QUALIFIED PARTS LABORATORY Search Results

Contextual Info: V I S H AY I N T E R T E C H N O L O G Y, I N C . I INNOVAT AND TEC O L OGY LMA 96/4, LMB 96/4 N HN MELF RESISTORS O 19 62-2012 Resistors - Laboratory Sample Kits Laboratory Sample Kit Precision MELF Resistors KEY BENEFITS • • • • • AEC-Q200 qualified resistors

PF600-1

Contextual Info: PFEVAL-1 Evaluation Board Kit Application Notes PFEVAL-1 Evaluation Board Kit WARNING! HAZARDOUS VOLTAGES! In setting up a laboratory station for conducting electrical tests of the PF600-1 using the PFEVAL-1 Evaluation Board, operator safety must be the first and foremost consideration. Because the PFEVAL-1 Evaluation Board was designed to provide users with access to all input, output,

SRAM Cross References

Abstract: UT9Q512K8 SRAM SAMSUNG UT8Q512K8 36E-4 weibull test data 19E4
Contextual Info: Single Event Effects Qualification UT8Q512K8 RQ02 Lot 6ZVL04 4Mbit SRAM 7/21/03 Craig Hafer 719-594-8319 craig.hafer@aeroflex.com SUMMARY-Single event effects qualification testing was performed on the UTMC 4Mbit SRAM, (Samsung Rev C die), Lot 6ZVL04, at the Lawrence Berkeley Laboratory using

Contextual Info: Wide Side Termination Thin Film Chip Resistors www.vishay.com Vishay Beyschlag Laboratory Sample Kit Precision Thin Film Chip Resistors MCW 0406-25 0.1 % AT FEATURES • Resistors - Rated dissipation P70 up to 0.250 W - AEC-Q200 qualified pending - Lead (Pb)-free solder terminations

LMA964MMA02040DB00

Contextual Info: MELF Resistors www.vishay.com Vishay Beyschlag Laboratory Sample Kit Precision MELF Resistors MMA 0204-25 0.1 % FEATURES • Resistors - Approved to EN 140401-803 - AEC-Q200 qualified - Advanced thin film technology - Compliant to RoHS Directive 2002/95/EC

Contextual Info: MELF Resistors www.vishay.com Vishay Beyschlag Laboratory Sample Kit Precision MELF Resistors MMB 0207-25 0.1 % FEATURES • Resistors - Approved to EN 140401-803 - AEC-Q200 qualified - Advanced thin film technology - Compliant to RoHS Directive 2002/95/EC

Contextual Info: MELF Resistors www.vishay.com Vishay Beyschlag Laboratory Sample Kit Precision MELF Resistors MMU 0102-25 0.1 % FEATURES • Resistors - Approved to EN 140401-803 - AEC-Q200 qualified - Advanced thin film technology - Compliant to RoHS Directive 2002/95/EC

LCT964MCT0603MDB00

Contextual Info: Thin Film Chip Resistors www.vishay.com Vishay Beyschlag Laboratory Sample Kit Precision Thin Film Chip Resistors MCT 0603-25 0.1 % AT FEATURES • Resistors - Rated dissipation P70 up to 0.150 W - AEC-Q200 qualified - Approved to EN 140401-801 - Lead Pb -free solder terminations

Contextual Info: LTW0402 e3 96/4 www.vishay.com Vishay Laboratory Sample Kit High Stability Thin Film Chip Resistors TNPW0402 0.1 % T-9 e3 FEATURES • Resistors - High stability - AEC-Q200 qualified - Lead Pb -free solder terminations - Material categorization: For definitions of

Contextual Info: LTW0603 e3 96/4 www.vishay.com Vishay Laboratory Sample Kit High Stability Thin Film Chip Resistors TNPW0603 0.1 % T-9 e3 FEATURES • Resistors - High stability - AEC-Q200 qualified - Lead Pb -free solder terminations - Compliant to RoHS Directive 2002/95/EC

AY210

Contextual Info: AY2 Laboratory www.vishay.com Vishay BCcomponents AY2 Sample Kit AC Line Rated Ceramic Disc Capacitors Class X1, 440 VAC, Class Y2, 300 VAC FEATURES • AEC-Q200 qualified • Temperature cycle: 1000 cycles -55 °C to +125 °C • Complies with IEC 60384-14, 3rd edition

INCOMING RAW MATERIAL INSPECTIONs

Abstract: INCOMING RAW MATERIAL INSPECTION in-process quality inspections mil-std-883 INCOMING RAW MATERIAL INSPECTION method MIL-STD-883 method 2003 in-coming quality control INCOMING RAW MATERIAL process flow
Contextual Info: QUALITY AND RELIABILITY QUALITY SYSTEM Product quality at Dallas Semiconductor results from a combination of design techniques, vendor controls, manufacturing methods, process monitors, and quality control inspections. SPC monitors placed at strategic points ensure that potential defects are detected

INCOMING RAW MATERIAL INSPECTION method

Abstract: INCOMING RAW MATERIAL INSPECTION INCOMING RAW MATERIAL INSPECTIONs in-process quality inspections in-coming quality control quality acceptance plan MIL-STD-883 method 2003
Contextual Info: QUALITY AND RELIABILITY QUALITY SYSTEM Product quality at Dallas Semiconductor results from a combination of design techniques, vendor controls, manufacturing methods, process monitors, and quality control inspections. SPC monitors placed at strategic points ensure that potential defects are detected

PD9002

Abstract: comparison cd 4093 smd code marking a3a SCCB spec stanag LISTING 2N2369 military AQAP-1 IC cd 4093 CECC - Detail Specifications smd code marking a4a
Contextual Info: EXPERIENCE AND INNOVATION EXPERIENCE AND INNOVATION EXPERIENCE AND INNOVATION HIGH RELIABILITY and SCREENING OPTIONS DOC 2624 ISS 4 Contents 1. Introduction 1 2. Quality Approvals 2 3. Material Qualification 3 3.1 Header/Cap/Wire Approval Procedures 3.2 Die Approval Procedure

2N2369 equivalent

Contextual Info: IRFNJ9130 IRF9130SMD05 MECHANICAL DATA Dimensions in mm inches 7.54 (0.296) 0.76 (0.030) min. 2.41 (0.095) 3.175 (0.125) Max. 2.41 (0.095) P–CHANNEL POWER MOSFET FOR HI–REL APPLICATIONS 3 5.72 (.225) 0.76 (0.030) min. 1 2 VDSS ID(cont) RDS(on) 10.16 (0.400)

smd diodes s4 1.5w

Abstract: marking code PAD1 SMD U3158 GENERAL SEMICONDUCTOR SMD DIODES s4 PD9002 smd diode marking f4 diode smd marking GPO 27 lvt 817 smd code marking a3a
Contextual Info: IRF130SMD05N IRFN130SMD05 MECHANICAL DATA Dimensions in mm inches 7 .5 4 (0 .2 9 6 ) 0 .7 6 (0 .0 3 0 ) m in . 2 .4 1 (0 .0 9 5 ) 3 .1 7 5 (0 .1 2 5 ) M a x . 2 .4 1 (0 .0 9 5 ) 3 .0 5 (0 .1 2 0 ) 0 .1 2 7 (0 .0 0 5 )  ! VDSS ID(cont) RDS(on) 1 0 .1 6 (0 .4 0 0 )

QR204

Abstract: CECC Detail Specifications 2N2369 equivalent
Contextual Info: IRF130SMD05N IRFN130SMD05 MECHANICAL DATA Dimensions in mm inches 7 .5 4 (0 .2 9 6 ) 0 .7 6 (0 .0 3 0 ) m in . 2 .4 1 (0 .0 9 5 ) 3 .1 7 5 (0 .1 2 5 ) M a x . 2 .4 1 (0 .0 9 5 ) 3 .0 5 (0 .1 2 0 ) 0 .1 2 7 (0 .0 0 5 )  ! VDSS ID(cont) RDS(on) 1 0 .1 6 (0 .4 0 0 )

diode bs 9300

Abstract: lvt 817 Automatic Railway Gate Control system, PD9002 U3158 jan,tx series semiconductors 2n2369 die smd code marking a3a SMD-05 smd diodes s4 1.5w
Contextual Info: IRFNJ9130 IRF9130SMD05 MECHANICAL DATA Dimensions in mm inches 7.54 (0.296) 0.76 (0.030) min. 2.41 (0.095) 3.175 (0.125) Max. 2.41 (0.095) P–CHANNEL POWER MOSFET FOR HI–REL APPLICATIONS 3 5.72 (.225) 0.76 (0.030) min. 1 2 VDSS ID(cont) RDS(on) 10.16 (0.400)

schematic diagram of bluetooth technology

Abstract: schematic diagram of bluetooth Hands-Free EEG Project with circuit diagram BV05C blue tooth dongle circuit diagram schematic diagram bluetooth headset bluetooth technology report LMX5252 bluetooth development board schematic bluetooth antenna design
Contextual Info: National Semiconductor Application Note December 2005 1.0 Scope 3.0 Introduction This document describes the steps and preparation needed to get full regulatory and Bluetooth certification for a new product, including lists of required tests and detailed procedures.

UM7410

Abstract: T9527 ATT2C15 M-2014 ATT2C08 A88al 409at q953 899 CLEAN N ETCH ATT2C12
Contextual Info: Manual October 1997 Field-Programmable Gate Arrays FPGA Qualification Manual Lucent Technologies’ Quality Policy Lucent Technologies is committed to achieving sustained business excellence by integrating quality principles and methods into all we do at every level of

smd diodes s4 1.5w

Abstract: PD9002 QR204 A4A smd SMD a3a GENERAL SEMICONDUCTOR SMD DIODES s4 smd code marking a3a QR208 QR217 smd code marking a4a
Contextual Info: Semelab Limited High Reliability and Screening Options DOC 2624 ISS 8 Contents 1. Introduction. 1 2. Quality Approvals . 2

Instructional Guide

Abstract: 87017 RESISTOR NETWORK MDM (Military M83401/01) AA55534/09-R020FB-TR AA55534/08-R050FB AA55534/09-R100FB
Contextual Info: V i s h ay I n t e r t e c h n o l o g y, I n c . I INNOVAT AND TEC O L OGY Resistive Products N HN MILITARY RESISTORS 101 O 19 62-2012 Resistors - Military Resistors 101 Overview of Military Resistors from Vishay Dale military qualifications • Film Technology

DIGITAL IC TESTER report for project

Abstract: wafer fab control plan atmel 823 PPAP PPAP submission requirement table PPAP flow wafer fab control JESD20 electrical engineering projects dc0327
Contextual Info: TSS463B PPAP TSS463B Serial VAN Data Link Controller ATMEL P/N : TSS463B-TERA PPAP Submission Date: Supplier: 2003 October Atmel Nantes SA Address: La Chantrerie BP 70602 44306 NANTES Cedex 3 France Tel : 33 0 2 40 18 18 18 Fax : 33(0) 2 40 18 19 20 1 Rev. 3 : Initial Submission – 2003 October

Contextual Info: INCH-POUND MIL-DTL-24308G w/AMENDMENT 2 1 August 2012 SUPERSEDING MIL-DTL-24308G w/AMENDMENT 1 25 January 2011 DETAIL SPECIFICATION CONNECTORS, ELECTRIC, RECTANGULAR, NONENVIRONMENTAL, MINIATURE, POLARIZED SHELL, RACK AND PANEL, GENERAL SPECIFICATION FOR This specification is approved for use by all Departments and Agencies of the Department of Defense.