DSASW00297031.pdf by National Semiconductor

Partial File Text 1 Single Event Transient and ELDRS Characterization Test Results for LM4050QML 2.5V Precision Reference Kirby Kruckmeyer, Member, IEEE, Elisa Morozumi, Member, IEEE, Robert Eddy, Thang Trinh, T
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5962R0923561VZA DS16F95QML ETS500 LDR SPECIFICATION LM4050Q LM4050WG2 LM4050WG2.5RLQV Radiation Assured Devices texas ldr TM1019