HTIU2100 Search Results

bfl5

Contextual Info: b3E i> WM 4 5 5 1 0 7 2 0ÜÜ1Q72 HONEYl i l ELL/ S 220 HH0N3 Honeywell S E C Advance Information TEST-BUS INTERFACE UNIT HTIU2100 FEATURES • Module Test and Maintenance Bus Interface - IEEE P1149.5 Compatible Backplane - Master or Slave Operation - Module Clock Generation Capability

ic 8255 PPI

Abstract: PPI 8255 interface data serial 8255 PPI Chip PPI 8255 interface word control Control word 8255 PPI ppi interface 1007 SC1114 NUM mnda
Contextual Info: Honeywell Advance Information TEST-BUS INTERFACE UNIT HTIU2100 FEATURES • Module Test and Maintenance Bus Interface - IEEE P1149.5 Compatible Backplane - Master or Slave Operation - Module Clock Generation Capability • Serial Chip-Level Test Interface

Contextual Info: Honeywell ON-CHIP MONITOR MACROCELL FEATURES •ASIC-Based Implementation of IEEE 1149.1 Interface • Standard ASIC Logic Interface for Control of Scan/ Boundary Paths • Up to Seven Internal ASIC Scan Paths • Test Reset Input TRSTN for Asynchronous TAP