APD RISE TIME, DARK, CAPACITANCE Search Results
APD RISE TIME, DARK, CAPACITANCE Result Highlights (5)
Part | ECAD Model | Manufacturer | Description | Download | Buy |
---|---|---|---|---|---|
GC321AD7LP153KX18D | Murata Manufacturing Co Ltd | High Effective Capacitance & High Ripple Current Chip Multilayer Ceramic Capacitors for Automotive |
![]() |
||
GC331BD7LP473KX18L | Murata Manufacturing Co Ltd | High Effective Capacitance & High Ripple Current Chip Multilayer Ceramic Capacitors for Automotive |
![]() |
||
GC332DD7LP154KX18L | Murata Manufacturing Co Ltd | High Effective Capacitance & High Ripple Current Chip Multilayer Ceramic Capacitors for Automotive |
![]() |
||
GC343DD7LQ154KX18L | Murata Manufacturing Co Ltd | High Effective Capacitance & High Ripple Current Chip Multilayer Ceramic Capacitors for Automotive |
![]() |
||
GC355DD7LQ334KX18L | Murata Manufacturing Co Ltd | High Effective Capacitance & High Ripple Current Chip Multilayer Ceramic Capacitors for Automotive |
![]() |
APD RISE TIME, DARK, CAPACITANCE Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
---|---|---|---|
IC 571
Abstract: 118-70-74-591 394-70-74-591 LM335 OM350
|
Original |
100kHz 675nm 118the LM335 350nm. IC 571 118-70-74-591 394-70-74-591 OM350 | |
apd arrayContextual Info: Si APD array S8550-02 4 x 8 element APD array with low noise and enhanced short-wavelength sensitivity The S8550-02 is an APD avalanche photodiode array designed for short wavelength detection, featuring low noise and low terminal capacitance. The S8550-02 also offers uniform gain and small crosstalk between each element. |
Original |
S8550-02 S8550-02 SE-171 KAPD1031E01 apd array | |
Contextual Info: Si APD array S8550-02 4 x 8 element APD array with low noise and enhanced short-wavelength sensitivity The S8550-02 is an APD avalanche photodiode array designed for short wavelength detection, featuring low noise and low terminal capacitance. The S8550-02 also offers uniform gain and small crosstalk between each element. |
Original |
S8550-02 S8550-02 KAPD1031E01 | |
Contextual Info: DATASHEET Photon Detection C30737LH-300 Series Low Capacitance Silicon Avalanche Photodiode in Leadless Ceramic Carrier SMT Package for High Volume Laser Meter and Range Finding Applications Key Features • Low capacitance, <1pF, for high |
Original |
C30737LH-300 C30737LH-Rev | |
S13081
Abstract: APD Arrays
|
Original |
org/abs/1003 6071v2 S13081 APD Arrays | |
SSO-AD-500-TO52iContextual Info: SSO-AD-500-TO52i Avalanche Photodiode Special characteristics: High gain at low bias voltage Fast rise time 500 µm diameter active area low capacitance Package 1a TO52i : Parameters: 2 active area 1) Dark current (M=100) 1) Total capacitance (M=100) Break down voltage UBR |
Original |
SSO-AD-500-TO52i SSO-AD-500-TO52i | |
Avalanche photodiode APDContextual Info: SSO-AD-500-TO52 NF Avalanche Photodiode Special characteristics: High gain at low bias voltage Fast rise time 500 µm diameter active area low capacitance Package 2a TO52 Nail head : Parameters: 2 active area 1) dark current (M=100) 1) Total capacitance |
Original |
SSO-AD-500-TO52 Avalanche photodiode APD | |
Contextual Info: SSO-AD-500-TO52 Avalanche Photodiode Special characteristics: High gain at low bias voltage Fast rise time 500 µm diameter active area low capacitance Parameters: Package 1 TO52 : 2 Active area 1) dark current (M=100) 1) Total capacitance (M=100) Break-down voltage UBR |
Original |
SSO-AD-500-TO52 50oltage | |
TO52
Abstract: SSO-AD-230-TO52-S1
|
Original |
SSO-AD-230-TO52-S1 TO52 SSO-AD-230-TO52-S1 | |
avalanche photodiode noise factorContextual Info: SSO-AD-230-TO52i Avalanche Photodiode Special characteristics: High gain at low bias voltage Fast rise time 230 µm diameter active area low capacitance Package 1a TO52i : Parameters: 2 Active area 1) dark current (M=100) 1) Total capacitance (M=100) Break-down voltage UBR |
Original |
SSO-AD-230-TO52i avalanche photodiode noise factor | |
TO52 packageContextual Info: SSO-AD-500-TO52-S1 Avalanche Photodiode Special characteristics: High gain at low bias voltage Fast rise time 500 µm diameter active area low capacitance Package TO52 S1 : Parameters: 2 active area 1) dark current (M=100) 1) Total capacitance (M=100) Break-down voltage UBR |
Original |
SSO-AD-500-TO52-S1 TO52 package | |
nir sourceContextual Info: SSO-AD-230-TO52 NF Avalanche Photodiode Special characteristics: High gain at low bias voltage Fast rise time 230 µm diameter active area low capacitance Package 2a TO52 Nail head : Parameters: 2 Active area 1) dark current (M=100) 1) Total capacitance |
Original |
SSO-AD-230-TO52 nir source | |
Avalanche photodiode APDContextual Info: SSO-AD-230-TO52 Avalanche Photodiode Special characteristics: High gain at low bias voltage Fast rise time 230 µm diameter active area low capacitance Package 1 TO52 : Parameters: 2 active area 1) Dark current (M=100) 1) Total capacitance (M=100) Break down voltage UBR |
Original |
SSO-AD-230-TO52 Avalanche photodiode APD | |
InGaAs apd photodiode
Abstract: UDT Sensors Photodiode laser detector BPX-65
|
Original |
||
|
|||
C30955EHContextual Info: Long Wavelength Enhanced Silicon APD C30954EH, C30955EH and C30956EH Series Overview Features and Benefits The Excelitas C30954EH, C30955EH, and C30956EH are general purpose silicon avalanche photodiodes made using a double-diffused "reach through" structure. The design of these |
Original |
C30954EH, C30955EH C30956EH C30955EH, C30956EH C30954EH DTS0308 | |
C30955EHContextual Info: Overview Features and Benefits The PerkinElmer C30954EH, C30955EH, and C30956EH are general purpose silicon avalanche photodiodes made using a double-diffused "reach through" structure. The design of these photodiodes such that their long wave response i.e. > 900 nm has been |
Original |
C30954EH, C30955EH, C30956EH C30954EH C30956EH. DTS0308 C30955EH | |
Contextual Info: Silicon Geiger Mode Avalanche Photodiode DESCRIPTION The SAP500-Series is based on a “reach-through” structure for excellent quantum efficiency, extremely low noise and bulk dark current and high gain. They are intended for ultra-low light level applications. This APD can be used in |
Original |
SAP500-Series | |
C30737LH-500-92
Abstract: CERAMIC LEADLESS CHIP CARRIER
|
Original |
C30737PH C30737LH C30737 C30737PH-LH-Rev C30737LH-500-92 CERAMIC LEADLESS CHIP CARRIER | |
C30902EHContextual Info: Silicon Avalanche Photodiodes C30902 Series High Speed APDs for Analytical and Biomedical Lowest Light Detection Applications Overview Features and Benefits Excelitas’ C30902EH avalanche photodiode is fabricated with a doublediffused “reach-through” structure. This |
Original |
C30902 C30902EH C30921EH DTS0408 | |
Infrared detectors
Abstract: dark detector application ,uses and working
|
Original |
||
Contextual Info: Detectors Silicon Geiger Mode Avalanche Photodiode Description The SAP500-Series is based on a “reach-through” structure for excellent quantum efficiency, extremely low noise and bulk dark current and high gain. They are intended for ultra-low light level applications. This APD can be used |
Original |
SAP500-Series | |
Contextual Info: Detectors Silicon Geiger Mode Avalanche Photodiode Description The SAP500-Series is based on a “reach-through” structure for excellent quantum efficiency, extremely low noise and bulk dark current and high gain. They are intended for ultra-low light level applications. This APD can be used |
Original |
SAP500-Series | |
Contextual Info: Detectors Silicon Geiger Mode Avalanche Photodiode Description The SAP500-Series is based on a “reach-through” structure for excellent quantum efficiency, extremely low noise and bulk dark current and high gain. They are intended for ultra-low light level applications. This APD can be used |
Original |
SAP500-Series | |
Peltier
Abstract: apd 400- 700 nm peltier cooler peltier datasheet TO8 package
|
Original |
SSO-ADH-1100-TO8P Peltier apd 400- 700 nm peltier cooler peltier datasheet TO8 package |