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Catalog Datasheet | Type | Document Tags | |
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BUK9508-55AContextual Info: AN11243 Failure signature of electrical overstress on power MOSFETs Rev. 01 — 29 October 2012 Application note Document information Info Content Keywords Power MOSFETs, Electrical Overstress EOS , Unclamped Inductive Switching (UIS) Abstract When Power MOSFETs fail, there is often extensive damage. Examination |
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AN11243 BUK9508-55A |