OUTGOING QUALITY Search Results
OUTGOING QUALITY Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
---|---|---|---|
CY62256LL-PC
Abstract: VIC068A-GC VIC64-NC VIC64-UMB PALCE22V10-JI PALC16L8Q PLD VME A113 CY7B923 JESD22-A113
|
Original |
PALCE22V10-JC FLASH-FL22D CY62256LL-PC VIC068A-GC VIC64-NC VIC64-UMB PALCE22V10-JI PALC16L8Q PLD VME A113 CY7B923 JESD22-A113 | |
22A-104Contextual Info: Cypress Semiconductor Product Reliability 1996 Published May, 1996 CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS SEMICONDUCTOR TOTAL QUALITY MANAGEMENT SYSTEM . 1 2.0 ELECTRICAL AVERAGE OUTGOING QUALITY . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . |
Original |
||
Contextual Info: Quality General Semiconductor’s Quality Assurance and Reliability System Quality Control of Outgoing Products Although the quality and reliability is “built into” the products during products development and production, it is also verified by inspections. |
OCR Scan |
||
INCOMING MATERIAL FLOW PROCESS
Abstract: outgoing quality
|
OCR Scan |
QSC-4321 INCOMING MATERIAL FLOW PROCESS outgoing quality | |
vishay opto detector
Abstract: Shortform IC and Component
|
Original |
10-May-04 vishay opto detector Shortform IC and Component | |
Contextual Info: Conclusion The MAX3233E successfully meets the quality and reliability standards required of all Maxim products. In addition, Maxim’s continuous reliability monitoring program ensures that all outgoing product will continue to meet Maxim’s quality and |
Original |
MAX3233E EIA/TIA-232 100pf | |
reliability report
Abstract: quality and reliability report defect ppm outgoing quality
|
Original |
2000-Q2 reliability report quality and reliability report defect ppm outgoing quality | |
Contextual Info: Features • VDSL2 / ADSL2+ POTS splitter ■ RJ11 connectors for outgoing wire ■ Optimized for video over VDSL2 ■ Meets requirements of ITU G.992.3/.5 and applications ■ Gel-filled Insulation Displacement Connectors for incoming wire ■ Space saving design |
Original |
3622V2-IDC 3622V2-IDC | |
Contextual Info: SIEM ENS Multipoint Switching and Conferencing Unit MUSAC PEB 2245 Preliminary Data 1 CMOS 1C Features Switching • Time/space switch for 2048-, 4096- or 8192-kbit/s PCM systems • Switching of up to 512 incoming PCM-channels to up to 256 outgoing PCM channels |
OCR Scan |
8192-kbit/s 8192-kHz | |
Q67100-H6122
Abstract: e1111 CSR 1010 f0p8 ITP03783 LN15 musac IRD 110 IRD110 SIEMENS PEB 2245 N
|
OCR Scan |
8192-kbit/s 8192-kHz A235b05 Q67100-H6122 e1111 CSR 1010 f0p8 ITP03783 LN15 musac IRD 110 IRD110 SIEMENS PEB 2245 N | |
VNE-50
Abstract: VIT-75
|
OCR Scan |
12A8-8080nduce HEC-2000 HEC-2000H VNE-50 VIT-75 | |
Contextual Info: ZiKjG Zilog's Quality and Reliability Program Introduction Zilog has an excellent reputation for the quality and reliability of its prod ucts. Zilog's Quality and Reliability Program is based on careful study of the principles laid down by such pioneers as W E Deming and J.M. |
OCR Scan |
||
understanding vishay date codes
Abstract: sprague date code 293d sprague Vishay Sprague 293D 595D CWR06 CWR11 MIL-C-55365 of QUALITY case
|
Original |
535BAAC. CWR06 CWR11 MIL-C-55365. EIA-481 understanding vishay date codes sprague date code 293d sprague Vishay Sprague 293D 595D MIL-C-55365 of QUALITY case | |
quality acceptance plan
Abstract: JESD22-102 JESD22-105 generic failure rate electronic device JESD22-A103 JESD22-A108 JESD22-A101 JESD22-A102 Fairchild wafer fab processes outgoing quality
|
Original |
||
|
|||
outgoing quality
Abstract: sprague capacitor
|
Original |
||
statistical process control
Abstract: defect ppm
|
Original |
26-Mar-02 statistical process control defect ppm | |
INCOMING RAW MATERIAL INSPECTION procedure
Abstract: INCOMING RAW MATERIAL INSPECTION format INCOMING RAW MATERIAL INSPECTION report format INCOMING RAW MATERIAL specification outgoing material inspection format INCOMING RAW MATERIAL INSPECTIONs Sample form for INCOMING Inspection of RAW MATERIAL outgoing raw material inspection procedure RAW MATERIAL INSPECTION procedure INCOMING MATERIAL INSPECTION procedure
|
Original |
||
Contextual Info: Philips Components-Signetics Quality and Reliability Data Communication Products SIGNETICS QUALITY Signetics has put together winning processes for manufacturing. Our standard is zero defects, and current customer quality statistics demonstrate our commitment to this |
OCR Scan |
||
efr 135
Abstract: 74C MTTF 22RPA
|
Original |
||
Reliability
Abstract: reliabil efr 135 MAR 618 transistor TLWR7600
|
Original |
TLWR7600 04-Mar-08 Reliability reliabil efr 135 MAR 618 transistor TLWR7600 | |
efr 135
Abstract: 80106 TLWR7600
|
Original |
TLWR7600 efr 135 80106 TLWR7600 | |
80088Contextual Info: Vishay Semiconductors Reliability The requirements concerning quality and reliability of products are always increasing. It is not sufficient to only deliver fault–free parts. In addition, it must be ensured that the delivered goods serve their purpose safely and failure free, i.e., reliably. From the delivery |
Original |
||
TLWR7600Contextual Info: Vishay Semiconductors Reliability The requirements concerning quality and reliability of products are always increasing. It is not sufficient to only deliver fault–free parts. In addition, it must be ensured that the delivered goods serve their purpose safely and failure free, i.e., reliably. From the delivery |
Original |
TLWR7600 TLWR7600 | |
84055Contextual Info: VISHAY Vishay Semiconductors Reliability The requirements concerning quality and reliability of products are always increasing. It is not sufficient to only deliver fault-free parts. In addition, it must be ensured that the delivered goods serve their purpose |
Original |
20-Jan-04 84055 |