ENDURANCE TEST REPORT Search Results

MSC1210 Flash Routines

Abstract: JESD22-A117 SBAA085 programming MSC1210 MSC1210 1486-012 JESD22a117 msc1210 flash programming
Contextual Info: Application Report SBAA091 – April 2003 Maximizing Endurance of MSC1210 Flash Memory Ramesh Saripalli Data Acquisition Products—Microsystems saripalli_ramish@ti.com ABSTRACT The MSC1210 embeds an 8051 CPU, a high-performance, delta-sigma, 24-bit analog-todigital converter ADC , 4/8/16/32K bytes flash memory (Flash) and other peripherals to give a

transistor poly3

Abstract: RR510 RR-504 RR-520 X28C256 rr520
Contextual Info: Xicor Endurance Report Xicor Endurance Report RR-520 H. A.R. Wegener INTRODUCTION This report describes endurance relating to Xicor’sproducts employing the Direct WriteTM cell. These devices display enhanced endurance cycling characteristics that are attributable to the direct write cell, process

RR502A

Abstract: RR504 x2864 X2864A X2816A RR-504 predicting xicor X2816A
Contextual Info: U ff !' VH I I I I iiJ r r* > 3* / y h \ 'i DETERMINING SYSTEM RELIABILITY FROM E2PROM ENDURANCE DATA By Richard Palm • D ata retention refers to the capability of a non­ volatile m emory device to retain valid data under worst case conditions. Xicor has published numerous reliability reports

Contextual Info: EEPROM Reliability The reliability of AMD's NS-18 process used in the fabrication of 64K EEPROMs is described in this report. The reliability monitors used at AMD were designed to predict the future operating life results by accelerat­ ing failure rates. The monitors include data from endur­

TA-NWT-000983

Abstract: Mil-Std-883D SG608 CDX2155 CDX2622 SDX1155 UL-94-VO mil-std 883d method 1010 MILSTD-883D
Contextual Info: Interim Qualification Report 2000 Hours Endurance Reliability Data CDX2155, CDX2622 Summary The CDX2155 and CDX2622 transceivers have been successfully qualified in accordance with the requirements of Bellcore document TA-NWT-000983, under the supervision of HewlettPackard FCO Quality and

Contextual Info: What H E W L E T T * mL'fiM P A C K A R D Interim Qualification Report 2000 Hours Endurance Reliability Data CDX2155, CDX2622 Summary The CDX2155 and CDX2622 transceivers have been success­ fully qualified in accordance with the requirements of Bellcore

5966-1888E

Contextual Info: Interim Qualification Report 2000 Hours Endurance Reliability Data HFCT-5202, HFCT-5207 Summary The HFCT-5202 and HFCT-5207 transceivers have been successfully qualified in accordance with the requirements of Bellcore document TA-NWT-000983, under the supervision of HewlettPackard Quality and Reliability

report on dc motor

Abstract: B150 C150 C300 E56140 endurance test report
Contextual Info: File E56140 Vol. 2 Sec. 1 and Report Page 1 Issued: Revised: 07-07-86 09-04-98 D E S C R I P T I O N PRODUCT COVERED: Component - Magnetic Motor Controllers, Model Series VB and VS, may be followed by L, followed by 3 through 110, may be followed by S, followed by B,

sd667

Abstract: SE621 FDX1125B SDX1155 SDX1155B UL-94-VO IEC-68-2-20 TA-NWT-000983 se6303 SE6211
Contextual Info: Interim Qualification Report 2000 Hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extremes as set out in Bellcore TA-NWT-000983. All

SE6211

Abstract: RSE635204 SE630505
Contextual Info: ma I H EW L E T T K firn P A C K A R D Interim Qualification Report 2000 Hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extremes as set out

SE6211

Abstract: se6303
Contextual Info: W hatHEW LETT mL'HM PACKARD Interim Qualification Report 2000 hours Endurance Reliability Data SDX1155B, FDX1125B Summary This report summarizes the Qualification testing of both the SDX1155B and FDX1125B over a range of environmental and mechanical extrem es as set out in

CTL4468-002

Abstract: lbff 1408150-1
Contextual Info: 501-672 Qualification Test Report 30Jan08 Rev A Series MMCX 50 Ohm Micro-Miniature Connectors 1. INTRODUCTION 1.1. Purpose Testing was performed on the Tyco Electronics Series MMCX 50 ohm micro-miniature connectors to determine their conformance to the requirements of Product Specification 108-2084 Revision A.

MB91F376G

Abstract: FMl 125 0629 LQFP-120
Contextual Info: １／３ Reliability Engineering Report Summary Sheet 0.35um Process Technology Flash-MCU （Fujitsu Semiconductor Technology） Package Type: LQFP 0629 FML Quality Assurance Division Fujitsu Microelectronics Limited Confidential ２／３ Reliability Test

Contextual Info: Qualification Report 5000 hours Endurance Reliability Data HFCT-5208 Summary The HFCT-5208 transceiver has been successfully qualified in accordance with the requirements of Bellcore Document TA-NWT-000983 under the supervision of HewlettPackard Quality and Reliability

TA-NWT-000983

Contextual Info: Qualification Report Reliability Data XMT5x70x-155 XMT5170B-622 XMT5370x-622 Summary The XMT5x70x-155, XMT5170B-622 and XMT5370x-622 transmitter modules have been successfully qualified in accordance with the requirements of Bellcore Document TA-NWT-000983 under

MIL-STD-883C 1010.7

Abstract: ED-4701 LH28F320S3NS 7022 ED-4701-1
Contextual Info: S H A R P * RELIABILITY TEST REPORT Product Type ! Model No. ! P a c k a g e ! Date Smart voltage 32Mbit Flash Memory LH28F320S3NS 56Pin SSOP SSQP056-P-0600 : NOV. 10 , 1998 'JL-' . ? GENERAL raANAGER M.NAKAJÏMA QUALITY ASSURANCE DEPARTMENT QUALITY & RELIABILITY CONTROL CENTER

SLAA334A

Abstract: MSP430F1xx MSP430F4xx MSP430 flash "high temperature data retention" mechanism
Contextual Info: Application Report SLAA334A – September 2006 – Revised April 2008 MSP430 Flash Memory Characteristics Peter Forstner . MSP430 Applications ABSTRACT Flash memory is a widely used, reliable, and flexible nonvolatile memory to store

GT 1081

Abstract: transistor GT 1081 58993 IEC825-1 LST062X-SC-A iec 90092 74469 SL400518 34636 sl447
Contextual Info: Single Mode SC Connectorized Laser Transmitter Module Reliability Data LST062X-SC-A Summary This report details the qualification testing of the LST062*-SC-A laser transmitter over a range of environmental and mechanical extremes in line with the requirements of Bellcore TA-NWT000983 “Reliability Assurance

Contextual Info: M 1996 Annual Reliability Report compiled 7/97 INTRODUCTION RELIABILITY CONTROL SYSTEM “Quality Comes First” By adhering to this guiding value, Microchip Technology Inc. has achieved competitive leadership in quality and reliability for its products. Demonstrated performance

24lc56

Contextual Info: 1995 Reliability Report Published 9/96 INTRODUCTION RELIABILITY CONTROL SYSTEM By adhering to this guiding value, Microchip Technology Inc. has achieved competitive leadership in quality and reliability for its products. Demonstrated performance levels of less than 100 Failures in Time (FITS) for most

U637256DC70

Abstract: U637256DK70 U637H256DC25 U637H256DK25 U637H256 Preconditioning 336H
Contextual Info: Dresden, Jan.26th,1999 Gersdorf,QP (0351 8822 586 Qualification Report Function: Package: Lot no.: U637H256DC25 / U637256DC70 U637H256DK25 / U637256DK70 32k x 8 nvSRAM „ Cap - Store „ DIP 28 ( 600mil ) plastic 2259041, 225941A, 2279821, 2279821A Test results

24lc56

Abstract: LA 7670 block diagram of electric cooker EEPROM retention testing eprom 24c04 royal fuse curves PIC16C54 PIC16C55 PIC16C56 PIC16C57
Contextual Info: 1995 Reliability Report Published 9/96 INTRODUCTION RELIABILITY CONTROL SYSTEM By adhering to this guiding value, Microchip Technology Inc. has achieved competitive leadership in quality and reliability for its products. Demonstrated performance levels of less than 100 Failures in Time (FITS) for most

EPROM retention bake

Contextual Info: M 1998 Semi-Annual Reliability Report compiled 10/98 INTRODUCTION RELIABILITY CONTROL SYSTEM Quality Comes First By adhering to this guiding value, Microchip Technology Inc. has achieved competitive leadership in quality and reliability for its products. Demonstrated performance

Contextual Info: M 1998 Semi-Annual Reliability Report compiled 10/98 INTRODUCTION RELIABILITY CONTROL SYSTEM Quality Comes First By adhering to this guiding value, Microchip Technology Inc. has achieved competitive leadership in quality and reliability for its products. Demonstrated performance