TEXAS INSTRUMENTS NT 24 Search Results

F240

Abstract: SN54BCT8240A SN74BCT8240A BCT8240A DB471
Contextual Info: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS067D - FEBRUARY 1990 - REVISED JULY 1996 Members of the Texas Instruments SCOPE Family of Testability Products SN54BCT8240A . . . JT PACKAGE SN74BCT8240A . . . DW OR NT PACKAGE TOP VIEW

74BCT8244

Abstract: 65630 54BCT8244 BCT8244
Contextual Info: SN54BCT8244, SN74BCT8244 SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042—TI0037—D3413, FEBRUARY 1990 Members of Texas Instruments SCOPE Family of Testability Products SN54BCT8244 . . . JT PACKAGE SN74BCT8244 . . . DW OR NT PACKAGE TOP VIEW Octal Test Integrated Circuits

TDI14

Abstract: TI0286-D3597
Contextual Info: SN54ACT8997, SN74ACT8997 SCAN PATH LINKERS WITH 4-BIT IDENTIFICATION BUSES Members of the Texas Instruments SCOPE Family of Testability Products PRODUCT PREVIEW T 10286— D3597, APRIL 1990 SN54ACT8997 . . . JT PACKAGE SN74ACTS997 . . . OW OR NT PACKAGE

d3598

Abstract: 74ACT8999 SN74ACT8999 ACT8999 SN54ACT8999
Contextual Info: SN54ACT8999, SN74ACT8999 SCAN PATH SELECTORS WITH 8-BIT BIDIRECTIONAL DATA BUSES TI0287— D3598, JUNE 1990 PRODUCT SN54ACT8999 . . . JT PACKAGE SN74ACT8999 . . . DW OR NT PACKAGE Members of the Texas Instruments SCOPE" Family of Testability Products TOP VIEW

BCT8244A

Abstract: SN54BCT8244A SN74BCT8244A
Contextual Info: SN54BCT8244A, SN74BCT8244A SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042D - FEBRUARY 1990 - REVISED APRIL 1994 SN 54BCT8244A . . . JT PACKAGE SN 74BCT8244A . . . DW OR NT PACKAGE TOP VIEW Members of the Texas Instruments SCOPE Family of Testability Products

BCT8245

Abstract: 54BCT8245 74BCT245 D35-14 74BCT8245
Contextual Info: SN54BCT8245, SN74BCT8245 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS TI0038— D3514, MAY 1990 SN54BCT8245 . . . JT PACKAGE SN74BCT8245 . . . DW OR NT PACKAGE Members of Texas Instruments SCOPE” Family of Testability Products TOP VIEW Octal Test Integrated Circuits

T10222-08373

Contextual Info: SN54BCT8373, SN74BCT8373 SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES T10222—08373 JUNE 1990 Members of Texas Instruments SCOPE Family of Testability Products SNS4BCT8373 . . . JT PACKAGE SN74BCT8373 . . . DW OR NT PACKAGE TOP VIEW Octal Test Integrated Circuits

74BCT8245

Abstract: 74BCT245 54BCT8245 ha 11226
Contextual Info: SN54BCT8245, SN74BCT8245 SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS TI0038— D 3514, MAY 1990 SN54BCT8245 . . . JT PACKAGE SN74BCT8245 . . . DW OR NT PACKAGE Members of Texas Instruments SCOPE"1 Family of Testability Products TOP VIEW Octal Test Integrated Circuits

d837

Abstract: 74BCT373 ti0222 SN74BCT8373
Contextual Info: SN54BCT8373, SN74BCT8373 SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES TI0222— D8373 JUNE 1990 Members of Texas Instruments SCOPE Family of Testability Products SN54BCT8373 . . . JT PACKAGE SN74BCT8373 . . . DW OR NT PACKAGE TOP VIEW Octal Test Integrated Circuits

d3413

Abstract: BCT8244 54BCT8244 SCBS042-TI0037-D3413 74BCT8244 74BCT244 SN74BCT8244 Texas Instruments bct8244
Contextual Info: SN54BCT8244, SN74BCT8244 SCAN TEST DEVICES WITH OCTAL BUFFERS SCBS042— TI0037— D3413, FEBRUARY 1990 Members of Texas Instruments SCOPE Family of Testability Products SN54BCT8244 . . . JT PACKAGE SN74BCT6244 . . . DW OR NT PACKAGE TOP VIEW Octal Test Integrated Circuits

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products

Contextual Info: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products

Contextual Info: SN54BCT8245A, SN74BCT8245A SCAN TEST DEVICES WITH OCTAL BUS TRANSCEIVERS SCBS043E − MAY 1990 − REVISED JULY 1996 SN54BCT8245A . . . JT PACKAGE SN74BCT8245A . . . DW OR NT PACKAGE TOP VIEW D Members of the Texas Instruments D D D D D DIR B1 B2 B3 B4 GND

SN74HC7008

Abstract: 74* multifunction nand nor D2880
Contextual Info: SN54HC7008, SN74HC7008 6-SECTION MULTIFUNCTION NANO, INVERT. NOR CIRCUITS D 2880 , M A R C H 1 9 8 5 -R E V IS E D SEPTEM BER 1987 Dependable Texas Instruments Quality and Reliability SN 74H C 7008 . . . DW OR NT PA C K AG E (T O P VIEW ) T h e S N 5 4 H C 7 0 0 8 an d S N 7 4 H C 7 0 0 8 a re e a c h

9.1 b2

Abstract: SN54ABT2952A SN74ABT2952A
Contextual Info: SN54ABT2952A, SN74ABT2952A OCTAL BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS SCBS203A – AUGUST 1992 – REVISED JULY 1994 • • • • B8 B7 B6 B5 B4 B3 B2 B1 OEAB CLKAB CLKENAB GND 1 24 2 23 3 22 4 21 5 20 6 19 7 18 8 17 9 16 10 15 11 14 12 13

BCT2827C

Abstract: SN54BCT2827C SN74BCT2827C SN74BCT2827CDW SN74BCT2827CDWE4 SN74BCT2827CDWR SN74BCT2827CDWRE4
Contextual Info: SN54BCT2827C, SN74BCT2827C 10-BIT BUS/MOS MEMORY DRIVERS WITH 3-STATE OUTPUTS SCBS007E – APRIL 1987 – REVISED NOVEMBER 1993 • • • • OE1 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 GND 1 24 2 23 3 22 4 21 5 20 6 19 7 18 8 17 9 16 10 15 11 14 12 13 VCC Y1 Y2

P3C60

Abstract: SN54AS882A SN74AS882A AS1881
Contextual Info: SN54AS882A, SN74AS882A 32•81T LOOK·AHEAD CARRY GENERATORS 02661, DECEMBER 1982 - REVISED NOVEMBER 1985 • Directly Compatible with 'AS181B, 'AS1181, 'AS881B, and 'AS1881 ALUs • Included among the Package Options are Compact, 24-Pin, 300-mil-Wide DIPs and

BCT2827C

Abstract: SN54BCT2827C SN74BCT2827C SN74BCT2827CDW SN74BCT2827CDWR SN74BCT2827CNSR SN74BCT2827CNT
Contextual Info: SN54BCT2827C, SN74BCT2827C 10-BIT BUS/MOS MEMORY DRIVERS WITH 3-STATE OUTPUTS SCBS007E – APRIL 1987 – REVISED NOVEMBER 1993 • • • • OE1 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 GND 1 24 2 23 3 22 4 21 5 20 6 19 7 18 8 17 9 16 10 15 11 14 12 13 VCC Y1 Y2

BCT2827C

Abstract: SN54BCT2827C SN74BCT2827C SN74BCT2827CDW SN74BCT2827CDWE4 SN74BCT2827CDWR SN74BCT2827CDWRE4
Contextual Info: SN54BCT2827C, SN74BCT2827C 10-BIT BUS/MOS MEMORY DRIVERS WITH 3-STATE OUTPUTS SCBS007E – APRIL 1987 – REVISED NOVEMBER 1993 • • • • OE1 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 GND 1 24 2 23 3 22 4 21 5 20 6 19 7 18 8 17 9 16 10 15 11 14 12 13 VCC Y1 Y2

Contextual Info: SN54BCT2827C, SN74BCT2827C 10-BIT BUS/MOS MEMORY DRIVERS WITH 3-STATE OUTPUTS SCBS007E – APRIL 1987 – REVISED NOVEMBER 1993 • • • • OE1 A1 A2 A3 A4 A5 A6 A7 A8 A9 A10 GND 1 24 2 23 3 22 4 21 5 20 6 19 7 18 8 17 9 16 10 15 11 14 12 13 VCC Y1 Y2

Contextual Info: SN54ABT652A, SN74ABT652A OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS SCBS072F – JANUARY 1991 – REVISED MAY 1997 D D D CLKAB SAB OEAB A1 A2 A3 A4 A5 A6 A7 A8 GND 1 24 2 23 3 22 4 21 5 20 6 19 7 18 8 17 9 16 10 15 11 14 12 13 VCC CLKBA SBA OEBA B1