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    HP8341B

    Abstract: HP4145 hp11612a 8970B TRANSISTOR noise figure measurements footprint transistor Plessey
    Contextual Info: On Wafer Noise Measurement Using Bipolar Transistor RF Test Structures S.D. Connor Bipolar Characterization Group, Central R&D, G.E.C. Plessey Semiconductors, Tweedale Way, Oldham, Lancs OL9 7LA, England. Abstract:- We present here a technique for on wafer noise we measurements using bipolar R.F. cell structures. Measurements were taken


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    MAN 35XX

    Contextual Info: System 5000 35X; Fiberoptic Delay Spool Installation Manual Revision D Emcore MAN 35; 35X; Fiberoptic Delay Lines Operating Manual Disclaimer Every attempt has been made to make this material complete, accurate, and up-to-date.


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    Ortel microwave photodiode

    Contextual Info: Operator's Manual Series 5000 Fiberoptic Delay Lines Model 5015A Model 5015B Model 5015C Model 355A 2015 West Chestnut Street Alhambra, California 91803 Telephone: 818 281-3636 Fax: (818) 281-8231 File: G:\EDC\DOCSRLSD\MAN\5000.MAN Rev. A November 19, 1996


    Original     		5015B 5015C \EDC\DOCSRLSD\MAN\5000 Ortel microwave photodiode PDF