p15890
Abstract: P-16100 P-15830 P-15890 p1565 DK53 dk52 C19517 P1537 P-16400
Text: RELIABILITY MONITOR SUMMARY DATA STRESS: PRODUCT DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS1302 DS1302 DS1302 DS1302 DS1302 DS1302 DS21S07A DS80320 DS80320 Burn-in 125°C, 7.0 V. 6.0 V. DS1302 MONITOR DATE JOB NO. Mar-95 May-95 Jul-95 Sep-95
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Mar-95
May-95
Jul-95
Sep-95
Nov-95
Jan-95
p15890
P-16100
P-15830
P-15890
p1565
DK53
dk52
C19517
P1537
P-16400
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P1653
Abstract: P15890 dallas date code ds12887
Text: RELIABILITY MONITOR SUMMARY DATA STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 SUMMARY TYPE: PRODUCT DS1302 DS1302 DS1302 DS1302 DS1302 DS1302 DS1302 DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320
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DS1302)
Mar-96
Jan-95
Mar-95
May-95
Jul-95
Sep-95
Dec-95
P1653
P15890
dallas date code ds12887
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P-16996
Abstract: p17531 dk52 P-16887 P-17318 P-16849 P-18414 P-16876
Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 SUMMARY TYPE: PRODUCT DS1302 DS1302 DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 MONITOR DATE JOB NO. Mar-96 Sep-96 Feb-96 Aug-96 Feb-96 May-96
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DS1302)
Mar-96
Sep-96
Feb-96
Aug-96
May-96
Jun-96
P-16996
p17531
dk52
P-16887
P-17318
P-16849
P-18414
P-16876
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dk52
Abstract: P-15782 DK53 P15890 P-16795 148259 p16038 P-17201 C19517 P-15837
Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 SUMMARY TYPE: PRODUCT DS1302 DS1302 DS1302 DS1302 DS1302 DS1302 DS1302 DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320
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DS1302)
DS1302
DS21S07A
dk52
P-15782
DK53
P15890
P-16795
148259
p16038
P-17201
C19517
P-15837
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p15890
Abstract: P-16044 CARSEM
Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 SUMMARY TYPE: PRODUCT DS1302 DS1302 DS1302 DS1302 DS1302 DS1302 DS1302 DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320
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DS1302)
Mar-96
Jan-95
Mar-95
May-95
Jul-95
Sep-95
Dec-95
p15890
P-16044
CARSEM
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dk52
Abstract: P-16890 17872 p1908 P1875 P-18701
Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 SUMMARY TYPE: PRODUCT DS1302 DS1302 DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 MONITOR DATE JOB NO. Mar-96 Sep-96
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DS1302)
Mar-96
Sep-96
Feb-96
Aug-96
Nov-96
Feb-97
May-96
dk52
P-16890
17872
p1908
P1875
P-18701
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DS1868
Abstract: DL6-11 c19643 dallas date code ds12887 P1788 P-18182 dk52
Text: RELIABILITY MONITOR PRODUCT DS1302 DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V.SUMMARY DS1
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DS1302
DS1868
DS21S07A
DL6-11
c19643
dallas date code ds12887
P1788
P-18182
dk52
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DK53
Abstract: dk52 P-17422 P19500 P1908 P-17411 DN546229ATA DS1000M
Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 PRODUCT MONITOR DATE DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS21S07A DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 DS80C320 Mar-96 Sep-96
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DS1302)
DS1302
DS1868
DS21S07A
DS80C320
DK53
dk52
P-17422
P19500
P1908
P-17411
DN546229ATA
DS1000M
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P-20606
Abstract: c19643 DS1868 p19500 p1908 DD642 P19-50 B59728 P2050
Text: RELIABILITY MONITOR STRESS: Infant / High Voltage Life 125°C, 7.0 V. 6.0 V. DS1302 PRODUCT DS1302 DS1302 DS1302 DS1868 DS21S07A DS21S07A DS21S07A DS2401 DS2401 DS2401 DS80C320 DS80C320 DS80C320 DS80C320 MONITOR DATE JOB NO. Mar-97 Jun-97 Sep-97 Feb-97 Feb-97
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DS1302)
Mar-97
Jun-97
Sep-97
Feb-97
May-97
Aug-97
P-20606
c19643
DS1868
p19500
p1908
DD642
P19-50
B59728
P2050
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DS80C320
Abstract: No abstract text available
Text: DALLAS SEMICONDUCTOR 4401 South Beltwood Parkway Dallas, Texas 75244–3292 214 450–0400 Date: February 24, 1995 Subject: PRODUCT CHANGE NOTICE – B50801 Description: DS80C320 Revision Change Description of Change: The DS80C320 revision is being changed from revision A6 to revision B2. Revision B2 corrects all
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B50801
DS80C320
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TSOC 6
Abstract: P22713 P23162 dallas date code ds12887
Text: RELIABILITY MONITOR STRESS: WRITE CYCLE STRESS CONDITIONS: +85°C, 7.0 VOLTS MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY DS1620 D1 SEP 98 P22710 9746 LOT NO. PACKAGE ALPHTK-BANGKOK NSEB DJ711527ABD 8PN SOIC, 208MIL READ POINT QTY FAIL 50 42
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DS1620
P22710
DJ711527ABD
208MIL
J-STD-020
DS1232L
DS1233
DS1267
TSOC 6
P22713
P23162
dallas date code ds12887
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fds5002
Abstract: dallas E8 24715
Text: RELIABILITY MONITOR STRESS: WRITE CYCLE STRESS CONDITIONS: 85 C, 7.0 VOLTS MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY LOT NO. DS1621 A7 JUN '99 24325 9915 ATP Anam, PI DK815282AAB SOIC 50 45 DS1621 A7 SEP '99 24466 9930 ATP (Anam, PI) DK906731AAC SOIC
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DS1621
DS1869
DK815282AAB
DK906731AAC
DJ821534ABB
DJ824252AAC
DJ824247ABA
fds5002
dallas E8
24715
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dallas date code ds1230
Abstract: 25091 e8 sot223 24446
Text: RELIABILITY MONITOR STRESS: WRITE CYCLE STRESS CONDITIONS: 85 C, 7.0 VOLTS MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY LOT NO. DS1621 A7 JUN '99 24325 9915 ATP Anam, PI DK815282AAB SOIC 50 47 DS1869 A3 SEP '99 24445 9907 NSEB DJ824247ABA SOIC
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DS1621
DS1869
DK815282AAB
DJ824247ABA
DM846764AA
DS2502
DS87C520
DN901118AAB
DK935356AAB
dallas date code ds1230
25091
e8 sot223
24446
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dallas date code ds12887
Abstract: dallas date code P23073 DS1225A DALLAS DS80C320 9832 P23403 dallas date code ds80c320 P23074
Text: RELIABILITY MONITOR STRESS: ULTRASOUND CONDITIONS: J-STD-020 MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY LOT NO. PACKAGE DS1233 A5 JAN 99 P23064 9842 CARSEM DM823017AB SOT-223 DS1803 A2 NOV 98 P22797 9833 CHIPPAC, KOREA DS1869 A3 MAR 99 P23360
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J-STD-020
DM823017AB
DS1233
DS1803
DS1869
DS2109
DS2153
DS2175
DS5002
P23064
dallas date code ds12887
dallas date code
P23073
DS1225A
DALLAS DS80C320
9832
P23403
dallas date code ds80c320
P23074
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DS1233 a5
Abstract: e8 sot223 9915 dallas 25010 DN819 densit DS1232L ds1232l datasheet DS1869 DK815282AAB
Text: RELIABILITY MONITOR STRESS: WRITE CYCLE STRESS CONDITIONS: 85 C, 7.0 VOLTS MONITOR DATE ASSEMBLY DATE PRODUCT REV JOB NO CODE FACILITY LOT NO. DS1621 A7 JUN '99 24325 9915 ATP Anam, PI DK815282AAB SOIC 50 45 DS1621 A7 SEP '99 24466 9930 ATP (Anam, PI) DK906731AAC SOIC
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DS1621
DK815282AAB
DK906731AAC
DS1869
DJ821534ABB
DJ824252AAC
DJ824247ABA
DS1233 a5
e8 sot223
9915
dallas 25010
DN819
densit
DS1232L
ds1232l datasheet
DS1869
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DS80C320
Abstract: No abstract text available
Text: DALLAS SEMICONDUCTOR ERRATA SHEET DS80C320 Revision B3 04/28/03 Revision B3 may be identified by the date/revision brand yywwB3, where yy and ww are the year and work-week of manufacture, respectively. This errata sheet is valid only when used in conjunction with
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DS80C320
0000h
0000h,
DS80C320
|
25821
Abstract: dallas date code ds12887 25854
Text: RELIABILITY MONITOR STRESS: WRITE CYCLE STRESS CONDITIONS: 85 C, 7.0 VOLTS MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY LOT NO. DS1621 A7 MAR '00 25224 9950 OSEP DE940040AAC SOIC 50 50 DS1869 A3 JUN '00 25547 0017 CPS ChipPac, China DH833210AAB SOIC
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DS1621
DS1869
DE940040AAC
DH833210AAB
DS2181A
DS5002
DE004552ABD
DN012259AAL
DN028766AAD
25821
dallas date code ds12887
25854
|
dallas date code ds1230
Abstract: No abstract text available
Text: RELIABILITY MONITOR STRESS: WRITE CYCLE STRESS CONDITIONS: 85 C, 7.0 VOLTS MONITOR DATE ASSEMBLY PRODUCT REV DATE JOB NO CODE FACILITY LOT NO. PACKAGE READ POINT QTY FAIL DS1620 D1 JUN '01 27096 0109 CPS ChipPac, China DH046190AAI SOIC 50 50 DS1869 A3 JUN '00
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DH046190AAI
DS1620
DS1869
DH833210AAB
DS5002
DN028766AAD
DN030363AAA
J-STD-020
DS1302
dallas date code ds1230
|
DS80C320
Abstract: No abstract text available
Text: DALLAS SEMICONDUCTOR ERRATA SHEET DS80C320 Revision B3 03/13/01 Revision B3 may be identified by the date/revision brand yywwB3, where yy and ww are the year and workweek of manufacture, respectively. This errata sheet is valid only when used in conjunction with
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DS80C320
DS80C320
|
Untitled
Abstract: No abstract text available
Text: DALLAS SEMICONDUCTOR ERRATA SHEET DS80C320 Revision B3 03/13/01 Revision B3 may be identified by the date/revision brand yywwB3, where yy and ww are the year and workweek of manufacture, respectively. This errata sheet is valid only when used in conjunction with
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DS80C320
|
Untitled
Abstract: No abstract text available
Text: 08/23/2004 RELIABILITY REPORT FOR DS80C310, D2 Dallas Semiconductor 4401 South Beltwood Parkway Dallas, TX 75244-3292 Prepared by: Ken Wendel Reliability Engineering Manager Dallas Semiconductor 4401 South Beltwood Pkwy. Dallas, TX 75244-3292 Email : ken.wendel@dalsemi.com
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DS80C310,
JESD78,
|
8051 instruction set
Abstract: 9703b ic 555 timer SH 05.22 80C32 DS80C320 DS80C320-ECG DS80C320-ENG DS80C320-MCG DS80C320-MNG
Text: DS80C320/DS80C323 High-Speed/Low-Power Micro www.maxim-ic.com FEATURES § § § § § § PIN ASSIGNMENT 80C32-Compatible - 8051 pin and instruction set compatible - Four 8-bit I/O ports - Three 16-bit timer/counters - 256 bytes scratchpad RAM - Addresses 64 kB ROM and 64 kB RAM
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DS80C320/DS80C323
80C32-Compatible
16-bit
DS80C320)
DS80C323)
8051 instruction set
9703b
ic 555 timer
SH 05.22
80C32
DS80C320
DS80C320-ECG
DS80C320-ENG
DS80C320-MCG
DS80C320-MNG
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DS80C320
Abstract: No abstract text available
Text: DALLAS SEMICONDUCTOR ERRATA SHEET DS80C320 Revision A6 04/28/03 Revision A6 may be identified by the date/revision brand yywwA6, where yy and ww are the year and work-week of manufacture, respectively. This errata sheet is valid only when used in conjunction with
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DS80C320
0000h,
DS80C320
|
Untitled
Abstract: No abstract text available
Text: DALLAS SEMICONDUCTOR ERRATA SHEET DS80C320 Revision A6 03/13/01 Revision A6 may be identified by the date/revision brand yywwA6, where yy and ww are the year and workweek of manufacture, respectively. This errata sheet is valid only when used in conjunction with
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DS80C320
|