Texas Instruments recommends a 4-layer PCB with a solid ground plane, and to keep the analog and digital traces separate. Additionally, it's recommended to use a low-ESR capacitor for the AVDD pin and to keep the input traces as short as possible.
To handle the high input impedance of the TLV2545CDGK, it's recommended to use a buffer amplifier or an op-amp with a low output impedance to drive the input pins. Additionally, a series resistor can be added to the input pins to help match the impedance and prevent signal reflections.
The maximum sampling rate of the TLV2545CDGK is 400 kSPS, and it can be achieved by using the internal clock and setting the conversion mode to 'Fast'. However, increasing the sampling rate will also increase the power consumption, so it's recommended to optimize the sampling rate based on the specific application requirements.
The TLV2545CDGK has an internal calibration circuit that can be used to calibrate the device. The recommended calibration procedure involves applying a known input voltage and then using the calibration registers to adjust the offset and gain errors. Additionally, it's recommended to perform a system-level calibration that takes into account the entire signal chain, including the sensor and the ADC.
The TLV2545CDGK has a maximum operating temperature range of -40°C to 125°C, and it's recommended to keep the device within this range to ensure accurate and reliable operation. Additionally, it's recommended to provide adequate thermal dissipation and to avoid thermal gradients on the PCB to prevent thermal-induced errors.