JIS C7021 Search Results
JIS C7021 Datasheets Context Search
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JIS C7021 B-11
Abstract: 2SA1576A 2SA1774 2SC2412K 2SC4081 2SC4617 C7021 H63A
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1000h JIS C7021 B-11 2SA1576A 2SA1774 2SC2412K 2SC4081 2SC4617 C7021 H63A | |
Contextual Info: Reliability Test TEST ITEM 1.TEMPERATURE CYCLE TC 2. HIGH TEMP. STORAGE (HTS) 3.LOW TEMP. STORAGE (LTS) 4.MOISTURE RESISTANCE (MR) 5.PRESSURE COOKER TEST (PCT) 6.SOLDERABILITY TEST (ST) TEST METHOD MIL-STD (1)MIL-STD-883D 1010.C0ND.C (2)JIS C7021 A-4 (1)MIL-STD-750B1031 |
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MIL-STD-883D C7021 MIL-STD-750B1031 MIL-STD-750B1021 C7021B-11-C EIAJ-IC-121 MIL-STD-883D2003 | |
JIS C7021 A-11Contextual Info: Transistors Quality assurance and reliability Quality assurance and reliability •Q ua lity Assurance Measures JIS Japan Industrial Standards defines reliability to be “the ability for an item to perform a required func tion under given conditions for a specified time”. This |
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chip die npn transistor
Abstract: JIS C7021 B-11 JIS C7021 B-10
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JIS C7021
Abstract: JIS-C-7021 JIS C7021 B-10 JIS C 7021B-10 C7021A
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10OOhrs 1000hrs p7021 C7021 C--25 30min- 30min C7021 JIS C7021 JIS-C-7021 JIS C7021 B-10 JIS C 7021B-10 C7021A | |
JIS C7021
Abstract: C7023 C7021
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MIL-STD-750 MIL-STD-883 C7021 EIAJJC-121 IL-STD-750 C-121 250gr, IC-121 JIS C7021 C7023 | |
EIAJ-SD-121
Abstract: JIS C7021 B10 EIAJ SD-121 C7021 EE-SX1041
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Toshiba b9 grease
Abstract: grease toshiba b9 EIA and EIAJ standards for marking EIA and EIAJ standards IC 2 5/grease toshiba b9
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168Hrs 2SD1406 150V140V^ 110V100V 70V60V50 168Hrs 500Hrs 500mA, Toshiba b9 grease grease toshiba b9 EIA and EIAJ standards for marking EIA and EIAJ standards IC 2 5/grease toshiba b9 | |
Contextual Info: K /D io d es pp pnp S « iiE ^ :ff flt 4 c o i ' T iiE ^ f i U t i (c o t ' T • ISttKp^cOtilStt \fi>tlt>tlit, OIj C b" ! ^ w,— t t i>\ Cftft', ^tt(7 TftUSt„ £ t£ g ift? T o nc-<n'9pnpf|i;:U:, » S « napS, fite (3) IH S tX flO T e S t/M ft'-i-S ftT ft tj, |
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si500mA) 500mA) ffl83fc& 400MHz) 00027/106B$ /10sB 0066/106B | |
EE-SX4019-P
Abstract: EE-CF4 EE-SX4019 EE-CF2 EIAJ-SD-121 EIAJ SD-121 EE-SX1235-P2 ee-sx307 EE-SX1018 C7021
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st0033 EE-SX298* EE-SX4009-P* EE-SX301 EE-SX401 EE-SX4019-P EE-CF4 EE-SX4019 EE-CF2 EIAJ-SD-121 EIAJ SD-121 EE-SX1235-P2 ee-sx307 EE-SX1018 C7021 | |
7 SEGMENT DISPLAY ALPHANUMERIC
Abstract: 16x16 LED Matrix JIS C7021 B-11 C7021 full color dot matrix 8 x 8 18 pin Dual alphanumeric, 16 segment display BLUE 4 DIGIT 7 SEGMENT LED DISPLAY AA-11X11
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MIL-STD-750 MIL-STD-883 C7021 160mA/duty 1000HRS -24HRS, 72HRS) 008-8mm 028-28mm 180180mm 7 SEGMENT DISPLAY ALPHANUMERIC 16x16 LED Matrix JIS C7021 B-11 full color dot matrix 8 x 8 18 pin Dual alphanumeric, 16 segment display BLUE 4 DIGIT 7 SEGMENT LED DISPLAY AA-11X11 | |
JIS C7021 A-11
Abstract: 741J tlp655 EIAJ ED-4701 B-121 EIAJ ED-4701 B-131 TLP641G EIAJ ED-4701 B-123 TLP641J TLP666 TLP721
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VDE0884 TLP521-1 TLP531/532 TLP541G/545J TLP550/551 TLP560G/561G TLP620/-2/-4 TLP621/-2/-4 TLP750/751 TLP631/632 JIS C7021 A-11 741J tlp655 EIAJ ED-4701 B-121 EIAJ ED-4701 B-131 TLP641G EIAJ ED-4701 B-123 TLP641J TLP666 TLP721 | |
JIS C7021 B-11Contextual Info: Introduction Overview of manufacturing processes From the development stage through to the start of mass production, ROHM semiconductor devices are subject to multiple quality assurance verification tests to ensure that the final product will be reliable. Any product must pass all tests before mass production. At the start |
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SFXG50
Abstract: JESD22-A106A JESD22-A106-A JIS C 5201 4.17 C7021 JESD22-A-106 68-2-27-E 24Hr Limited MARKING 72h
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SFXG50HR701 JESD22-A106A SFXG50 JESD22-A106A JESD22-A106-A JIS C 5201 4.17 C7021 JESD22-A-106 68-2-27-E 24Hr Limited MARKING 72h | |
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C7021
Abstract: PT600T C7035
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DG-953054 44tl/ PT60C C7021 PT600T C7035 | |
CPH1
Abstract: MTL068D01 Z0202
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MTL068D01 MTL068D01 CPH1 Z0202 | |
ST-100SX
Abstract: MIL-STD-750b 100SX C5700 jis C5003 750H C5003 ST-100S YG6260 mosfet induction heater
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2SK1544 ST-100SX MIL-STD-750b 100SX C5700 jis C5003 750H C5003 ST-100S YG6260 mosfet induction heater | |
st-100sx
Abstract: Arakawa ST-100SX jis C5003 mosfet induction heater MIL-STD-750b 750H C5003 C5700 ST-100S YG6260
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2SK1544 st-100sx Arakawa ST-100SX jis C5003 mosfet induction heater MIL-STD-750b 750H C5003 C5700 ST-100S YG6260 | |
tic 105dContextual Info: 3 Quality Assurance and Reliability Test Standards 1) Q u a lity assurance in shipping Establishing qu ality in the design and in fabrication is essential to keep the quality and reliability levels of the semiconductor devices at a high level. This is done by the |
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MILSTD-105D. tic 105d | |
MTL040D01
Abstract: CPH1 mtl04 MTL40D01 mingstar lcd
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MTL040D01 MTL040D01 MTL40D01 CPH1 mtl04 mingstar lcd | |
ua sh 105dContextual Info: 5. Quality Assurance and Reliability The Concept to Q uality A ssurance There are 2 fundam ental principles guiding Sony Semiconductors. 1. Customer satisfaction 2. Top ievel performance orderly control is applied fo r the maintenance of high standards and furthe r improvement. |
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ATI Research
Abstract: MIL-STD-750b
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168Hrs 500Hre 2SK643 500H-S 100n- 500Hrs 700650J, ATI Research MIL-STD-750b | |
Contextual Info: 5. Quality Assurance and Reliability The Concept to Quality Assurance There are 2 fundam ental principles guiding Sony Semiconductors. 1. Customer satisfaction 2. Top level performance orderly control is applied fo r the maintenance of high standards and fu rth e r improvement. |
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1500G 2000Hz | |
Toshiba Power and Industrial Semiconductors
Abstract: toshiba lot traceability
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FP144 Assurance-26 Toshiba Power and Industrial Semiconductors toshiba lot traceability |