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    BUK9508-55A

    Abstract: No abstract text available
    Text: AN11243 Failure signature of electrical overstress on power MOSFETs Rev. 01 — 29 October 2012 Application note Document information Info Content Keywords Power MOSFETs, Electrical Overstress EOS , Unclamped Inductive Switching (UIS) Abstract When Power MOSFETs fail, there is often extensive damage. Examination


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