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    Abstract: S292P 51366SP
    Text: VISHAY Vishay Telefunken Wafer Process Qualification Photo Detector Operating Life Test Description Device Type Duration Sample Size Failures Tamb = 25°C, V R = 5 V, IRA = 1.0 nA S292P 3 lots 2,000 h 150 Tamb = 100°C, V R = 5 V, IRA = 1.0 nA S292P 2,000 h


    OCR Scan     		PDF S292P S292P H4898 26H4911 51366SP