A14O Search Results

CXK27C512DQ-15

Abstract: A130 CXK27C512DQ-20
Contextual Info: CXK27C512DQ -15/20 SONY» 65536-word X 8-bit Ultraviolet Erasable CM OS EPROM Description The CXK27C512DQ is an electrically programmable, ultraviolet erasable CMOS EPROM. The adoption o f CMOS fo r the peripheral circuits allows fo r high speed operation and low power

Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

SN54ABT18504

Abstract: SN74ABT18504
Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

Contextual Info: S o n y . CXK58110OTM/YM -11O0L 05<L L X LX L X/1 / 12 2D L< L/,5 X /1 131072-word x 8-bit High Speed CMOS Static RAM D escription CXK58110OTM/YM is a 1M bits, 131,072 words by 8 bits, CMOS static RAM. It is suitable for portable and battery back-up systems by adopting TSOP packages

SN54ABT18504

Abstract: SN74ABT18504 A14O
Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

SN54ABT18504

Abstract: SN74ABT18504
Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

SRM2261

Abstract: SRM2261C55 SRM2261C70 AL221 2551 vn 001542
Contextual Info: OB PF211-52 kT W ^ S Si A M. A i SYSTEMS HIGH SPEED 64K BIT CMOS STATIC RAM SRM2261C55 ' SRM2261C7o SRM2261 r ; 'S - ; 7v I DESCRIPTION T h e S R M 2 2 6 IC 55/70 is a 6 5 ,5 3 6 words * 1 bit asynchronous, static, random a c cess memory or a monolithic C M O S chip. Its very low standby power requirem ent m akes it ideal for applications requiring non-volatile

PD70320

Abstract: UPD70320GJ UPD70320L-8 uPD70108 MPD70320 ACE SC CSA10.0MT shs-40 70116c stm cl-11
Contextual Info: z r — S 7 • is — S MOS M O S Integrated Circuit ¿uPP7 0 3 2 0 V25 16/8 t f "S h • > > 9 /¿PD70320 m #V25 7 7° (i, 161'-y hCPU, RAM, > h n - 7 Ì f 1 -f- flj h • •vf 9d7dì ÿ ')7 'W -i^ 7 i-X , tzis >7 Ki- ■y-t//PD70108/70116 (SiJ«#V20™/V30™)

TC544096P

Abstract: TC574096D
Contextual Info: 4 M EG A BIT 262,144 W 0 R D x 1 6 BIT CMOS ONE TIME PROGRAM M ABLE READ ONLY M EM ORY DESCRIPTION The TC544096P/F is a 262,144 word X 16 bit CMOS one time programmable read only memory. The TC544096P/F is JEDEC standard pin configuration. TC544096F/F is fabricated with the CMOS technology* Advanced circuit techniques provide

Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

Contextual Info: SONY C XK5B81020J/T M 131072-word x 8-bit High Speed Bi-CMOS Static RAM Description CXK5B81020J/TM is a high speed 1M bit Bi-CMOS static RAM organized as 131072 words by 8 bits. Operating on a single 3.3V supply this asynchronous IC is suitable for use in high speed and low power

SN54ABT18504

Abstract: SN74ABT18504
Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

DIP-32P-M

Abstract: MB8287
Contextual Info: CMOS 262144-BIT STATIC RANDOM ACCESS MEMORY FUJITSU MB8287-25 MB8287-35 March 1989 Edition 2,0 32K x 8-BIT STATIC RANDOM ACCESS MEMORY WITH PARITY GENERATOR AND CHECKER The Fu jitsu M B8287 is 32768 words x 8 bits high speed static random access mem ory w ith parity generator and checker, fabricated w ith CM O S technology.

Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

UPD78243

Abstract: UPD78244CW-XXX IEU-754 UPD78243CW UPD78214 UPD78213 UPD78244 transistor BL P64 YX60 UPD78213GC
Contextual Info: DATA SH EET MOS INTEGRATED C IR C U IT ß PD78243, 78244 8-BIT SIN G LE-CHIP MICROCOMPUTER Th e inform ation in this docum ent is subject to change w ithout notice. Document No. 0. D. No. 1C—2774C IC -8 0 7 0 C Date Published February 1994 P _ Printed in Japan

Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments

SN54ABT18504

Abstract: SN74ABT18504 A13-O
Contextual Info: SN54ABT18504, SN74ABT18504 SCAN TEST DEVICES WITH 20-BIT UNIVERSAL BUS TRANSCEIVERS SCBS108B – AUGUST 1992 – REVISED JUNE 1993 • • • • • • • Members of the Texas Instruments SCOPE  Family of Testability Products Members of the Texas Instruments