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    SN54BCT8374A Search Results

    SN54BCT8374A Datasheets (4)

    Part ECAD Model Manufacturer Description Curated Type PDF
    SN54BCT8374A Texas Instruments SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS Original PDF
    SN54BCT8374A Texas Instruments Scan Test Devices With Octal D-type Edge-Triggered Flip-Flops Original PDF
    SN54BCT8374AFK Texas Instruments SCAN Bridge, JTAG Test Port Original PDF
    SN54BCT8374AJT Texas Instruments SCAN Bridge, JTAG Test Port Original PDF

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    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT374

    F374

    Abstract: SN54BCT8374A SN74BCT8374A
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT374

    F374

    Abstract: SN54BCT8374A SN74BCT8374A
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A

    F374

    Abstract: SN54BCT8374A SN74BCT8374A SN74BCT8374
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A SN74BCT8374

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT374

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E SN54BCT8374A BCT374

    F374

    Abstract: SN54BCT8374A SN74BCT8374A
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A

    F374

    Abstract: SN54BCT8374A SN74BCT8374A
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT374

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT374

    F374

    Abstract: SN54BCT8374A SN74BCT8374A
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A

    BCT8374A

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT374 SCBA004C SDYA010 SDYA012 SZZU001B, SDYU001N, SCET004, BCT8374A

    shift register by using D flip-flop

    Abstract: F374 SN54BCT8374A SN74BCT8374A
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A shift register by using D flip-flop F374 SN54BCT8374A SN74BCT8374A

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT374

    F374

    Abstract: SN54BCT8374A SN74BCT8374A SCBS045e SN74BCT8374 bct8374
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374A SN54BCT8374A F374 SN54BCT8374A SN74BCT8374A SCBS045e SN74BCT8374 bct8374

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E − JUNE 1990 − REVISED JULY 1996 D Members of the Texas Instruments SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW SCOPE  Family of Testability Products


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E SN54BCT8374A BCT374

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E – JUNE 1990 – REVISED JULY 1996 D D D D D description The ’BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability


    Original     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT374

    Untitled

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBSQ45D - JUNE 1990 - REVISED APRIL 1994 I I I • Members of the Texas Instruments SCOPE Family of Testability Products • Octal Test-Integrated Circuits I I • Functionally Equivalent to SN54/74F374


    OCR Scan     		PDF SN54BCT8374A, SN74BCT8374A SCBSQ45D SN54/74F374 SN54/74BCT374 SN54BCT8374A

    GDS741S

    Abstract: SN54BCT8374A SN74BCT8374A SCBS045D-JUNE BI72 74BCT8374
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS S C B S 0 4 5 D -J U N E 1 9 9 0 - REVISED A P R IL 1 99 4 Members of the Texas Instruments SCOPE Family of Testability Products Octal Test-Integrated Circuits SN54BCT8374A . . . JT PACKAGE


    OCR Scan     		PDF SN54BCT8374A, SN74BCT8374A SCBS045D-JUNE APRIL1994 SN54BCT8374A SN74BCT8374A SN54/74F374 SN54/74BCT374 0C174HC1 GDS741S SN54BCT8374A BI72 74BCT8374

    BCT8374

    Abstract: No abstract text available
    Text: SN54BCT8374A, SN74BCT8374A SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS SCBS045E - JUNE 1990 - REVISED JULY 1996 SN54BCT8374A . . . JT PACKAGE SN74BCT8374A . . . DW OR NT PACKAGE TOP VIEW M e m b e r s of the Texas I n s t r u m e nt s SC O PE F a mi l y of Testabil ity P r o d u c t s


    OCR Scan     		PDF SN54BCT8374A, SN74BCT8374A SCBS045E BCT8374