SI53304 Search Results

SI53304 Datasheets (2)

Part	ECAD Model	Manufacturer	Description	Datasheet Type	PDF	PDF Size	Page count
SI53304-B-GM		Silicon Laboratories	Clock/Timing - Clock Buffers, Drivers, Integrated Circuits (ICs), IC TRANSLATOR BUFF/LEVEL 32QFN	Original	PDF		33
SI53304-B-GMR		Silicon Laboratories	Clock/Timing - Clock Buffers, Drivers, Integrated Circuits (ICs), IC TRANSLATOR BUFF/LEVEL 32QFN	Original	PDF		33

Catalog Datasheet	Type	Document Tags	PDF
Si53304 Contextual Info: Si53304 1:6 L OW J I T T E R U NIVERSAL B U F F E R /L EVEL T RANSLATOR WITH 2 : 1 I NPUT M UX A N D I NDIVIDUAL OE Features         6 differential or 12 LVCMOS outputs  Ultra-low additive jitter: 100 fs rms  Wide frequency range: 1 to 725 MHz	Original	Si53304 32-QFN	PDF
Contextual Info: Si53304 1:6 L OW J I T T E R U NIVERSAL B U F F E R /L EVEL T RANSLATOR WITH 2 : 1 I NPUT M UX A N D I NDIVIDUAL OE Features         6 differential or 12 LVCMOS outputs  Ultra-low additive jitter: 45 fs rms Wide frequency range: 1 to 725 MHz 	Original	Si53304	PDF
si514 Abstract: SI510 Contextual Info: AN765 T HERMAL A NALYSIS OF S I L I C O N L ABS T I M I N G D EVICES 1. Introduction The junction temperature of semiconductor devices affects reliability and performance of Integrated Circuits ICs , including timing devices. This application note provides the following:	Original	AN765 si514 SI510	PDF
CONN TRBLK 4 Abstract: C0402X7R100-104K HEADER_1X3 Contextual Info: Si 5 3 3 0 1 / 4 - E VB Si53301/4 E VALUATION B OARD U SER ’ S G U ID E Description EVB Features The Si53301/4-EVB is used for evaluation of the Si533xx family of low-jitter clock buffers/level translators. As shipped from the factory, this evaluation board has the Si53301 device installed. The entire	Original	Si53301/4 Si53301/4-EVB Si533xx Si53301 Si53304 CONN TRBLK 4 C0402X7R100-104K HEADER_1X3	PDF