CTL 127 Search Results

Contextual Info: 401036.03BB 3/11/02 3:40 PM Page 138 COMPRESSION Colour-Coded Compression Connectors ® Type CTL — Copper Lugs, 1-Hole Mount, Long Barrel Cat. No. Copper Compression Connectors • For use with copper conductor: AWG stranded, flexible cable, welding cable

tic 128d

Contextual Info: W h a t HEW LETT mLUM PA C K A R D General Purpose Motion Control IC Technical Data H CTL-1100 S e rie s F e a tu r e s D e s c r ip tio n • Low P ow er CMOS • PDIP and PLCC V ersions A vailable • E nhanced V ersion o f the HCTL-1000 • DC, DC B rushless, and

SPM3255

Abstract: marking ML
Contextual Info: Ordering number:ENN6351 SPM3255 Single Power Supply Operation RF Switch MMIC Features Package Dimensions • Control voltage +3 / 0V. · Mini molded package. · Low insertion loss, high linearity. unit:mm 1273 [SPM3255] 0.6 0.4 6 0.16 4 0.95 0.95 1.9 2.9 3

MPC555

Abstract: G427
Contextual Info: SECTION 22 IEEE 1149.1-COMPLIANT INTERFACE JTAG The MPC555 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1-1990 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to development

G150C

Abstract: G150 G200 G203 G204 MPC821 g80.ctl g84c
Contextual Info: SECTION 20 IEEE 1149.1 TEST ACCESS PORT The MPC821 provides a dedicated user—accessible test access port TAP that is fully compatible with the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to

G545

Abstract: MPC555 g545 b2 G306 G340 G409 G335 g307.ctl
Contextual Info: SECTION 22 IEEE 1149.1-COMPLIANT INTERFACE JTAG The MPC555 / MPC556 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1-1990 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to

G337

Abstract: g545 MPC556 G409 MPC555 g229 G-403-C G-309-C G-405-C g307.ctl
Contextual Info: SECTION 22 IEEE 1149.1-COMPLIANT INTERFACE JTAG The MPC555 / MPC556 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1-1990 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to

MPC860 jtag

Abstract: tms 1943 G150 G200 G203 G204 MPC860 MPC860 equivalent g80.ctl G100C
Contextual Info: SECTION 19 IEEE 1149.1 TEST ACCESS PORT The MPC860 provides a dedicated user—accessible test access port TAP that is fully compatible with the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to

g92.ctl

Abstract: G150 G151 G200 G203 G204 MPC823
Contextual Info: SECTION 21 IEEE 1149.1 TEST ACCESS PORT The MPC823 provides a dedicated user-accessible test access port TAP that is fully compatible with the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led tothe

G545

Abstract: g545 b2 MPC555 G409C 74 164 14 PIN DIAGRAM g307.ctl 74HC7541DB G404 g408 chip g408.ctl
Contextual Info: SECTION 22 IEEE 1149.1-COMPLIANT INTERFACE JTAG The MPC555 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1-1990 Standard Test Access Port and Boundary Scan Architecture . Problems associated with testing high-density circuit boards have led to development

b1a12

Abstract: K4S1G0632B PC133 SDRAM registered DIMM 512MB samsung M390S2950BTU-C7A M390S2953BT1-C7A M390S5658BT1-C7A M390S5658BTU-C7A M390S6553BT1-C7A M390S6553BTU-C7A K4S510832
Contextual Info: 512MB, 1GB, 2GB Registered DIMM SDRAM SDRAM Registered Module 168pin Registered Module based on 512Mb B-die with 72-bit ECC Revision 1.0 January 2004 * Samsung Electronics reserves the right to change products or specification without notice. Rev. 1.0 January 2004

b1a12

Abstract: B1A10 K4S1G0632D K4S510832d K4S1G0632 B1A0
Contextual Info: 1GB, 2GB Registered DIMM SDRAM SDRAM Registered Module 168pin Registered Module based on 512Mb D-die 54 TSOP-II with Pb-Free RoHS compliant INFORMATION IN THIS DOCUMENT IS PROVIDED IN RELATION TO SAMSUNG PRODUCTS, AND IS SUBJECT TO CHANGE WITHOUT NOTICE.

T1433-2

Abstract: MAX1512 MAX1512ETA MO229
Contextual Info: 19-2911 Rev 2; 8/04 KIT ATION EVALU E L B A IL AVA EEPROM-Programmable TFT VCOM Calibrator The MAX1512 is a programmable VCOM-adjustment solution for thin-film transistor TFT liquid-crystal displays (LCDs). The MAX1512 simplifies the labor-intensive VCOM-adjustment process and replaces mechanical

16-STATE

Abstract: MC68341
Contextual Info: SECTION 1O IEEE 1149.1 TEST ACCESS PORT The MC68341 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to development of this

b1a12

Abstract: PC133 SDRAM registered DIMM 512MB samsung pc133 sdram 512mb ECC unbuffered K4S560832E M390S2858ET1-C7A M390S2858ETU-C7A M390S3253ET1-C7A M390S3253ETU-C7A M390S6450ET1-C7A M390S6450ETU-C7A
Contextual Info: 256MB, 512MB, 1GB Registered DIMM SDRAM SDRAM Registered Module 168pin Registered Module based on 256Mb E-die with 72-bit ECC Revision 1.4 May 2004 * Samsung Electronics reserves the right to change products or specification without notice. Rev. 1.4 May 2004

b1a12

Abstract: 1gb pc133 SDRAM DIMM B0BA K4S560832E M390S2858ET1-C7A M390S2858ETU-C7A M390S3253ET1-C7A M390S3253ETU-C7A M390S6450ET1-C7A M390S6450ETU-C7A
Contextual Info: 256MB, 512MB, 1GB Registered DIMM SDRAM SDRAM Registered Module 168pin Registered Module based on 256Mb E-die with 72-bit ECC Revision 1.0 June 2003 Rev. 1.0 June 2003 256MB, 512MB, 1GB Registered DIMM SDRAM Revision History Revision 0.0 June., 2003 - First release

Contextual Info: 256MB, 512MB, 1GB Registered DIMM SDRAM SDRAM Registered Module 168pin Registered Module based on 256Mb E-die with 72-bit ECC Revision 1.6 October 2006 * Samsung Electronics reserves the right to change products or specification without notice. Rev. 1.6 Oct. 2006

Contextual Info: 19-2911 Rev 2; 8/04 KIT ATION EVALU E L B A IL AVA EEPROM-Programmable TFT VCOM Calibrator The MAX1512 is a programmable VCOM-adjustment solution for thin-film transistor TFT liquid-crystal displays (LCDs). The MAX1512 simplifies the labor-intensive VCOM-adjustment process and replaces mechanical

b1a12

Abstract: PC133 SDRAM registered DIMM 512MB samsung pc133 sdram 512mb ECC unbuffered K4S560832E M390S2858ET1-C7A M390S2858ETU-C7A M390S3253ET1-C7A M390S3253ETU-C7A M390S6450ET1-C7A M390S6450ETU-C7A
Contextual Info: 256MB, 512MB, 1GB Registered DIMM SDRAM SDRAM Registered Module 168pin Registered Module based on 256Mb E-die with 72-bit ECC Revision 1.2 February 2004 * Samsung Electronics reserves the right to change products or specification without notice. Rev. 1.2 February 2004

Contextual Info: 19-2911 Rev 3; 8/06 KIT ATION EVALU E L B A IL AVA EEPROM-Programmable TFT VCOM Calibrator The MAX1512 is a programmable VCOM-adjustment solution for thin-film transistor TFT liquid-crystal displays (LCDs). The MAX1512 simplifies the labor-intensive VCOM-adjustment process and replaces mechanical

MC68349

Contextual Info: SECTION S IEEE 114S.1 TEST ACCESS PORT The MC68349 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to development of this

b1a12

Contextual Info: White Electronic Designs WV3DG72256V-AD2 PRELIMINARY 2GB – 2x128Mx72 SDRAM, REGISTERED FEATURES DESCRIPTION „ Burst Mode Operation „ Auto and Self Refresh capability „ LVTTL compatible inputs and outputs „ Serial Presence Detect with EEPROM „ Fully synchronous: All signals are registered on the

Contextual Info: Programmable VCOM Calibrator with EEPROM and Output Buffer ISL24212 Features The ISL24212 is an 8-bit programmable current sink that can be used in conjunction with an external voltage divider to generate a voltage source VCOM positioned between the analog supply

MC68340

Contextual Info: SECTION S IEEE 114S.1 TEST ACCESS PORT The MC68340 includes dedicated user-accessible test logic that is fully compatible with the IEEE 1149.1 Standard Test Access Port and Boundary Scan Architecture. Problems associated with testing high-density circuit boards have led to development of this