MIL-STD-883 PRESSURE Search Results

IEC-68-2-32

Abstract: EIAJ-IC-121-18 IEC68-2-32 IEC 68-2-45 IEC-147 IEC68-2-1 IEC-68-2-3 IEC 68-2-32 IEC 68-2-14 IEC-68-2-21
Contextual Info: FAGOR 9 N° 1 2 TEST LEAD STRENGTH SOLDERABILITY CONDITIONS DURATION DO 41 /D 0 1 5 : 1 kg. DO 201 A D /A E: 2 kg. P6: 4 kg. 10” 235 + 5°C 5" STANDARD IEC-68-2-21 MIL-STD 202F-211A IEC -68-2-20 MIL-STD IEC -68-2-54 MIL-STD 883-2003-3 202F-208E 3 4 5 6 REVERSE BIASS

Sharp Semiconductor Lasers

Abstract: AU4A transistor QB tensile-strength thermopile array BREAK FAILURE INDICATOR APPLICATIONS LIST relay failure analysis CRACK DETECTION PATTERNS gold wire bound failures due to ultrasonic cleaning 2n2222 micro electronics
Contextual Info: Application Note Optoelectronics Failure Analysis of Optoelectronic Devices DEFINITIONS • US Military Standard: MIL-STD-883 Method 5003 Failure Analysis Procedures for Microcircuits – Failure analysis is a post-mortem examination of a failed device employing, as required, electrical

acousto optic Modulator

Abstract: GR-468 DS-7024 SM 1060
Contextual Info: Acousto Optic Modulator Features • • • • • • • Hermetic to MIL-Std 883 Rugged laser welded construction Fast rise / fall time High throughput High contrast ratio High PER Wide operating temperature range Applications • • • • Fast optical shutter

acousto optic Modulator

Abstract: GR-468 single mode fiber bend radius
Contextual Info: Acousto Optic Modulator Features • • • • • • • Hermetic to MIL-Std 883 Rugged laser welded construction Fast rise / fall time High throughput High contrast ratio High PER Wide operating temperature range Applications • • • • Fast optical shutter

MBD3057-C18

Abstract: MBD2057-C18 DIODE e26 back Tunnel diode MBD1057
Contextual Info: JMAR BACK TUNNEL DIODES m «|h Frequency Detector Series (To 18 GHz) U L = FEATURES • • • • • Rugged Germanium Planar Construction Excellent Temperature Stability No DC Bias Required Wide Video Bandwidth MIL-STD-19500 & 883 Capability M AXIM UM RATINGS

M2003

Contextual Info: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR TO-92 P-J Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage BOND INT 80 250 hrs, 500 hrs 200_C + N2 0.00 DIE PUNCH 30 MIL-STD-883 0.00 HAST 330 100 hrs

M2003

Contextual Info: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR TO-220 P-J Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage BOND INT 120 250 hrs, 500 hrs 200_C + N2 0.00 DIE PUNCH 45 MIL-STD-883 0.00 HAST 495 100 hrs

MBD3057-C18

Abstract: MBD5057-C18 back Tunnel diode MBD-3057-C18 MIL-STD-195 MBD5057 MBD2057-C18 MBD-1057-C18 MBD1057
Contextual Info: PLANAR BACK TUNNEL DIODES m T ^ High Frequency D e te c to r Series (To 18 GHz) IB = oti^ rationS FEATURES • Rugged Germanium Planar Construction • Excellent Temperature Stability • No DC Bias Required • Wide Video Bandwidth • MIL-STD-195 00 & 883 Capability

72590

Abstract: M2003
Contextual Info: Package Reliability Vishay Siliconix ENVIRONMENTAL AND PACKAGE TESTING DATA FOR TO-263 P-J Stress Sample Size Device Hr./Cyc Condition Total Fails Fail Percentage BOND INT 40 250 hrs, 500 hrs 200_C + N2 0.00 DIE PUNCH 15 MIL-STD-883 0.00 HAST 165 100 hrs

MBD2057-C18

Contextual Info: FEATURES • • • • • Rugged Germanium Planar Construction Excellent Temperature Stability No DC Bias Required Wide Video Bandwidth MIL-STD-19500 & 883 Capability M A X IM U M RATINGS Storage Tem perature. -6 5 to +125°C Operating T e m p e ra tu re . -6 5 to +110°C

M25P10

Abstract: ST M25P10 SO8 Wide Package QRFS0001 ATM-.100 M25P
Contextual Info: QRFS0001 QUALIFICATION REPORT M25P10 Using CMOST6X-U35 Technology at Agrate R1 Fab Table 1. Product and Process being Qualified Product M25P10 Package SO8 Process CMOST6X-U35 Fab Line Agrate R1 PRODUCT DESCRIPTION The M25P10 is a 1 Mbit 128K x 8 bit Low Voltage, Paged Flash Memory, accessed by a 20 MHz SPI

Contextual Info: Power M anagem ent Division Power M anagem ent Division Sm artpack pow er m odules Sam ple Sm artpack package outlines not to scale T hank s to Smartpack, designing high power circuits has never been easier. Sm artpack T echnology offers engineers the b e n efits of ex c e lle n t pow er dissipation and

SO8 Wide Package

Abstract: M25P10 QRFS0002
Contextual Info: QRFS0002 QUALIFICATION REPORT M25P10 Using CMOST6X-U35 Technology at Catania M5 Fab Table 1. Product and Process being Qualified Product M25P10 Package SO8 Process CMOST6X-U35 Fab Line Catania M5 PRODUCT DESCRIPTION The M25P10 is a 1 Mbit 128K x 8 bit Low Voltage, Paged Flash Memory, accessed by a 20 MHz SPI

Contextual Info: Q-TECH ONE INCH SQUARE LOW PHASE NOISE OCXO 3.3 to 12Vdc - 1MHz to 125MHz CORPORATION Description Q-Tech’s High Stability OCXO is a high reliability signal generator that provides an HCMOS or Sine Wave output. The OCXO is available in a Through hole package.

Contextual Info: Q-TECH ONE INCH SQUARE LOW PHASE NOISE OCXO 3.3 to 12Vdc - 1MHz to 125MHz CORPORATION Description Q-Tech’s High Stability OCXO is a high reliability signal generator that provides an HCMOS or Sine Wave output. The OCXO is available in a Through hole package.

Contextual Info: Monolithic ICs Quality Assurance and Reliability Quality Assurance and Reliability We put quality first. No matter what it takes, or what kind of problems we run into, our goal is to provide a constant supply of high quality products to our cus­ tomers both at home and abroad, in the quantities they

Contextual Info: Monolithic ICs Quality Assurance and Reliability Quality Assurance and Reliability W e put quality first. N o matter what it takes, or what kind of problem s we run into, our goal is to provide a constant sup p ly of high quality products to our c u s­ tomers both at home and abroad, in the quantities they

Contextual Info: Monolithic ICs Quality Assurance and Reliability Quality Assurance and Reliability W e put quality first. No m atter w hat it takes, or w hat Incidental failures are determined by the design quality kind of problem s w e run into, our goal is to provide a

Contextual Info: Monolithic ICs Quality Assurance and Reliability Quality Assurance and Reliability We put quality first. No m atter what it takes, or what kind of problem s we run into, our goal is to provide a constant supply of high quality products to our cus­ tomers both at home and abroad, in the quantities they

Contextual Info: HIGH STABILITY DIGITAL TCXO Q-TECH CORPORATION SURFACE MOUNT CRYSTAL OSCILLATORS 3.3 to 5Vdc - 1MHz to 125MHz Description Q-Tech’s High Stability Digital TCXO is a high reliability signal generator that provides an HCMOS output. The TCXO is available in a Surface Mount SMD package.

QPDS-0009

Contextual Info: HIGH STABILITY DIGITAL TCXO Q-TECH CORPORATION SURFACE MOUNT CRYSTAL OSCILLATORS 3.3 to 5Vdc - 1MHz to 125MHz Description Q-Tech’s High Stability Digital TCXO is a high reliability signal generator that provides an HCMOS output. The TCXO is available in a Surface Mount SMD package.

Contextual Info: Monolithic ICs Quality Assurance and Reliability Quality Assurance and Reliability W e put q u a lity first. No m a tte r w h a t it ta k e s , or w h a t Incidental failures are determ ined by the design quality kind of p ro b le m s w e run into, our g oal is to p ro vid e a

Contextual Info: Monolithic ICs Quality Assurance and Reliability Quality Assurance and Reliability W e put quality first. No m atter w hat it takes, or w hat Incidental failures are determined by the design quality kind of problem s we run into, our goal is to provide a of the product, so we work to lower our incidental fail­

Contextual Info: Rev.1 Date: 2012-02‐10 Specification AXIOM6060 Oscillator type : OCXO with Low Phase Noise for Space Application Parameter Nominal frequency Frequency stability Initial tolerance before screening test Initial tolerance after screening test