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    SCAN18245T

    Abstract: SCAN182245A SCAN182373A SCAN182374A SCAN18373T SCAN18374T SCAN18540T SCAN18541T teradyne national semiconductor handbook
    Text: Information on IEEE Standards The IEEE Working Group developed the IEEE Std 1149 11990 IEEE Standard Test Access Port and Boundary-Scan Architecture To purchase this book $50 please call one of the following numbers and ask for SH13144 In the USA 1-800-678-IEEE


    Original     		PDF SH13144 1-800-678-IEEE 1-800-CS-BOOKS) SCANPSC110) SCANPSC110 x4500 SCAN18245T SCAN182245A SCAN182373A SCAN182374A SCAN18373T SCAN18374T SCAN18540T SCAN18541T teradyne national semiconductor handbook