BCT373 Search Results

BCT8373A

Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

V5050

Abstract: F373 SN54BCT8373A SN74BCT8373A
Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: BCT373, BCT373 OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS016C – SEPTEMBER 1988 – REVISED NOVEMBER 1993 • • • • BCT373 . . . J OR W PACKAGE BCT373 . . . DB, DW, OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design

SN54BCT373

Abstract: SN74BCT373
Contextual Info: BCT373, BCT373 OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS016C – SEPTEMBER 1988 – REVISED NOVEMBER 1993 • • • • BCT373 . . . J OR W PACKAGE BCT373 . . . DB, DW, OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design

Contextual Info: BCT373, BCT373 OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS016D – SEPTEMBER 1988 – REVISED MARCH 2003 D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading

Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: BCT373, BCT373 OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS016D – SEPTEMBER 1988 – REVISED MARCH 2003 D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading

F373

Abstract: SN54BCT8373A SN74BCT8373A
Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: BCT373, BCT373 OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS016C - SEPTEMBER 1988 - REVISED NOVEMBER 1993 BCT373 . . . J OR W PACKAGE BCT373 . . DB, DW, OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design Significantly Reduces Standby Current

Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES _ SCBS044F - JUNE 1990 - REVISED JULY 1996 I • | I • • [ • • • • • Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits

Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: BCT373, BCT373 OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS016D – SEPTEMBER 1988 – REVISED MARCH 2003 D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading

F373

Abstract: SN54BCT8373A SN74BCT8373A
Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

SN54BCT373

Abstract: SN74BCT373
Contextual Info: BCT373, BCT373 OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS016C – SEPTEMBER 1988 – REVISED NOVEMBER 1993 • • • • BCT373 . . . J OR W PACKAGE BCT373 . . . DB, DW, OR N PACKAGE TOP VIEW State-of-the-Art BiCMOS Design

Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: BCT373, BCT373 OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS016D – SEPTEMBER 1988 – REVISED MARCH 2003 D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading

Contextual Info: BCT373, BCT373 OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS016D – SEPTEMBER 1988 – REVISED MARCH 2003 D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading

Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

SN54BCT373

Abstract: SN74BCT373 SN74BCT373DW SN74BCT373DWR SN74BCT373N SN74BCT373NSR
Contextual Info: BCT373, BCT373 OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS016D – SEPTEMBER 1988 – REVISED MARCH 2003 D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading

Contextual Info: BCT373, BCT373 OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS016D – SEPTEMBER 1988 – REVISED MARCH 2003 D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading

V5050

Abstract: F373 SN54BCT8373A SN74BCT8373A
Contextual Info: SN54BCT8373A, SN74BCT8373A SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES SCBS044F – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8373A scan test devices with octal D-type latches are members of the Texas Instruments SCOPE testability integratedcircuit family. This family of devices supports IEEE

Contextual Info: BCT373, BCT373 OCTAL TRANSPARENT D-TYPE LATCHES WITH 3-STATE OUTPUTS SCBS016D – SEPTEMBER 1988 – REVISED MARCH 2003 D D Operating Voltage Range of 4.5 V to 5.5 V State-of-the-Art BiCMOS Design Significantly Reduces ICCZ Full Parallel Access for Loading