WA28D Search Results

WA28D

Contextual Info: 28 Lead Cerpack NS Package Number WA28D All dimensions are in inches millimeters LIFE SUPPORT POLICY NATIONAL’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF NATIONAL

SCANPSC110F

Abstract: SCANPSC110FDMQB SCANPSC110FFMQB SCANPSC110FLMQB SCANPSC110FSC SCANPSC110FSCX
Contextual Info: General Description Features The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is improved test throughput and the ability to remove a

SCANPSC110F

Abstract: SCANPSC110FDMQB SCANPSC110FFMQB SCANPSC110FLMQB
Contextual Info: SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description Features The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan

w14b

Abstract: WG16A w14c W24C W10A W16A W20A WG20A CERPACK WG14A CERPACK-10
Contextual Info: Cerpack 10 Lead Cerpack NS Package Number W10A 2000 National Semiconductor Corporation MS101112 www.national.com Cerpack August 1999 Cerpack 10 Lead Cerpack NS Package Number WG10A 14 Lead Cerpack NS Package Number W14B www.national.com 2 Cerpack 14 Lead Cerpack

DS1776

Abstract: 54F776 E28A J28B WA28D
Contextual Info: DS1776 PI-Bus Transceiver General Description The DS1776 is an octal PI-bus Transceiver. The A to B path is latched. B outputs are open collector with series Schottky diode, ensuring minimum B output loading. B outputs also have ramped rise and fall times 2.5 ns typical , ensuring

54F776 SIGNETICS

Abstract: DS1776 54F776 E28A J28B
Contextual Info: DS1776 ^National Semiconductor DS1776 Pl-Bus Transceiver General Description The DS1776 is an octal Pl-bus Transceiver. The A to B path is latched. B outputs are open collector with series Schottky diode, ensuring minimum B output loading. B outputs also have ramped rise and fall times 2.5 ns typical , ensuring

5962-9475001Q3A

Abstract: 5962-9475001QXA 5962-9475001QYA SCANPSC100F SCANPSC100FDMQB SCANPSC100FFMQB SCANPSC100FLMQB 1096-11
Contextual Info: February 1996 SCANPSC100F Embedded Boundary Scan Controller IEEE 1149.1 Support General Description Features The SCANPSC100F is designed to interface a generic par­ allel processor bus to a serial scan test bus. It is useful in improving scan throughput when applying serial vectors to

transistor BC 458

Abstract: transistor BC 945 ac 1084 transistor bc 577 Transistor BC 585 MS-015-AB TRANSISTOR A42 bd 743 transistor uA109 CA 358 AE
Contextual Info: Hermetic Dimensional/Thermal Data The following table identifies all of the hermetic package configurations and pin counts per package type offered by National Semiconductor. In addition, the table provides dimensional and thermal data for each of the ceramic and

code 4 bit LFSR

Abstract: h bridge CSP
Contextual Info: SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description Features The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan

Contextual Info: SCANPSC100F Embedded Boundary Scan Controller IEEE 1149.1 Support General Description Features The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus. It is useful in improving scan throughput when applying serial vectors to system test circuitry and reduces the software overhead that is

SCANPSC100FSC

Abstract: SCANPSC100FSCX SCANPSC100F SCANPSC100FFMQB
Contextual Info: SCANPSC100F Embedded Boundary Scan Controller IEEE 1149.1 Support General Description Features The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus. It is useful in improving scan throughput when applying serial vectors to system test circuitry and reduces the software overhead that is

SCANPSC100F

Abstract: fairchild tdi 1999 Dynamic Memory Refresh Controller
Contextual Info: SCANPSC100F Embedded Boundary Scan Controller IEEE 1149.1 Support General Description Features The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus. It is useful in improving scan throughput when applying serial vectors to system test circuitry and reduces the software overhead that is

Contextual Info: S E M IC O N D U C T O R tm SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description Features The SC AN PSC 110F Bridge extends th e IEEE Std. 1149.1 test bus into a m ultidrop test bus environm ent. The advan­

54F776 SIGNETICS

Abstract: DS1776 54F776 C1996 E28A J28B G701
Contextual Info: DS1776 PI-Bus Transceiver General Description The DS1776 is an octal PI-bus Transceiver The A to B path is latched B outputs are open collector with series Schottky diode ensuring minimum B output loading B outputs also have ramped rise and fall times 2 5 ns typical ensuring

Contextual Info: SCANPSC110F SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support Literature Number: SNOS136C SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port (IEEE1149.1 System Test Support) General Description

E28A

Abstract: J28A SCANPSC100F WA28D
Contextual Info: SCANPSC100F Embedded Boundary Scan Controller IEEE 1149.1 Support General Description Features The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus. It is useful in improving scan throughput when applying serial vectors to

PSC-100

Abstract: PSC100F
Contextual Info: SCANPSC100F Embedded Boundary Scan Controller IEEE 1149.1 Support General Description Features The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus. It is useful in improving scan throughput when applying serial vectors to

Contextual Info: SCANPSC100F SCANPSC100F Embedded Boundary Scan Controller IEEE 1149.1 Support Literature Number: SNOS134C SCANPSC100F Embedded Boundary Scan Controller (IEEE 1149.1 Support) General Description Features The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus. It is useful in

Contextual Info: 18373T ß National Semiconductor SCAN18373T Transparent Latch with TRI-STATE Outputs General Description Features The SCAN18373T is a high speed, low-power transparent latch featuring separate data inputs organized into dual 9-bit bytes with byte-oriented latch enable and output enable

transistor BC 458

Abstract: transistor a42 MO-003 transistor Bc 540 ua109a CERAMIC PIN GRID ARRAY CPGA lead frame transistor bc 577 W144A UA65A CERAMIC QUAD FLATPACK CQFP
Contextual Info: Hermetic Dimensional/Thermal Data The following table identifies all of the hermetic package configurations and pin counts per package type offered by National Semiconductor. In addition, the table provides dimensional and thermal data for each of the ceramic and

lfsr16

Abstract: SCANPSC110FFMQB SCANPSC110FLMQB SCANPSC110F
Contextual Info: SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149.1 System Test Support General Description Features The SCANPSC110F Bridge extends the IEEE Std. 1149.1 test bus into a multidrop test bus environment. The advantage of a hierarchical approach over a single serial scan chain is

5962-9475001QXA

Abstract: 5962-9475001QYA C1996 SCANPSC100F SCANPSC100FDMQB SCANPSC100FFMQB SCANPSC100FLMQB SCANPSC100FSC SCANPSC100FSCX SCANPSC100
Contextual Info: SCANPSC100F Embedded Boundary Scan Controller IEEE 1149 1 Support General Description Features The SCANPSC100F is designed to interface a generic parallel processor bus to a serial scan test bus It is useful in improving scan throughput when applying serial vectors to

64 CERAMIC LEADLESS CHIP CARRIER LCC

Abstract: C1996 SCANPSC110F SCANPSC110FDMQB SCANPSC110FFMQB SCANPSC110FLMQB SCANPSC110FSC SCANPSC110FSCX
Contextual Info: SCANPSC110F SCAN Bridge Hierarchical and Multidrop Addressable JTAG Port IEEE1149 1 System Test Support General Description Features The SCANPSC110F Bridge extends the IEEE Std 1149 1 test bus into a multidrop test bus environment The advantage of a hierarchical approach over a single serial scan

bsr44

Abstract: 56LD
Contextual Info: 182646A tSGllSS D O V ^ m o 507 • NSC1 53 National ÆÆ Semiconductor ADVANCE INFORMATION SCAN 182646A Serially Controlled Access Network 18-Bit Registered Transceiver with 2511 Series Resistor Outputs General Description Features The SCAN182646A is a high performance BiCMOS 18-bit