DSAIHSC00079926.pdf by Not Available

Partial File Text m 37E D High-Reliability High-Speed CMOS Logic ICs _ , _ CD54HC194/3A CD54HCT194/3A HARRIS SE"IC0NI SECT0R~ 'T-Hi-OS-oS Burn-In Test-Circuit Connections Static 12-15 Dynamic
Datasheet Type Scan
RoHS Unknown
Pb Free Unknown
Lifecycle Unknown

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