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    MGA-635T6-BLKG datasheet by Avago Technologies

    • RF Amplifiers, RF/IF and RFID, IC AMP GPS LNA 0.9-2.4GHZ 6UTSLP
    • Original
    • Yes
    • Yes
    • Obsolete
    • EAR99
    • 8542.33.00.01
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    • Always verify details of parts you are evaluating, as these parts are offered as suggestions for what you are looking for and are not guaranteed.

    MGA-635T6-BLKG datasheet preview

    MGA-635T6-BLKG Frequently Asked Questions (FAQs)

    • Broadcom provides a reference design guide for the MGA-635T6-BLKG, which includes recommendations for PCB layout, thermal management, and component placement. It's essential to follow these guidelines to ensure optimal performance, thermal stability, and reliability.
    • The MGA-635T6-BLKG requires careful biasing and matching to achieve optimal performance. Broadcom provides a set of recommended biasing and matching circuits, but engineers may need to fine-tune these values based on their specific application and operating conditions. Simulation tools like ADS or Genesys can be used to optimize the design.
    • Broadcom provides reliability data for the MGA-635T6-BLKG, including MTBF estimates, in the device's reliability report. Engineers can request this report from Broadcom or their authorized distributors. The report provides detailed information on the device's reliability, including failure rates, and can help engineers estimate the expected lifespan of their design.
    • To ensure EMC and EMI compliance, engineers should follow Broadcom's guidelines for PCB layout, shielding, and filtering. Additionally, they should consider using EMI filters, such as pi-filters or common-mode chokes, to reduce emissions and improve immunity. It's also essential to perform EMC and EMI testing to validate the design's compliance with relevant standards.
    • Broadcom provides guidelines for handling and storing the MGA-635T6-BLKG to prevent damage and ensure reliability. Engineers should follow these guidelines, which include proper packaging, storage temperatures, and handling procedures, to minimize the risk of damage during manufacturing, testing, and deployment.
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