SN74BCT8374ADWR datasheet by Texas Instruments

Description Scan Test Device With Octal D-Type Edge-Triggered Flip-Flops 24-SOIC 0 to 70
Datasheet Type Original
RoHS Yes
Pb Free Yes
Lifecycle Obsolete
Price & Stock
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Equivalent Parts !
Always verify details of parts you are evaluating, as these parts are offered as suggestions for what you are looking for and are not guaranteed.

SN74BCT8374DWR SN74BCT8374ADWRE4 SN74BCT8374ADWG4 SN74BCT8374ADWRE4 SN74BCT8374DW

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