EIA-364-23 CONNECTOR Search Results

GP811

Abstract: gp823 Samtec HPF 47701 Fluke 73 series iii
Contextual Info: SEPTEMBER 28, 1999 TEST REPORT #99447 QUALIFICATION TESTING HPF CONNECTOR SERIES SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. TEST RESULTS Gas Tight Series Group 1 TR# 99447 9 of 44 99447 PROJECT NO.:

Carlisle Interconnect Technologies

Contextual Info: High Density RF Interconnect z H G 40 HDRFI Offerings RF D-SUB & MIXED SIGNAL The RF D-Sub connector family is available in four different shell sizes and can be used in cable-to-cable, cable-toboard or board-to-board applications. Designed with high performance in mind, the insert arrangements are maximized

intel 94v-0 MOTHERBOARD MANUAL

Abstract: ls 36 motherboard manual intel traceability idc connector 10 pin intel date code marking sn SMA EIA-364 ink cartridge chip Accelerometer 300g "pin to pin capacitance" A157
Contextual Info: 330-Contact Slot Connector SC330 Design Guidelines Release Date: September 1998 Order Number: 244428-001 330-Contact Slot Connector (SC330) Design Guidelines Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual

intel d3001

Abstract: 243397 411C A121 B121 D3001 intel traceability code Single Edge Contact (S.E.C.) Cartridge:
Contextual Info: E Slot 1 Connector Design Guidelines August 1997 Order Number: 243397-001 9/15/97 11:58 AM 24339701.DOC INTEL CONFIDENTIAL until publication date E Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or

Contextual Info: MAY 30,1997 TEST REPORT #97144 QUALIFICATION TESTING SOLC/TOLC SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. L ~-Jqiijzii$ Contech Research CERTIFICATION This is to certify that the evaluation described herein was

FCI plating specification 10064183

Abstract: plating specification 10064183 GS-12-149 25 PIN D TYPE connectors fci MAKE FCI 51939 FCI 51940 FCI Connector 51939 GS-29-149 BUS-12-111 header plug fci
Contextual Info: NUMBER TYPE GS-12-149 PRODUCT SPECIFICATION TITLE PAGE REVISION 1 of 13 PwrBlade Product Specification AUTHORIZED BY Jerome Chen N DATE 21 Jan 08 CLASSIFICATION UNRESTRICTED 1.0 OBJECTIVE This specification defines the performance, test, quality and reliability requirements of the PwrBlade Connector

Contextual Info: SEPTEMBER 29, 1995 TEST REPORT #95445 QUALIFICATION TESTING FTM/CLM SERIES SAMTEC CORPORATION APPROVED BY:' MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. I 1 Contech Research ’ , i .* ’ This is to certify that the evaluation described herein was

samtec connector lc

Contextual Info: TEST REPORT #98150 QUALIFICATION TESTING mm*., , n nr., ‘I‘bW / >aw SAMTEC CORPORATION .: :, <’ AUGUST 13,1998 TEST REPORT #98150 QUALIFICATION TESTING TSW/SSW SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC.

CL4 valve

Abstract: t122 25 3
Contextual Info: APRIL 7,1998 TEST REPORT #97626 QUALIFICATION TESTING CSB/MSB SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was

Contextual Info: NOVEMBER 25,1998 TEST REPORT #98406 QUALIFICATION TESTING MECl SAMTEC CORPORATION / , &v/M’/* APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was

82597

Contextual Info: r OCTOBER I,1997 TEST REPORT #97359 QUALIFICATION TESTING OPC SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research 1 CERTIFICATION This is to certify that the evaluation described herein was

EIA-364 temperature rise

Contextual Info: NOVEMBER 25,1998 TEST REPORT #98406 QUALIFICATION TESTING MECl SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was

i8271

Abstract: 85047A DP116-KC2 e/csb 485 E2
Contextual Info: APRIL 7,1998 TEST REPORT #97626 QUALIFICATION TESTING CSB/MSB SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research April 07, 1998 EQUIPMENT LIST ID# 1 Next Cal 1 Last Cal 1 I I 473 474

EIA364

Abstract: EIA-364
Contextual Info: JUNE 30,1997 TEST REPORT #97236 QUALIFICATION TESTING FLE/FTSH SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was

99093

Abstract: 3478A DFIS-100
Contextual Info: MAY 28,1999 TEST REPORT 1198643 QUALIFICATION TESTING PSS-23-01-T-S HFWS-20-01-T-S SAMTEC CORPOR4TION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was

Contextual Info: APRIL 21,1998 TEST REPORT #98093 QUALIFICATION TESTING SE1 CERTIFICATION This is to certify that the evaluation described herein was designed and executed by personnel of Contech Research, Inc. It was performed in concurrence of Samtec Corporation of New Albany, IN who was the test sponsor.

99046

Contextual Info: FEBRUARY 26, 1999 TEST REPORT #99046 QUALIFICATION TESTING CLT-116-02-L-D SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was

Contextual Info: JANUARY 9,1997 TEST REPORT #97609 QUALIFICATION TESTING TLE/TMMH SAMTEC CORPORATION APPROVED BY: MAX PEEL ' PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. CERTIFICATION This is to certify that the evaluation described herein was designed and executed by personnel of Contech Research, Inc.

ZC-982

Contextual Info: / - DECEMBER 3, 1996 I I TEST REPORT #9628@ QUALIFICATION TESTING CLE/FTE SAMTEC CORPORATION I APPROVED BY: LUANNE WITT PROGRAM MANAGER CONTECH RESEARCH, INC. CJl!y!yR 1 Contech Research - CERTIFICATION This is to certify that the evaluation described herein was

Socket 754

Abstract: AMD athlon socket 754 AMD socket s1 amd athlon 64 socket 754 AMD Socket 754 socket s1 Advanced Micro Devices EIA 364-60 EIA-364-103 socket S1 AMD Socket S1 PIN LAYOUT
Contextual Info: Socket 754 Design and Qualification Requirements Publication # 24850 Rev: 3.07 Issue Date: August 2003 2001–2003 Advanced Micro Devices, Inc. All rights reserved. The contents of this document are provided in connection with Advanced Micro Devices, Inc. “AMD” products. AMD makes no representations or

6ES8

Abstract: EIA-364-TP-27
Contextual Info: CERTIFICATION This is to certify that the evaluation described herein was designed and executed by personnel of Contech Research, Inc. It was performed in concurrence of Samtec Corporation of New Albany, IN who was the test sponsor. All equipment and measuring instruments used during testing

Contextual Info: JUNE 30,1998 TEST REPORT #98312 QUALIFICATION TESTING FTMH/MLE SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was

T40 16 ultrasonic

Contextual Info: L<. ru c: ” Ial c E: rl r 1 c $1 !‘7 I * plrasRvARY 18, X999 lu TEST REPORT #98689 . . . tar QUALIFICATLOM TESTING . X&T-075-05-L-D-A HItF-075-02-L-D-A SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVABTCED RESEARCH CONTECH RESEARCH, INC.

Contextual Info: JUNE 14, 1999 TEST REPORT #99309 QUALIFICATION TESTING CLM-115-02-L-ABE FTMH-115-02-L-AV SAMTEC CORPORATION APPROVED BY: MAX PEEL PRESIDENT AND DIRECTOR OF ADVANCED RESEARCH CONTECH RESEARCH, INC. Contech Research CERTIFICATION This is to certify that the evaluation described herein was