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    CD54HCT4543

    Abstract: CD54HC4543
    Text: D05b05l> ^ M H A S _ HARRIS SEMICOND SECTOR 3 -~ High-Reliability High-Speed CMOS Logic ICs CD54HC4520/3A CD54HCT4520/3A T ^S -Z S -O S Switching Speed Limits with black dots (• are tested 100%.) SWITCHING CHARACTERISTICS (CL = 50 pF, Input t „ t, = 6 ns)


    OCR Scan     		PDF D05b05l> CD54HC4520/3A CD54HCT4520/3A CD54HC/HCT4520 54HCT CD54HC4543/3A CD54HCT4543/3A CD54HCT4543 CD54HC4543

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    Abstract: No abstract text available
    Text: HARRIS SEMICOND SECTOR 37E D • High-Reliabillty High-Speed CMOS Logic ics - ^ LJ3G2271 0G2b053 2 BIHAS SQ|_X] STATE - CD54HC4518/3A CD54HCT 4518/3A ' ^ 4 5 -2 5 -0 5 Burn-In Test-Circuit Connections Static OPEN 3-6,11-14 CD54HC/HCT 4518 Dynamic


    OCR Scan     		PDF LJ3G2271 0G2b053 CD54HC4518/3A CD54HCT 4518/3A CD54HC/HCT CD54HC/HCT4518 2k-47k CD54HC4520/3A CD54HCT4520/3A