ION CHAMBER Search Results

samsung battery charger

Abstract: ic 4570 8pin 8 pin ic 4570 datasheet 200B FDC638P NDP6020P TC3827
Contextual Info: TC3827 Lithium-Ion Battery Charger FEATURES GENERAL DESCRIPTION • ■ ■ ■ ■ ■ ■ ■ ■ The TC3827 is a battery charger controller for a single cell Li-Ion battery. Using an external PMOS transistor, safe and fast charging of a single Li-Ion cell is accomplished.

DMC-50448N

Abstract: DMC50448N HD44780 cog 100
Contextual Info: First Edit ion Approved by Product ion Div. Nov 21, 2000 Checked by LCD Module Specification Qualit y Assurance Div. Final Revision Checked by * Type No. ＤＭＣ５０４４８Ｎ−ＡＡＥ−ＡＤ Prepared by Product ion Div. Table of Cont ent s

NDS8434

Abstract: CD10 G42-88 IRF7404 MA2Q705 MCP73828 diode 3982
Contextual Info: M MCP73828 Single Cell Lithium-Ion Charge Management Controller with Charge Complete Indicator and Temperature Monitor Features Description • Linear Charge Management Controller for Single Lithium-Ion Cells • High Accuracy Preset Voltage Regulation: +1% max

"Charge Management Controller"

Abstract: nec 2401 MCP73827 NDS8434 G42-88 IRF7404 MA2Q705 M3328 IRF74 D 4206 TRANSISTOR
Contextual Info: M MCP73827 Single Cell Lithium-Ion Charge Management Controller with Mode Indicator and Charge Current Monitor Features Description • Linear Charge Management Controller for Single Lithium-Ion Cells • High Accuracy Preset Voltage Regulation: + 1% max

transistor 2 SC 4242

Abstract: package marking 18w 26 sot23 nec 2401 MCP73826 IRF7404 MCP73826-4.2VCHTR MA2Q705 NDS8434 MARKING TR SOT23-6 P MOSFET sot-23 marking code 18w 26
Contextual Info: M MCP73826 Single Cell Lithium-Ion Charge Management Controller Features Description • Linear Charge Management Controller for Single Lithium-Ion Cells • High Accuracy Preset Voltage Regulation: +1% max • Two Preset Voltage Regulation Options: - 4.1V - MCP73826-4.1

MCP73861

Abstract: MCP73862 MCP7386X MO-220
Contextual Info: MCP73861/2 Advanced Single or Dual Cell, Fully Integrated Li-Ion / Li-Polymer Charge Management Controllers Features Description • Linear Charge Management Controllers - Integrated Pass Transistor - Integrated Current Sense - Reverse-Blocking Protection

Contextual Info: PS501 Single Chip Field Reprogrammable Battery Manager Pin Description • Single chip solution for rechargeable battery management • Footprint compatible with PS401 • SMBus 1.1 and SBData 1.1 compatible • Precise capacity reporting for Lithium Ion and

IS-139ASRH

Abstract: LM139 SN13 80MeV PF0300 is139a
Contextual Info: Single Event Testing of the IS-139ASRH Quad Comparator October 2000 Introduction The intense heavy ion environment encountered in space applications can cause a variety of transient and destructive effects in analog circuits, including single-event latchup SEL ,

PIC lead acid battery charger

Abstract: TDA 3780 lead acid battery SoC measurement circuitry PS401 Smart Battery IC Users Guide 103ETB PIC18 PS401 PS501 PIC18 sleep command lead acid battery charger schematic pic
Contextual Info: PS501 Single Chip Field Reprogrammable Battery Manager • Single chip solution for rechargeable battery management • Footprint compatible with PS401 • SMBus 1.1 and SBData 1.1 compatible • Precise capacity reporting for Lithium Ion and Lithium Polymer battery chemistries

IS-1845ASRH

Contextual Info: Single Event Testing of the IS-1845ASRHPulse Width Modulator Introduction The intense heavy ion environment encountered in space applications can cause a variety of transient and destructive effects in analog circuits, including single-event latchup SEL , single-event transient (SET) and

Electron Multipliers

Contextual Info: PRODUCT LINE-UP Electron multipliers are mainly used as positive/negative ion detectors. They are also useful for detecting and measuring vacuum UV rays and soft X-rays. Hamamatsu electron multipliers have a high gain multiplication factor yet low dark current, allowing

IR2110 equivalent

Abstract: ac control using ir2110 and mosfet IR2110 application note IS-2100ARH IS2100ARH ac control using ir2110 IR2110 HIP2500 AN IR2110 IS-2100
Contextual Info: Single Event Testing of the IS-2100ARH Half Bridge Driver Introduction The intense heavy ion environment encountered in space applications can cause a variety of transient and destructive effects in analog circuits, including single-event latchup SEL , single-event upset (SEU) and single-event burnout (SEB). These effects can lead to

PT-1000 sensor chart table

Contextual Info: Chart recorder DS 400 mobile Affordable, mobile chart recorder ‡Flow ‡Pressure / Vacuum ‡Temperature ‡Moisture / Dew point ‡Optional third-party sensors Internal rechargeable Li-Ion batteries, approx. 8 h

Contextual Info: Advanced I nform at ion S m a r t M e s h I P LT C5 8 0 0 - I P M 2.4 GHz 802.15.4 Eterna T M Mote-on-Chip About SmartMesh IP Dust Networks’ new standards-based SmartMesh® IP product line achieves unsurpassed levels of networking resilience and reliability, with

Contextual Info: Advanced I nform at ion S m a r t M e s h I P LT C5 8 0 0 - I P R 2.4 GHz 802.15.4 Eterna TM Embedded Network Manager-on-Chip About SmartMesh IP Dust Networks’ new standards-based SmartMesh® IP product line achieves unsurpassed levels of networking resilience and reliability, with

Contextual Info: Advanced I nform at ion S m a r t M e s h I P LTP5 9 0 1 / LTP5 9 0 2 - I PR 2.4 GHz 802.15.4 Eterna T M Embedded Network Manager About SmartMesh IP Dust Networks’ new standards-based SmartMesh® IP product line achieves unsurpassed levels of networking resilience and reliability, with

alps nea

Abstract: alps potentiometer RS60N1219 alps ls frame cp
Contextual Info: N o. $$-96-1116 C u s t o r n e r : ROXBURGH ELECTRONICS LIMITED Da t e : Jan. 31. 1996 A t t e n t ion ‘ Your ie f . N o• Your P a r t. N o :22 0070 A L P S ’ : RS60N1219 lOkA X 2 MODEL Spec. No. _S a m P I e R E C E IP T : No. • G0446377M STATUS

Amersham

Abstract: ionization chamber DSCA3
Contextual Info: SD3A fàkSupertex inc. ion Chamber Type Smoke Detector Circuit Ordering Information Device Package Order No. SD3A 14 Pin Plastic SD3AP Features General Description □ Capable of Directly Driving Piezoelectric Horn □ Multiple I/O Station Capability

HAMAMATSU L9491

Contextual Info: ADVANCED ELECTROSTATIC REMOVER "Particle Free" "Ozone Free" "No Air Flow" Compact & Power supply compatible in world-wide & CE marking compliance ACTUAL SIZE Introducing a electrostatic charge removal using "PHOTOIONIZATION"!! ADVANCED ELECTROSTATIC REMOVER

ESD test plan

Abstract: vqe 14e IR 134E 463E-04 VQE 13E WE VQE 23 F 47AG mosfet 9420 vqe 24e WE VQE 11 E
Contextual Info: Single Event Effects Test Report R5, 100V, SE, N R5, 130V, SE, N R5, 150V, SE, N R5, 60V, N R5, 30V, N March 2000 - B.N.L. 233 Kansas Street El Segundo CA 90245 Fax-On-Demand 310 252 7100 Website WWW.irf.com International Rectifier Corp. SEE Test Report March 2000 - B.N.L.

HAMAMATSU L9491

Contextual Info: ADVANCED ELECTROSTATIC REMOVER "Particle Free" "Ozone Free" "No Air Flow" Compact & Power supply compatible in world-wide & CE marking compliance Introducing a electrostatic charge removal using "PHOTOIONIZATION"!! L12645 ADVANCED ELECTROSTATIC REMOVER

JESD57

Abstract: DAC121S101WGRQV F-1192 DAC121S101QMLV DAC121S101 LM124
Contextual Info: This material is posted here with permission of the IEEE. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.

ADC08D1000DEV

Abstract: AD677 WAVEVISION4 ADC08D1000WG-QV XC4VLX15 JESD57 for lvds ADC hard radiation
Contextual Info: The material is posted here with permission of the IEEE. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained fron the IEEE by writing to pubs-permissions.org.

DAC121S101WGRQV

Abstract: Micro Linear cross DAC121S101 DAC121S101QML LM124 F-1192 DAC121S101QMLV output impedance calculation in LM124 JESD57
Contextual Info: Single Event Transient Response Dependence on Operating Conditions for a Digital to Analog Converter Kirby Kruckmeyer, Member, IEEE, James S. Prater, Bill Brown and Sandeepan DasGupta Abstract—The Single Event Effect SEE characterization of a Digital to Analog Converter (DAC) showed an unexpected Single