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    SD2921

    Abstract: RF BeO AN1227 SD2921-10
    Text: AN1227 APPLICATION NOTE IMPROVED RF MOSFET RELIABILITY THROUGH PACKAGING ENHANCEMENTS Chuck Leuthauser - Brett Hanson 1. ABSTRACT It is well known that temperature is a critical operating state parameter for today’s electronic industry. Temperature influences device operating state characteristics and performance. As well, it is a crucial


    Original     		PDF AN1227 SD2921 RF BeO AN1227 SD2921-10