EQ UOP Search Results

NJM2746MZ

Abstract: iff 40 NJM274 adtti
Contextual Info: mW LO T o p p 380 m ±15 > > > in\J C "+ oI om "+ uop br I— CL 3CL ? l— — I— l br =>3 =>? CL C LC LfL O I+ ° + I o < < < C D c Q c ric Q > ^ O a. O > > >a CaL h-o I— bid tti m Iff td -R -R •R ttiS Iff P| m K K anr- * UE| a -H & Iff m El sn a

EQ UOp

Contextual Info: PHILIPS t C G INC 17E D bbSBTBÛ ÜDG3SÛ3 S ECG903,ECG908 semiconductors OPERATIONAL AMPLIFIERS ECG903 - 12-VOLT TYPE, 12-Lead TO -5 Style ECG908 - 12-VOLT TYPE, 14-Lead Plastic Dual In-lins TO 116 dimensional OUTLINES Dim ensions In Ineties and Millimeters

Contextual Info: RTAX-S RadTolerant FPGAs Detailed Specifications Table 2-1 • Supply Voltages VCCA VCCI Input Tolerance Output Drive Level 1.5V 1.5V 3.3V 1.5V 1.5V 1.8V 3.3V 1.8V 1.5V 2.5V 3.3V 2.5V 1.5V 3.3V 3.3V 3.3V Table 2-2 • I/O Features Comparison I/O Assignment

Contextual Info: RTAX-S RadTolerant FPGAs Detailed Specifications Table 2-1 • I/O Features Comparison I/O Assignment Clamp Diode Hot Insertion 5V Tolerance Input Buffer Output Buffer LVTTL No Yes No Enabled/Disabled 3.3V PCI Yes No Yes1 Enabled/Disabled LVCMOS2.5V No Yes

RTAX2000

Abstract: TB125 24mA-drive 352-Pin
Contextual Info: RTAX-S RadTolerant FPGAs Detailed Specifications Table 2-1 • I/O Features Comparison I/O Assignment Clamp Diode Hot Insertion 5V Tolerance Input Buffer Output Buffer LVTTL No Yes No Enabled/Disabled 3.3V PCI Yes No Yes1 Enabled/Disabled LVCMOS2.5V No Yes

Contextual Info: RTAX-S RadTolerant FPGAs Detailed Specifications Table 2-1 • I/O Features Comparison I/O Assignment Clamp Diode Hot Insertion 5V Tolerance Input Buffer Output Buffer LVTTL No Yes No Enabled/Disabled 3.3V PCI Yes No Yes1 Enabled/Disabled LVCMOS2.5V No Yes

RTAX1000SL

Contextual Info: RTAX-S/SL RadTolerant FPGAs Detailed Specifications Table 2-1 • I/O Features Comparison I/O Assignment LVTTL Clamp Diode Hot Insertion / Cold Sparing 5V Tolerance No Yes No Input Buffer Output Buffer Enabled/Disabled 1 3.3 V PCI Yes No Yes Enabled/Disabled

RTAX2000S-CQ352

Contextual Info: RTAX-S RadTolerant FPGAs Detailed Specifications Table 2-1 • I/O Features Comparison I/O Assignment LVTTL Clamp Diode Hot Insertion / Cold Sparing 5V Tolerance No Yes No Input Buffer Output Buffer Enabled/Disabled 1 3.3 V PCI Yes No Yes Enabled/Disabled

NDK 1346

Abstract: NDK America ndk crystal CRYSTAL NDK 204D 213B NDK oscillators 1340s 400 NDK 23
Contextual Info: N D K A M E R I C A INC E2E D he broadest family of . CMOS andTTL-com patible com pact oscillators available, NDK C om pact Crystal Clock Oscillators deliver reliable perform ance in half the space. Ideal for high-density PC boards such as portable and hand

73k324

Contextual Info: SSI 73K224L ów m su skm s' V.22bis/V.22/V.21, Bell 212A/103 Single-Chip Modem A TDK Group/Company January 1994 DESCRIPTION FEATURES The SSI 73K 224L is a highly integrated single-chip m odem 1C w hich provides the functions needed to construct a V.22bis com patible m odem , capable of

RTAX1000SL

Abstract: RTAX1000S RTAX1000S-SL RTAX250SL RTAX2000SL RTAX2000S RTAX250S RTAX4000S 56 pin edac connector
Contextual Info: RTAX-S/SL RadTolerant FPGAs Detailed Specifications Table 2-1 • I/O Features Comparison I/O Assignment 3.3 V LVTTL Clamp Diode Hot Insertion / Cold Sparing 1 Yes 5V Tolerance Input Buffer Output Buffer No 1 Yes Enabled/Disabled Enabled/Disabled 3.3 V PCI

AX125

Abstract: AX2000 CS180 IDTQS32X2384 Silicon Sculptor II Axcelerator FPGAs Axcelerator Family FPGAs
Contextual Info: Axcelerator Family FPGAs Detailed Specifications Operating Conditions Table 2-1 lists the absolute maximum ratings of Axcelerator devices. Stresses beyond the ratings may cause permanent damage to the device. Exposure to Absolute Maximum rated conditions for extended periods may affect device

CQFP 256 PIN actel

Contextual Info: Axcelerator Family FPGAs Detailed Specifications Operating Conditions Table 2-1 lists the absolute maximum ratings of Axcelerator devices. Stresses beyond the ratings may cause permanent damage to the device. Exposure to Absolute Maximum rated conditions for extended periods may affect device

FBGA 896

Abstract: AX125 AX2000 CS180 IDTQS32X2384 Silicon Sculptor II Axcelerator Family FPGAs
Contextual Info: Axcelerator Family FPGAs Detailed Specifications Operating Conditions Table 2-1 lists the absolute maximum ratings of Axcelerator devices. Stresses beyond the ratings may cause permanent damage to the device. Exposure to Absolute Maximum rated conditions for extended periods may affect device

RTAX2000

Abstract: RTAX2000S RTAX1000SL rtax250 RTAX250SL RTAX4000SL RTAX1000 RTAX-S RTAX1000S-SL rtax250s
Contextual Info: Rev ision 13 RTAX-S/SL and RTAX-DSP Radiation-Tolerant FPGAs Radiation Performance Specifications • SEU-Hardened Registers Eliminate the Need for Triple-Module Redundancy TMR – Immune to Single-Event Upsets (SEU) to LETTH > 37 MeVcm2/mg – SEU Rate < 10-10 Errors/Bit-Day (worst case GEO)

RTAX250

Abstract: RTAX4000DL RTAX4000D CG624 RTAX4000S LG1152 TRANSISTOR TB 772 SL RTAX2000S ACTEL CCGA 624 mechanical transistor prc 606 j
Contextual Info: Revision 15 RTAX-S/SL and RTAX-DSP Radiation-Tolerant FPGAs Radiation Performance Specifications • SEU-Hardened Registers Eliminate the Need for Triple-Module Redundancy TMR – Immune to Single-Event Upsets (SEU) to LETTH > 37 MeVcm2/mg – SEU Rate < 10-10 Errors/Bit-Day (worst case GEO)

Contextual Info: A dv an c ed v0 .5 RTAX-S RadTolerant FPGAs Designed for Space • • • • • • • • SEU-Hardened Registers Eliminate the Need for Triple-Module Redundancy TMR – Immune to Single-Event Upsets (SEU) to LETth > 60 MeV-cm2/mg – SEU Rate < 10-10 Errors/Bit-Day in Worst-Case

w32 smd transistor

Abstract: rtax250sl RTAX2000S w32 smd transistor 143 41-bit Carry Look-ahead Adder RTAX2000SL RTAX4000S BY415 RTAX4000D LG1152
Contextual Info: Revision 14 RTAX-S/SL and RTAX-DSP Radiation-Tolerant FPGAs Radiation Performance Specifications • SEU-Hardened Registers Eliminate the Need for Triple-Module Redundancy TMR – Immune to Single-Event Upsets (SEU) to LETTH > 37 MeVcm2/mg – SEU Rate < 10-10 Errors/Bit-Day (worst case GEO)

RTAX2000D

Abstract: LG1152 CDB 455 C34
Contextual Info: Revision 14 RTAX-S/SL and RTAX-DSP Radiation-Tolerant FPGAs Radiation Performance Specifications • SEU-Hardened Registers Eliminate the Need for Triple-Module Redundancy TMR – Immune to Single-Event Upsets (SEU) to LETTH > 37 MeVcm2/mg – SEU Rate < 10-10 Errors/Bit-Day (worst case GEO)

624 CCGA

Abstract: CQ352 transistor prc 606 j rtax250 RTAX2000 rtax4000
Contextual Info: Revision 14 RTAX-S/SL and RTAX-DSP Radiation-Tolerant FPGAs Radiation Performance Specifications • SEU-Hardened Registers Eliminate the Need for Triple-Module Redundancy TMR – Immune to Single-Event Upsets (SEU) to LETTH > 37 MeVcm2/mg – SEU Rate < 10-10 Errors/Bit-Day (worst case GEO)

56 pin edac connector

Abstract: RTAX1000 edac 96 pin edac connector 292 CCGA
Contextual Info: v2.1 RTAX-S RadTolerant FPGAs Designed for Space • • • • • • • • SEU-Hardened Registers Eliminate the Need for Triple-Module Redundancy TMR – Immune to Single-Event Upsets (SEU) to LETTH > 37 MeV-cm2/mg – SEU Rate < 10-10 Errors/Bit-Day in Worst-Case

4x1K

Abstract: edac 96 pin edac connector footprint cqfp 132 833 T12
Contextual Info: Advanced v0.5 RTAX-S RadTolerant FPGAs Designed for Space • • • • • • • • SEU-Hardened Registers Eliminate the Need for Triple-Module Redundancy TMR – Immune to Single-Event Upsets (SEU) to LETth > 60 MeV-cm2/mg – SEU Rate < 10-10 Errors/Bit-Day in Worst-Case

RTAX2000

Abstract: footprint cqfp 280 RTAX1000S actel cqfp 84
Contextual Info: A dv an c ed v0 .5 RTAX-S RadTolerant FPGAs Designed for Space • • • • • • • • SEU-Hardened Registers Eliminate the Need for Triple-Module Redundancy TMR – Immune to Single-Event Upsets (SEU) to LETth > 60 MeV-cm2/mg – SEU Rate < 10-10 Errors/Bit-Day in Worst-Case

56 pin edac connector

Abstract: PCB footprint cqfp 132 Silicon Sculptor II ACTEL CCGA 624 mechanical
Contextual Info: v2.0 RTAX-S RadTolerant FPGAs Designed for Space • • • • • • • • SEU-Hardened Registers Eliminate the Need for Triple-Module Redundancy TMR – Immune to Single-Event Upsets (SEU) to LETTH > 37 MeV-cm2/mg – SEU Rate < 10-10 Errors/Bit-Day in Worst-Case