9174601QLA Search Results
9174601QLA Result Highlights (1)
| Part | ECAD Model | Manufacturer | Description | Download | Buy |
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| 5962-9174601QLA |
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Scan Test Devices With Octal Buffers 24-CDIP -55 to 125 |
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9174601QLA Price and Stock
Texas Instruments 5962-9174601QLAPeripheral ICs |
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| Distributors | Part | Package | Stock | Lead Time | Min Order Qty | Price | Buy | ||||
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5962-9174601QLA | 1,426 |
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9174601QLA Datasheets Context Search
| Catalog Datasheet | Type | Document Tags | |
|---|---|---|---|
bct8240aContextual Info: SN54BCT8240A, SN74BCT8240A SCAN TEST DEVICES WITH OCTAL INVERTING BUFFERS SCBS067E – FEBRUARY 1990 – REVISED DECEMBER 1996 D D D D D description The ’BCT8240A scan test devices with octal buffers are members of the Texas Instruments SCOPE testability integrated-circuit family. This |
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SN54BCT8240A, SN74BCT8240A SCBS067E BCT240 SNJ54BCT8240AFK 5962View 9174601Q3A SNJ54BCT8240AJT 9174601QLA bct8240a |