DATE CODE CERDIP HERMETIC PLASTIC DIP TO-92 NEWEST DATE CODE 49 8701 849 8502 3,292 8519 1,351 9102 5,541 • HIGHLY ACCELERATED STRESS TEST AT +131°C/85%RH

ST 9427

Abstract: 155-0241 155-0241-02 M726* TRANSISTOR st 9635 1550371 74935 M605030 806-0300 transistor 9427
Contextual Info: December 1997 RR-B2A High-Frequency Bipolar Products Reliability Report This report presents the product reliability data for Maxim’s High-Frequency Bipolar analog and digital products. This data was collected from extensive reliability stress tests performed between June 1, 1994 and

Contextual Info: 410 ß National Semiconductor 54F/74F410 Register Stack— 16 x 4 RAM TRI-STATE Output Register General Description Features The 'F410 is a register-oriented high-speed 64-bit Read/ Write Memory organized as 16-words by 4-bits. An edgetriggered 4-bit output register allows new input data to be

power supply ic 9435

Abstract: 49C466 74FCT245 A101 A102 A104 A106 A110 PDIP-20 Monitor Hyundai Service
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS JULY 1995 IDT QUALITY SERVICE QSP PERFORMANCE 3001 Stender Way, Santa Clara, CA 95054 TEL: 408 727-6116 FAX: (408) 492-8362 IDT QUALITY & RELIABILITY MONITOR REPORT JULY 1995 TABLE OF CONTENTS

9538-4

Abstract: 54F410DM 54F410LM 74F410PC 74F410SC F410 J18A N18A W20A MET otto
Contextual Info: A ugust 1995 54F/74F410 Register Stack— 16 x 4 RAM TRI-STATE Output Register General Description Features The ’F410 is a register-oriented high-speed 64-bit R e a d / W rite M em ory organized as 16-w ords b y 4-bits. An edgetriggered 4-bit output register a llow s new input data to be

20-him

Contextual Info: A ugust 1995 Semiconductor 5 4 F /7 4 F 4 1 0 R egister Stack— 16 x 4 RAM TR I-STA TE O utput R egister General Description Features The ’F410 is a register-oriented high-speed 64-bit R e a d / W rite M em ory organized as 16-w ords b y 4-bits. An edgetriggered 4-bit output register a llow s new input d ata to be

transistor c815

Abstract: pdf transistor c815 c815 transistor c815 R819 transistor c814 C807 330uf transistor apm3055 equivalent apm3055 TRANSISTOR c816
Contextual Info: APW3007 Advanced Dual PWM and Dual Linear Power Controller Features General Description • The APW3007 provides the power control and protection for four output voltage in high-performance microprocessor and computer applications. The APW3007 is designed to provide termination

transistor c815

Abstract: c815 transistor transistor D800 APW 7313 transistor c814 C817 C815 transistor apm3055 ut 803B core i5 MOTHERBOARD CIRCUIT diagram
Contextual Info: APW3007 Advanced Dual PWM and Dual Linear Power Controller Features General Description • The APW3007 provides the power control and protection for four output voltage in high-performance microprocessor and computer applications. The APW3007 is designed to provide termination

4-bit bidirectional shift register 74 194

Abstract: 74Fxxx e smd diode TBA 828 1240a smd 64 CERAMIC LEADLESS CHIP CARRIER LCC t 04 27 smd TBA 940 4 nand dip 16 ECL binary Counter
Contextual Info: September 1995 Advanced TTL Logic KEY ALS AS FAST FASTr TM T e available in JEDEC e e available in EIAJ Te e available in JEDEC and EIAJ w e available in wide format Tw e available in standard and Pw e planned in standard wide format available in wide format

TTI7154-R

Abstract: transformer specification single line diagram HALO Electronics Part numbering system Halo h1 2048KHZ PE-65835 XRT59L91
Contextual Info: XRT59L91 Single-Chip E1 Line Interface Unit October 1999-1 FEATURES • Complete E1 CEPT line interface unit (Transmitterand Receiver) • Supports both Local- and Remote-Loop back Operations • Generates transm it output pulses that are compliant with the ITU-T G.703 Pulse Template

PIN IC 7308

Abstract: Transpower Technologies 6 pin pulse transformer tg26-1205 transformer specification single line diagram PE-65835 XRT59L91 XRT59L91ID
Contextual Info: XRT59L91 Single-Chip E1 Line Interface Unit October 1999-1 FEATURES l Complete E1 CEPT line interface unit (Transmitter and Receiver) l Supports both Local- and Remote-Loop back Operations l Generates transmit output pulses that are compliant with the ITU-T G.703 Pulse Template

tip37

Abstract: PE65835 PE-65835 TG26-1205 XRT59L91 XRT59L91ID
Contextual Info: XRT59L91 Preliminary Single-Chip E1 Line Interface Unit October 1999-1 FEATURES l Complete E1 CEPT line interface unit (Transmitter and Receiver) l Supports both Local- and Remote-Loop back Operations l Generates transmit output pulses that are compliant with the ITU-T G.703 Pulse Template

power supply ic 9435

Abstract: 9435, ic ic 9435 9435 49C460 malaysia IC olin 7026 SRAM 6116 report on PLCC f 9222 l
Contextual Info: INTEGRATED DEVICE TECHNOLOGY, INC. QUALITY & RELIABILITY MONITORS JULY 1995 IDT QUALITY SERVICE QSP PERFORMANCE 3001 Stender Way, Santa Clara, CA 95054 TEL: 408 727-6116 FAX: (408) 492-8362 IDT QUALITY & RELIABILITY MONITOR REPORT JULY 1995 TABLE OF CONTENTS

Contextual Info: XRT59L91 Single-Chip E1 Line Interface Unit October 1999-1 FEATURES l Complete E1 CEPT line interface unit (Transmitter and Receiver) l Supports both Local- and Remote-Loop back Operations l Generates transmit output pulses that are compliant with the ITU-T G.703 Pulse Template

ic 9399 g

Abstract: hp cartridge pinout
Contextual Info: Bipolar/JFET, Audio Operational Amplifier 0P176* ANALOG DEVICES □ PIN CONNECTIONS FEATURES _ Low Noise: 6 nV/\'Hz High Slew Rate: 25 V/jis Wide Bandwidth: 10 MHz Low Supply Current: 2.5 mA Low Offset Voltage: 1 mV Unity Gain Stable SO-8 Package -Lead Narrow-Body SO