statistical process control
Abstract: wafer fab control plan pareto process control system spc data sheet SPC Technology TIONA wafer fab control SPC-2 SPC-3
Text: STATISTICAL PROCESS CONTROL STATISTICAL PROCESS CONTROL Linear Technology Corporation LTC has an active Statistical Process Control (SPC) system. It operates via the interrelated mechanisms of: a structure, control charts with built-in contingency action plans, operational area
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wafer fab control plan
Abstract: SPC3 SPC2 LINEAR TECHNOLOGY flowchart
Text: STATISTICAL PROCESS CONTROL STATISTICAL PROCESS CONTROL Linear Technology Corporation LTC has an active Statistical Process Control (SPC) system. It operates via the interrelated mechanisms of: a structure, control charts with built-in contingency action plans, operational area
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5075MM
Abstract: No abstract text available
Text: Issued March 1999 232-5115 Data Pack A Data Sheet Statistical process control data processor and instruments Introduction Statistical process control SPC is a key concept for enhancing quality control and can achieve significant improvements in product quality.
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wafer fab control plan
Abstract: LINEAR TECHNOLOGY flowchart
Text: STATISTICAL PROCESS CONTROL Linear Technology Corporation LTC has an active Statistical Process Control (SPC) system. It operates via the interrelated mechanisms of: a structure, control charts with built-in contingency action plans, operational area documentation (flowcharts and control plan details), an
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Abstract: No abstract text available
Text: Issued November 1991 A12536 Statistical process control data processor and instruments Introduction Statistical process control SPC is a key concept for enhancing quality control and can achieve significant improvements in product quality. The RS data processor and the range of digital electronic instruments are powerful tools for implementing
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A12536
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Abstract: No abstract text available
Text: Philips Semiconductors Surface Mounted Semiconductors General QUALITY • In-line quality assurance to m onitor process reproducibility during m anufacture and initiate any necessary corrective action. C ritical process steps are 100% under statistical process control
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MBB439
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Text: Q u a l it y Six Sigma 6a is a statistical measurement of quality which allows no more than 3.4 defects per million. BKC's ability to achieve this type of quality is the result of a program of continuous improvement, utilizing Statistical Process Control (SPC) implemented at
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MIL-STD-750.
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SNW-EQ-611
Abstract: No abstract text available
Text: Philips Semiconductors Product specification Microwave Transistors General QUALITY necessary corrective action. Process steps are under statistical process control. Total Quality Management • Acceptance tests on finished products to verify conformance with the device specification. The test
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Abstract: No abstract text available
Text: Production Flow Chart_ VISHAY Vishay Roederstein Metallized Plastic Film Capacitors Radial Types Statistical Process Control www.vishay.com 6 RFI@Vishay.com Document Number 26530 Revision 02-0ct-00
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02-0ct-00
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Abstract: No abstract text available
Text: Test and QA Flow Chart V1SHAY Vishay Roederstein Metallized Plastic Film Capacitors Radial Types Statistical Process Control Document Number 26531 Revision 30-Jun-00 RFI@Vishay.com www.vishay.com 7
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30-Jun-00
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dupont 9450
Abstract: 77274-006 MAX 77693 77030-001 vertical pwb mounting with 68 pin male connector ASTM 240
Text: • Superior design and Statistical Process Control SPC assure high reliability. • High normal force of 75 grams per beam approximately twice that of connectors at a comparable insertion force. This critical parameter is directly measured during the manufacturing process. Results
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HT-142
B712/33
dupont 9450
77274-006
MAX 77693
77030-001
vertical pwb mounting with 68 pin male connector
ASTM 240
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MA4GM2
Abstract: No abstract text available
Text: GaAs FET MMIC Control Product Process Screening and Quality Procedures In processing G aAs FE T MMIC Control Products, consistency and reproducibility is ensured by measuring key electrical parameters on each wafer at the main steps and using the results for statistical process control. If a process goes out
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Abstract: No abstract text available
Text: Philips Semiconductors Product specification SA5205A Wide-band high-frequency amplifier DESCRIPTION PIN CONFIGURATIONS The SA5205A family of wideband amplifiers replace the SA5205 family. The ‘A’ parts are fabricated on a rugged 2¿tm bipolar process featuring excellent statistical process control. Electrical
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SA5205A
SA5205A
SA5205
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SMD w1a 93
Abstract: No abstract text available
Text: TMJ Tantalum SMD S1gma* Series Capacitors The AVX S1gma series is offering a next generation of statistical screening and process control enhancement of tantalum capacitors for professional applications with improved reliability and extremely low DCL needs.
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Abstract: No abstract text available
Text: Statistical Process Control Key to Competitive Manufacturing In manufacturing, variation is evil! If the value of Cpk for a purchased part is low, and Cpk varies from production lotto-lot, then it can be projected the process for manufacturing the part is not in control, performance will be inconsistent,
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Abstract: No abstract text available
Text: M ODEL LPE-4841 Inductors Surface Mount, Gapped and Ungapped FEATURES • Totally integrated manufacturing • Pick and place compatible • Statistical process controlled • Tape packaging per EIA-481 • Low cost • Qualification data available • Short lead times
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LPE-4841
EIA-481
101NA
151NA
221NA
102NA
152NA
222NA
332NA
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Abstract: No abstract text available
Text: MODEL LPE-4841 Inductors Surface Mount, Gapped and Ungapped FEATURES • Totally integrated manufacturing • Pick and place compatible • Statistical process controlled • Tape packaging per EIA-481 • Low cost • Qualification data available • Short lead times
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LPE-4841
EIA-481
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Abstract: No abstract text available
Text: All of our products are designed and manufactured to meet the highest quality levels possible. Our advanced statistical process controls and ISO 9002 certification ensures operational and procedural integrity. Custom Cable Assemblies Methode RF can supply you with high
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Abstract: No abstract text available
Text: TMJ Tantalum SMD S1gma* Series Capacitors TMJ CONSTRUCTION The AVX S1gma series is offering a next generation of statistical screening and process control enhancement of tantalum capacitors for professional applications with improved reliability and extremely low DCL needs.
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001CV*
005CV
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Abstract: No abstract text available
Text: A COMPANY OF MODEL LPE-6562 Inductors Surface Mount, Gapped and Ungapped FEATURES • Totally integrated manufacturing • Pick and place compatible • Statistical process controlled • Tape packaging per EIA-481 • Low cost • Qualification data available
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LPE-6562
EIA-481
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SM3180
Abstract: No abstract text available
Text: SM3 SERIES GOWAIMDA HIGH PERFORMANCE SURFACE MOUNT INDUCTORS • High “Q”, Low DC resistance, Ultra stable. ■ Defect rate below 50 PPM. ■ Statistical process control. ■ Chart of central tendency supplied with each lot. ■ Rugged lead frame design.
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SM3-010K
SM3-012K
SM3-015K
SM3-018K
SM3-022K
SM3-027K
SM3-033K
SM3-039K
SM3-047K
SM3-056K
SM3180
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Abstract: No abstract text available
Text: REV. | T | UNLESS OTHERWISE NOTED DIMENSIONS ARE IN INCHES NOTES: 1. MIN. PUSHOUT FORCE: .5 lb. 2. PLANARITY TO BE WITHIN .006 [.15]. 3. REPRESENTS A CRITICAL DIMENSION FOR STATISTICAL PROCESS CONTROL. ONE PLACE DECIMALS TWO PLACE DECIMALS TOLERANCES ARE:
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Text: At TAM taker to rigorous international cus^pmer uality standards. Our factories are certified to ISO 9001/9002 and are BSI licensed. TAMURA utilizes 100% engineering design control and statistical process control to achieve SIGMA 6 levels of product reliability.
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E98949)
IEC-65
UL1411
E98949
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Untitled
Abstract: No abstract text available
Text: M ODEL LPE-6562 Inductors Surface Mount, Gapped and Ungapped FEATURES • • • • • • • • • Totally integrated manufacturing Pick and place compatible Statistical process controlled Tape packaging per EIA-481 Low cost Qualification data available
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LPE-6562
EIA-481
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