teradyne z1890
Abstract: Z1890 teradyne products intel 80486 architecture
Contextual Info: ON-BOARD PROGRAMMING EQUIPMENT TERADYNE Z1890 • ■ ■ ■ ■ ■ Cost-effective in-circuit test targets manufacturing defects Product function test and in-circuit process test combined in one platform Open architecture and built-in upgrade path Flexibility and high throughput
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Z1890
Z1890
teradyne z1890
teradyne products
intel 80486 architecture
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teradyne z1890
Abstract: Z1890 teradyne z1800 testing of diode 28F001BX 28F002BC 28F002BX 28F010 28F020
Contextual Info: ON-BOARD PROGRAMMING EQUIPMENT TERADYNE Z1890 • ■ ■ ■ ■ ■ Cost-effective in-circuit test targets manufacturing defects Product function test and in-circuit process test combined in one platform Open architecture and built-in upgrade path Flexibility and high throughput
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Z1890
Z1890
28F008BV,
28F008SA,
28F008SC,
28F800BV,
28F800CE,
28F800CV,
teradyne z1890
teradyne
z1800
testing of diode
28F001BX
28F002BC
28F002BX
28F010
28F020
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teradyne z1890
Abstract: Sis 968 ispMACH 4000 development circuit gal amd 22v10 22v10 pal gal programming 22v10 Pal programming 22v10 272-BGA GAL programming PALCE* programming
Contextual Info: L A T T I C E S E M I C O N D U C T Programmable Logic Devices O R “A vision of the ultimate system — Lattice provides the tools and analog, digital, and everything in support necessary to utilize each between, instantly re-programmable.” of these building blocks. The
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I0107A
teradyne z1890
Sis 968
ispMACH 4000 development circuit
gal amd 22v10
22v10 pal
gal programming 22v10
Pal programming 22v10
272-BGA
GAL programming
PALCE* programming
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HP 3070 Tester
Abstract: Teradyne z1880 Z188 altera EPM7032B GR2286 teradyne z1890 teradyne tester test system 3079ct pm3705
Contextual Info: In-Circuit Test Vendor Support August 1999, ver. 2.01 In-circuit testers are widely used for manufacturing tests and for the measurement of printed circuit board PCB systems. In-circuit testers can also program and verify programmable logic devices (PLDs) that support
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-GN-ICT-02
HP 3070 Tester
Teradyne
z1880
Z188
altera EPM7032B
GR2286
teradyne z1890
teradyne tester test system
3079ct
pm3705
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teradyne z1890
Abstract: Sis 968 29MA16 BGA and QFP Package gal amd 22v10 MACH4A pLSI 1016 mach 1 family amd 22v10 pal AMD BGA
Contextual Info: L A T T I C E S E M I C O N D U C T Programmable Logic Devices Copyright 2000 Lattice Semiconductor Corporation. Lattice Semiconductor Corporation 5555 Northeast Moore Court Hillsboro, Oregon 97124 U.S.A. Lattice Semiconductor, L stylized Lattice Semiconductor Corp., and Lattice (design), E2CMOS, GAL, Generic Array Logic, ISP,
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teradyne z1880
Abstract: teradyne z1890 z1880 JTAG Technologies 3079CT Altera pcmcia controller GR2283i GR2281i epm7128s teradyne tester test system
Contextual Info: ATE Vendor Support April 1997, ver. 1 Automated test equipment ATE is widely used for manufacturing tests and for the measurement of printed circuit board (PCB) systems. ATE can also program and verify programmable logic devices (PLDs) with insystem programmability (ISP). Using ATE to program ISP-based devices
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GR2286
Abstract: Altera pcmcia controller intertech EPM7384 GR2281i EPM7256 teradyne z1880 Jam Technologies JTAG Technologies Teradyne spectrum
Contextual Info: In-Circuit Test Vendor Support February 1998, ver. 2 In-circuit testers are widely used for manufacturing tests and for the measurement of printed circuit board PCB systems. In-circuit testers can also program and verify programmable logic devices (PLDs) that support
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contaPM7256A
EPM7128A
EPM7064A
EPM7032A
GR2286
Altera pcmcia controller
intertech
EPM7384
GR2281i
EPM7256
teradyne z1880
Jam Technologies
JTAG Technologies
Teradyne spectrum
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