DEFECT PPM Search Results

200NH-2

Abstract: SM3180
Contextual Info: SM3 SERIES High “Q”, Low DC resistance, Ultra stable. HIGH PERFORMANCE SURFACE MOUNT INDUCTORS Defect rate below 50 PPM. Statistical process control. Chart of central tendency supplied with each lot. Rugged lead frame design. Solder plated copper terminals.

UTC 1316

Contextual Info: VISHAY Vishay Semiconductors Quality Information Vishay Semiconductors’ Continuous Improvement Activities • Quality training for ALL personnel including production, development, marketing and sales departments • Zero defect mindset • Permanent quality improvement process

SM3180

Contextual Info: SM3 SERIES GOWAIMDA HIGH PERFORMANCE SURFACE MOUNT INDUCTORS • High “Q”, Low DC resistance, Ultra stable. ■ Defect rate below 50 PPM. ■ Statistical process control. ■ Chart of central tendency supplied with each lot. ■ Rugged lead frame design.

Contextual Info: T e m ic TELEFUNKEN Semiconductors Quality Information TEMIC Continuous Improvement Activities TEMIC Tools for Continuous Improvement TEMIC conducts quality training for ALL personnel including production, development, marketing and sales departments. Zero defect mindset

SM3-120K

Contextual Info: iOA High "Q", Low DC resistance. Ultra stable. HIGH PERFORMANCE SURFACE MOUN INDUCTORS Defect rate below 50 PPM. Statistical process control. Chart of central tendency supplied with each lot. Rugged lead fram e design. Solder plated copper terminals. Vapor phase and infrared compatible.

Contextual Info: SM3 SERIES GOWAIMDA i* HIGH PERFORMANCE SURFACE MOUNT INDUCTORS ' • High “Q”, Low DC resistance, Ultra stable. ■ Defect rate below 50 PPM. ■ Statistical process control. ■ Chart of central tendency supplied with each lot. ■ Rugged lead frame design.

MA4CS102A SOT23

Abstract: MA4CS101E MA4CS102A 102 SOT-143 MA4CS101A MA4CS101B MA4CS103A MA4CS101 MA4CS102 MA4CS102B
Contextual Info: Surface Mount Schottky Diodes MA4CS101, 102, 103 Series V3.00 SOT-23 Features ● ● ● ● ● High Performance Schottky Diodes Designed for High Volume Pick and Place Assembly Low Profile Surface Mount Packages - Single and Pair Configurations High Quality Products Defect Rate Less Than 50 PPM

Electron Radiation as an Indicator of Gold Nodule Defect during E-beam Evaporation

Contextual Info: Electron Radiation as an Indicator of Gold Nodule Defect during E-beam Evaporation Kezia Cheng Skyworks Solutions, Inc. 20 Sylvan Road, Woburn, MA. kezia.cheng@skyworksinc.com 781 241-2821 Keywords: … Back scattered electron, E-beam evaporation, Gold nodules, Gold spitting

MA4CP101A

Abstract: MA4CP101
Contextual Info: Surface Mount PIN Diode MA4CP101A High Sigma V4.00 Features • • • • • SOT-23 High Performance PIN Diode Designed for High Volume Pick and Place Assembly Low Profile Surface Mount Package High Quality Products Defect Rate Less than 50 PPM Aggressively Priced for High Volume,

Contextual Info: an A M P com pany Surface Mount PIN Diode MA4CP101A High Sigma V4.00 Features • • • • • SOT-23 High Performance PIN Diode Designed for High Volume Pick and Place Assembly Low Profile Surface Mount Package High Quality Products Defect Rate Less than 50 PPM

MA4CP104A

Abstract: MA4CP104 MA4CP101 MA4CP101B MA4CP103A
Contextual Info: HIGH VOLUME HIGH SIGMA commercial sem iconductors HIGH SIGMA Surface Mount PIN Diodes Features High Perform ance PIN Diodes Designed for High Volume Pick and Place Assem bly Low Profile Surface Mount Packages - Single and Pair C onfigurations High Q uality Products Defect

assembly flow chart OPTOCOUPLER

Contextual Info: Tem ic S e m i c o n d u c t o r s Quality Information TEMIC’s Continuous Improvement Activities • Quality training for ALL personnel including production, development, marketing and sales departments • Zero defect mindset • Permanent quality improvement process

Diode SOT-23 marking JE

Contextual Info: M r fa , M a n A M P ci o m p a n y Surface Mount PIN Diode MA4CP101A High Sigma TM V4.00 Features • • • • • SOT-23 High Performance PIN Diode Designed for High Volume Pick and Place Assembly Low Profile Surface Mount Package High Quality Products Defect Rate Less than 50 PPM

epoxy adhesive paste cte table

Abstract: CRACK
Contextual Info: TECHNICAL INFORMATION CRACKS: THE HIDDEN DEFECT by John Maxwell AVX Corporation Abstract: Cracks in ceramic chip capacitors can be introduced at any process step during surface mount assembly. Thermal shock has become a “pat” answer for all of these cracks, but about 75 to 80% originate from

MP 1009 es

Abstract: BS-00001
Contextual Info: ^EDI B c e tro n lc D e s ig n i Inc. Reliability Program Quality Assurance Policy The Quality Standard at Electronic Designs Incorpo­ rated EDI is defect free work. No other standard is acceptable. This policy is reflected in the attention given to the

defect ppm sampling

Abstract: marking 209e 209E wafer fab control plan 002 209e metals quality MANUALS
Contextual Info: CHAPTER 3 PROCESS CONTROL “Emphasis is on defect prevention so that routine inspection will not be needed to a large extent. The burden of quality proof lies not with inspection but with the makers of the part.” Armand V. Feigenbaum In SGS-THOMSON the term “Process Control”

statistical process control

Abstract: AN5063 spcc APP5063 yield
Contextual Info: Maxim > Design Support > App Notes > A/D and D/A Conversion/Sampling Circuits > APP 5063 Maxim > Design Support > App Notes > Automatic Test Equipment ATE > APP 5063 Maxim > Design Support > App Notes > Digital Potentiometers > APP 5063 Keywords: statistical process control, yield defects, Gaussian distribution, Six Sigma, prediction yield analysis, defect opportunity per

defect ppm sampling

Contextual Info: Signetics Quality and Reliability Military Products SIG N ETICS MILITARY PRODUCT QUALITY SIG N ETICS SHIP-TO-STOCK STS PROGRAM Signetics Quality leadership begins with the In­ dustry's first zero defect warranty. If a single de­ fect is found in any lot that we ship, the entire lot

ferrite core E19

Abstract: fair rite 43
Contextual Info: 17t hEdi t i on Our Position on Quality And the Environment - Fair-Rite Products Corp. is committed to be "Your Signal Solution". Management and employees continue to adhere to the ISO/TS 16949 quality system, in effect at the time of the printing of this catalog revision, providing continual improvement towards defect

Contextual Info: W I R E L E S S 4 fiC Quality Corporate Quality Policy Atm el will provide a Competitive Advantage to its Customers through Timely, Innovative, Defect-Free Products and Outstanding Service Driven by a Culture o f Systematic Continuous Improvement. F igure 1. A tm el W ireless & M icro co n tro llers quality policy

Propeller Clock circuit

Abstract: propstick usb
Contextual Info: Propeller Education Kit Labs Fundamentals Version 1.2 web release 2 By Andy Lindsay WARRANTY Parallax Inc. warrants its products against defects in materials and workmanship for a period of 90 days from receipt of product. If you discover a defect, Parallax Inc. will, at its option, repair or replace the merchandise, or refund the purchase price. Before returning the

Contextual Info: Dallas Semiconductor IME 3Q01 DS2118 DS16A43 DS1050 5508 9090 9983 40 11 4004 1102 Totals for 0.6um: 14598 40 2740 DS1232 DS1780 DS21T07 9989 6704 9989 3 2 300 298 Totals for 0.8um: 26682 5 187 Goal = 300 ppm Ken Wendel 4/20/01 Dallas Semiconductor IME 3Q01

DS80CH11

Abstract: 9883
Contextual Info: Dallas Semiconductor IME 3Q01 Product Tested Fails ppm DS2118M DS21X5Y DS80CH11 12380 5182 9191 3 14 66 242 2409 7181 Totals for 0.6um: 27031 83 3071 DS1232 DS87C520 DS2154 9883 10936 12243 3 14 21 304 1280 1715 Totals for 0.8um: 31278 38 1215 Goal = 300 ppm

Oxygen Sensors

Abstract: sox sensor 20/o2 sensor
Contextual Info: Oxygen sensor module FCX-M Data sheet •Features ・High accuracy ・Long life More than 3 years in normal air *1 ・Continues calibration and maintenance not required *2 ・Calibration gas not required ・From ppm to 95%O2, wide measurement range ・No interfarance to media