WHISKER TEST DATA Search Results

Cu6Sn5

Abstract: Olin-194
Contextual Info: Whisker on Cu 06-June-03 Back Up Block 1 Whisker on Cu Whisker on Cu 06-June-03 Storage conditions • Test data showed that whiskers grow longest at room temperature Explanation: irregular intermetallic growth 1,9 µm ambient 250 1,9 µm 55 °C / ambient

RESISTOR NETWORK

Abstract: CTS RESISTOR NETWORK resistor single in line resistor package c series transistor equivalent table CTS NETWORK RESISTOR transistor equivalent table testing of diode network resistor series RESISTOR NETWORK
Contextual Info: PRODUCT EVALUATION Date: January, 2008 PRODUCT EVALUATION REPORT FOR Series:770 TIN WHISKER TEST Test Report Series 770 Resistor Network Tin Whisker Report Series: 770 Figure 1. Package Style Single-In-Line resistor network testing performed per conditions as outlined in Table 1.

resistor

Abstract: array resistor 741 series c series transistor equivalent table 741 data sheet 745 diode resistor datasheet
Contextual Info: PRODUCT EVALUATION Date: February, 2007 PRODUCT EVALUATION REPORT FOR Series:740/741/742/743/744/745/746 TIN WHISKER TEST Test Report Series 74X Chip Resistor Arrays Tin Whisker Report for Series: 740/741/742/743/744/745/746 Resistor chip array testing performed per conditions as outlined in Table 1.

Contextual Info: VS-HFA25TB60HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 25 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 2 whisker test • Material categorization:

Contextual Info: VS-HFA08TB120HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 8 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 2 whisker test 2 • Material categorization:

Contextual Info: VS-HFA16PB120HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 16 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:

Contextual Info: VS-HFA50PA60CHN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 2 x 25 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:

Whisker test data

Abstract: OY Series Composition
Contextual Info: Whisker Test Data OX/OY Series Carbon Composition Resistors Ambient Temp./ Humidity Test condition: • 30°C±2 • 60%RH±3 • 4000hrs Ohmite Mfg. Co. Type Plating Treatment 500 hrs. No.1 No.2 No.3 No.4 No.5 No.6 No.7 No.8 No.9 No.10 Ave. Max. Min. 1000 hrs. No.1

Contextual Info: VS-HFA30PB120HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 30 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization: 

VS-HFA30PB120

Contextual Info: New Product VS-HFA30PB120HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 30 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:

Contextual Info: New Product VS-HFA25TB60HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 25 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 2 whisker test • Material categorization:

Contextual Info: Whisker Test Data OX/OY Series Carbon Composition Resistors Ambient Temp./ Humidity Test condition: • 30°C±2 • 60%RH±3 • 4000hrs Type Plating Treatment 500 hrs. No.1 No.2 No.3 No.4 No.5 No.6 No.7 No.8 No.9 No.10 Ave. Max. Min. 1000 hrs. No.1 No.2

Contextual Info: VS-HFA30PB120HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 30 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization: 

Contextual Info: New Product VS-HFA30PB120HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 30 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:

Contextual Info: VS-HFA30TA60CHN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 2 x 15 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:

Contextual Info: VS-HFA16PB120HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 16 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:

Contextual Info: VS-HFA08TB60HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 8 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified meets JESD 201 class 2 whisker test 2 • Material categorization:

Contextual Info: VS-HFA06TB120HN3 www.vishay.com Vishay Semiconductors HEXFRED , Ultrafast Soft Recovery Diode, 6 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 2 whisker test 2 • Material categorization:

Contextual Info: VS-HFA30PB120HN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 30 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization: 

smema

Abstract: smema control STR223 smema wiring electronics nasa smema specifications Phoenix contact subcon 9 connector tamura solder paste tamura tin lead solder paste Telcon
Contextual Info: TND311 Tin Whisker Info Brief" http://onsemi.com APPLICATION NOTE acceleration test with quantified acceleration factors is unknown. This is complicated further by the highly variable “incubation” period during which stress builds before whiskers grow. However, ON has completed testing using

Contextual Info: New Product VS-HFA30TA60CHN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 2 x 15 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:

Contextual Info: VS-HFA50PA60CHN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 2 x 25 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization:

Contextual Info: VS-HFA30TA60CHN3 www.vishay.com Vishay Semiconductors HEXFRED Ultrafast Soft Recovery Diode, 2 x 15 A FEATURES • Ultrafast and ultrasoft recovery • Very low IRRM and Qrr • AEC-Q101 qualified, meets JESD 201 class 1A whisker test • Material categorization: for definitions of

sem 2005

Abstract: TA016TCM106KBR
Contextual Info: TIN WHISKER TANTALUM DATA REPORT Product: Tantalum Chip Capacitors Solder Coat Finish: 100% Matte Tin Sn over high porosity Nickel (Ni) Item: Tin Whisker Growth & Density Testing Venkel P/N: TA016TCM106KBR Date Performed: September 2007 Contents: 1. 2. 3.