The recommended power-on sequence is to apply VDD first, followed by VDDIO, and then the clock signal. This ensures proper initialization of the device.
The self-test feature is enabled by setting the ST bit in the CTRL_REG4 register. During self-test, the sensor outputs a predefined acceleration value. The self-test result can be read from the OUT_X, OUT_Y, and OUT_Z registers.
The interrupt pins can be configured to generate interrupts based on specific events, such as data ready, overrun, or free-fall detection. This allows the microcontroller to be notified when new data is available or when a specific condition is met.
The LIS35DE does not require calibration in the classical sense. However, it is recommended to perform a zero-g offset calibration by taking the average of multiple readings at rest and subtracting this value from subsequent readings to improve accuracy.
The maximum sampling rate of the LIS35DE is 1.6 kHz (1600 Hz) in normal mode and 3.2 kHz (3200 Hz) in low-power mode.
LIS35DE datasheet
by STMicroelectronics
