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    SN74BCT8373A, Search Results

    SN74BCT8373A, Result Highlights (1)

    Part ECAD Model Manufacturer Description Download Buy
    SN74BCT8373ADW
    		Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Visit Texas Instruments Buy
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    SN74BCT8373A, Price and Stock

    Texas Instruments SN74BCT8373ANT

    IC SCAN TEST DEVICE LATCH 24-DIP
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    DigiKey SN74BCT8373ANT Tube
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    Verical () SN74BCT8373ANT 915 55
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    • 1000 $5.8125
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    SN74BCT8373ANT 235 55
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    SN74BCT8373ANT 229 55
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    • 1000 $5.8125
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    Rochester Electronics SN74BCT8373ANT 1,419 1
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    • 100 $5.2
    • 1000 $4.65
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    Texas Instruments SN74BCT8373ADW

    IC SCAN TEST DEVICE LATCH 24SOIC
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    DigiKey SN74BCT8373ADW Tube 125
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    Mouser Electronics SN74BCT8373ADW
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    Verical SN74BCT8373ADW 2,971 43
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    • 100 $8.475
    • 1000 $7.5875
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    Arrow Electronics SN74BCT8373ADW 50 12 Weeks 25
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    • 100 $6.313
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    Rochester Electronics SN74BCT8373ADW 2,976 1
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    Rochester Electronics LLC SN74BCT8373ADW

    SN74BCT8373A IEEE STD 1149.1 (JT
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    DigiKey SN74BCT8373ADW Bulk 41
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    Rochester Electronics LLC SN74BCT8373ANT

    BUS DRIVER
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    DigiKey SN74BCT8373ANT Tube 53
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    Texas Instruments SN74BCT8373ADWR

    IC SCAN TEST DEVICE LATCH 24SOIC
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    DigiKey SN74BCT8373ADWR Reel 2,000
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    Verical SN74BCT8373ADWR 26,428 90
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    • 100 $4
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    Quest Components SN74BCT8373ADWR 30
    • 1 $7.1775
    • 10 $3.5888
    • 100 $3.5888
    • 1000 $3.5888
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    Rochester Electronics SN74BCT8373ADWR 26,428 1
    • 1 -
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    • 100 $3.2
    • 1000 $2.86
    • 10000 $2.7
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    SN74BCT8373A, Datasheets (24)

    Part ECAD Model Manufacturer Description Curated Datasheet Type PDF PDF Size Page count
    SN74BCT8373A
    		Texas Instruments SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES Original PDF 297.24KB 21
    SN74BCT8373A
    		Texas Instruments SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES Original PDF 436.52KB 21
    SN74BCT8373ADW
    		Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Original PDF 517.44KB 26
    SN74BCT8373ADW
    		Texas Instruments SCAN Bridge, JTAG Test Port Original PDF 297.26KB 21
    SN74BCT8373ADW
    		Texas Instruments SN74BCT8373 - IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Original PDF 508.29KB 27
    SN74BCT8373ADWE4
    		Texas Instruments SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES Original PDF 475.72KB 26
    SN74BCT8373ADWE4
    		Texas Instruments SN74BCT8373 - IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Original PDF 508.29KB 27
    SN74BCT8373ADWG4
    		Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Original PDF 517.44KB 26
    SN74BCT8373ADWG4
    		Texas Instruments SN74BCT8373 - IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Original PDF 508.29KB 27
    SN74BCT8373ADWR
    		Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches Original PDF 317.81KB 22
    SN74BCT8373ADWR
    		Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Original PDF 517.44KB 26
    SN74BCT8373ADWR
    		Texas Instruments Logic - Specialty Logic, Integrated Circuits (ICs), IC SCAN TEST DEVICE LATCH 24SOIC Original PDF 27
    SN74BCT8373ADWR
    		Texas Instruments SN74BCT8373 - IC BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24, PLASTIC, SO-24, Bus Driver/Transceiver Original PDF 290.26KB 21
    SN74BCT8373ADWRE4
    		Texas Instruments SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES Original PDF 475.72KB 26
    SN74BCT8373ADWRE4
    		Texas Instruments Logic - Specialty Logic, Integrated Circuits (ICs), IC SCAN TEST DEVICE LATCH 24SOIC Original PDF 27
    SN74BCT8373ADWRE4
    		Texas Instruments SN74BCT8373 - IC BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24, PLASTIC, SO-24, Bus Driver/Transceiver Original PDF 290.26KB 21
    SN74BCT8373ADWRG4
    		Texas Instruments IEEE Std 1149.1 (JTAG) Boundary-Scan Test Device With Octal D-Type Latches 24-SOIC 0 to 70 Original PDF 517.44KB 26
    SN74BCT8373ADWRG4
    		Texas Instruments Logic - Specialty Logic, Integrated Circuits (ICs), IC SCAN TEST DEVICE 24SOIC Original PDF 27
    SN74BCT8373ADWRG4
    		Texas Instruments SN74BCT8373 - IC BCT/FBT SERIES, 8-BIT BOUNDARY SCAN DRIVER, TRUE OUTPUT, PDSO24, PLASTIC, SO-24, Bus Driver/Transceiver Original PDF 290.26KB 21
    SN74BCT8373ANT
    		Texas Instruments SCAN Bridge, JTAG Test Port Original PDF 297.26KB 21