CHN 848 Search Results
CHN 848 Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
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wind turbine
Abstract: VDE110 VDE110 din CHN 848 VMN-PT0279-1203 CNY64ST CNY65 CNY65A CNY66
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CNY64ST CNY65ST CNY64AYST CNY65AYST CNY64ABST CNY64AGRST CNY65ABST CNY65AGRST CNY64 CNY64A wind turbine VDE110 VDE110 din CHN 848 VMN-PT0279-1203 CNY65 CNY65A CNY66 | |
1/CHN 326Contextual Info: 21Ü 2 Megabit 256K x 8 Multi-Purpose Flash SST39SF020 Data Sheet FEATURES: • • • Organized as 256 K X 8 Fast Sector Erase and Byte Program: Single 5.0V Read and Write Operations - Superior Reliability - • • Active Current: 20 mA (typical) Standby Current: 10 |iA (typical) |
OCR Scan |
SST39SF020 1/CHN 326 | |
Contextual Info: 21Ü 16 Megabit FlashBank Memory SST38UF166 Advance Information FEATURES: • • • Single 2.2-2.8V Read and Write Operations Read Access Time Separate Memory Banks for Code or Data - - Latched Address and Data Superior Reliability End of Write Detection |
OCR Scan |
SST38UF166 | |
CHN 512
Abstract: CHN 314 1/CHN 852
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SST39SF512 CHN 512 CHN 314 1/CHN 852 | |
chn 348
Abstract: CHN 314 chn 317 CHN 852 chn 440
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SST37VF020 32-Pin SST37VF020 chn 348 CHN 314 chn 317 CHN 852 chn 440 | |
Contextual Info: 8 Megabit Flash + 2 Megabit SRAM ComboMemory SST32LH802 Advance Inform ation FEATURES: • Organized as 512 K x16 Flash + 128Kx16 SRAM or 512K x8 x2 Flash + 128K x8 x2 SRAM • Single 3.0-3.6V Read and Write Operations • Concurrent Operation - Read from or write to SRAM while erase/ |
OCR Scan |
SST32LH802 128Kx16 SST32LH802 | |
Contextual Info: 21Ü 1 Megabit 128K x 8 Multi-Purpose Flash SST39SF010 Data Sheet FEATURES: • Organized as 128K X 8 • Single 5.0V Read and Write Operations • Superior Reliability - Endurance: 100,000 Cycles (typical) - Greater than 100 years Data Retention Low Power Consumption: |
OCR Scan |
SST39SF010 | |
Contextual Info: iiili 8 Megabit 1M x 8-Bit Multi-Purpose Flash _ SST39VF080Q_ Advance Information FEATURES: • Organized as 1M x 8 • Latched Address and Data • Single 2.7-3.6V Read and Write Operations • Fast Sector Erase and Byte Program: |
OCR Scan |
SST39VF080Q_ SST39VF080Q | |
27721Contextual Info: iiili 16 Megabit 2M x 8-Bit Multi-Purpose Flash _ SST39VF016Q_ Advance Information FEATURES: • Organized as 2 M X 8 • Latched Address and Data • Single 2.7-3.6V Read and Write Operations • Fast Sector Erase and Byte Program: |
OCR Scan |
SST39VF016Q_ SST39VF016Q Multi58-4276 27721 | |
oasis
Abstract: SST39VF400 SST39VF400 read code
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OCR Scan |
16-Bit) SST39VF400 oasis SST39VF400 SST39VF400 read code | |
CHN 345 XContextual Info: 4 Megabit 512K x 8 SuperFlash MTP SST37VF040 Prelim inary Specifications FEATURES: • • 2.7-3.6V Read Operation Fast Programming Operation Superior Reliability - - Features Electrical Erase Endurance: At least 1000 Cycles Greater than 100 years Data Retention |
OCR Scan |
SST37VF040 32-Pin SST37VF040 CHN 345 X | |
CHN 602
Abstract: CHN 847
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SST29EE020 SST29LE020 SST29VE020 CHN 602 CHN 847 | |
CHN 847
Abstract: chn 734
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SST29EE010 SST29LE010 SST29VE010 and-1102 CHN 847 chn 734 | |
CHN 847
Abstract: 29EE512
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SST29EE512 SST29LE512 SST29VE512 CHN 847 29EE512 | |
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Contextual Info: f r 2 Megabit 128K x 16-Bit Multi-Purpose Flash SST39VF200 Advance Information FEATURES: • Organized as 128K x16 • Single 2.7-3.6V Read and Write Operations • Superior Reliability - • • Uniform 32 KWord blocks Fast Read Access Time: - • Uniform 2 KWord sectors |
OCR Scan |
16-Bit) SST39VF200 | |
TEKELEC te 306
Abstract: 30601
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OCR Scan |
SST29EE020A SST29LE020A SST29VE020A Reliability526-1102 TEKELEC te 306 30601 | |
actron ab
Abstract: 11a18 CHN 949 VF800
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OCR Scan |
16-Bit) SST39VF800Q SST39VF800 SST39VF800Q actron ab 11a18 CHN 949 VF800 | |
CHN 329
Abstract: DP 904C
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OCR Scan |
16-Bit) SST39VF160Q SST39VF160 SST39VF160Q CHN 329 DP 904C | |
chn 347Contextual Info: 1 Megabit 128K x 8 SuperFlash MTP SST37VF010 Preliminary Specifications FEATURES: • • 2.7-3.6V Read Operation Fast Programming Operation Superior Reliability - - Features Electrical Erase Endurance: At least 1000 Cycles Greater than 100 years Data Retention |
OCR Scan |
SST37VF010 32-Pin SST37VF010 chn 347 | |
Contextual Info: 512 Kilobit 64K x 8 Page Mode EEPROM SST29EE512A / SST29LE512A / SST29VE512A Data Sheet FEATURES: • Single Voltage Read and Write Operations - 5.0V-only for SST29EE512A - 3.0-3.6V for SST29LE512A - 2.7-3.6V for SST29VE512A • Superior Reliability - Endurance: 100,000 Cycles (typical) |
OCR Scan |
SST29EE512A SST29LE512A SST29VE512A SST29EE512A SST29LE512A SST29EE512A/29LE512A/29VE512A | |
Ff-352
Abstract: Ff352 HE 301 chn 511 CHN 549 chn 440
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OCR Scan |
16-Bit) SST39LH160Q SST39LH160 SST39LH160Q Ff-352 Ff352 HE 301 chn 511 CHN 549 chn 440 | |
CHN 949
Abstract: tr/pcb-2-1/TRANSISTOR chn 602
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OCR Scan |
SST31LH041_ CHN 949 tr/pcb-2-1/TRANSISTOR chn 602 | |
CHN b42
Abstract: chn 743 pin of chn 743 chn 529 CHN 524 chn 729 CHN 849 CHN 616 CHN 847 RYM 17-18
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ADSP-21065L I-127 I-128 16-bit CHN b42 chn 743 pin of chn 743 chn 529 CHN 524 chn 729 CHN 849 CHN 616 CHN 847 RYM 17-18 | |
B238BContextual Info: 642-*B ?A0:7;7/@A>3 ?75;/9 >39/E 4JFVWTJU ^ 9eW ^c_f_]nlc] mnl_hanb /\_nq_h ]icf [h^ ]ihn[]nm0 ^ Tola_ qcnbmn[h^ pifn[a_ oj ni <666WBD2 g_nm GDD Q[ln <> [h^ U_f_]il^c[ ^ Nch4 ]l_j[a_ cm 84;gg /\_nq_h ]icf [h^ ]ihn[]n02 Nch4 ]f_[l[h]_ cm 846gg /\_nq_h ]icf [h^ ]ihn[]n0 |
Original |
666WBD2 846gg 96gWED0 B238B |