TRD24 Search Results

Contextual Info: THE INFORMATION CONTAINED HEREIN IS CONSIDERED 'PROPRIETARY' TO BEL FUSE INC. AND SHALL NOT BE COPIED, REPRODUCED OR DISCLOSED WITHOUT THE WRITTEN APPROVAL OF BEL FUSE INC. RoHS 2002/95/EC SCHEMATIC E L E C T R IC A L CHARACTERISTICS @ 25*C TURNS RATID TP1

Contextual Info: iSWfcELM SPECIFICATION FOP APPROVAL C u s t o m e r P a r t No.: D e l t a P a r t No.: R J V E 1 U C 9 0 3 1 - R P a r t N a m e : R J 4 5 ICM 1 0 0 0 B a s e - T Rev.: A JtoHSJ 1 Port COMPLIANT 1. M e c h a n i c a l D i m e n s i o n : 1 .2 5 [0 .0 4 9 ]M A X

CQFP 256 PIN actel

Contextual Info: Pr el i mi nar y v 1. 3 54SX Family FPGAs RadTolerant and HiRel Features • 100% Resource Utilization with 100% Pin Locking RadTolerant 54SX Family • Mixed Voltage Support—3.3V Operation with 5.0V Input Tolerance • Tested Total Ionizing Dose TID Survivability Level

Contextual Info: v 2 .0 54SX Family FPGAs RadTolerant and HiRel Hig h D ens it y De vi ces Fe a t ur es • 16,000 and 32,000 Available Logic Gates Rad To ler ant 54S X Fam i ly • Tested Total Ionizing Dose TID Survivability Level • Up to 228 User I/Os • Radiation Performance to 100Krads (Si) (ICC Standby

RTSX32

Abstract: 54SX A54SX16 A54SX32 RT54SX RT54SX72S RTSX16
Contextual Info: v 2 .0 54SX Family FPGAs RadTolerant and HiRel Hig h D ens it y De vi ces Fe a t ur es • 16,000 and 32,000 Available Logic Gates Rad To ler ant 54S X Fam i ly • Tested Total Ionizing Dose TID Survivability Level • Up to 228 User I/Os • Radiation Performance to 100Krads (Si) (ICC Standby

RTSX32

Abstract: RT54SX32-CQ208 trd24 RTSX16 54SX A54SX16 A54SX32 RT54SX RT54SX72S Actel PQFP208
Contextual Info: v2.1 SX Family FPGAs RadTolerant and HiRel Features High Density Devices • • • RadTolerant SX Family • • • • • • Tested Total Ionizing Dose TID Survivability Level Radiation Performance to 100 Krads (Si) (ICC Standby Parametric) Devices Available from Tested Pedigreed Lots

RTSX32

Abstract: TRANSISTOR ASY 28 54SX A54SX16 A54SX32 RT54SX Cqfp256
Contextual Info: Preliminary v1.5.2 54SX Family FPGAs RadTolerant and HiRel Fe a t ur es • Up to 225 User I/Os Rad To ler ant 54S X Fam i ly • Up to 1,080 Dedicated Flip-Flops • Tested Total Ionizing Dose TID Survivability Level E asy L ogi c In teg ra ti on • Radiation Performance to 100Krads (Si) (ICC Standby

TQFP176

Abstract: ami equivalent gates
Contextual Info: Pr el i mi nary v 1. 0 54SX Family FPGAs Features High Performance • 320 MHz Internal Performance • 4.0 ns Clock-to-Out Pin-to-Pin • 0.6 ns Input Set-Up • 0.25 ns Clock Skew High Density • 8,000 to 32,000 Available Logic Gates • 246 User-Programmable I/O

Contextual Info: Preliminary v1.5 54SX Family FPGAs RadTolerant and HiRel Fe a t ur es • Up to 225 User I/Os Rad To ler ant 54S X Fam i ly • Up to 1,080 Dedicated Flip-Flops • Tested Total Ionizing Dose TID Survivability Level E asy L ogi c In teg ra ti on • Radiation Performance to 100Krads (Si) (ICC Standby

panasonic r1551

Abstract: Inventec kbc1122 3C1140 U700D CN702 aux m62 ati VAIL2-0 TP9054 slg8lp462
Contextual Info: CONISTON 1.0 PAGE 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 PAGE PAGE TABLE OF CONTENTS SYSTEM BLOCK DIAGRAM POWER BLOCK DIAGRAM DC & BATTERY CHANGER BATTERY CONN & SELECT SYSTEM POWER +V3A / +V5A CPU POWER (+VCC_CORE) SYSTEM POWER (+VCCP / +V1.5S)

0826-1X

Abstract: 08261X1TGJ-F
Contextual Info: THE INFORMATION CONTAINED HEREIN IS CONSIDERED 'P R O P R IE T A R Y ' TO B E L FU S E INC. AND S H A LL NOT BE COPIED, REPRODUCED OR D ISCLOSED WITHOUT THE WRITTEN A P P R O V A L OF B E L FU SE INC. LED 1 PO LA R IT Y PIN 17 PIN 18 COLDR + YE LL O W E L E C T R I C A L C H A R A C T E R IS T IC S g 25°C

Contextual Info: v 2 .0 54SX Family FPGAs RadTolerant and HiRel Hig h D ens it y De vi ces Fe a t ur es • 16,000 and 32,000 Available Logic Gates Rad To ler ant 54S X Fam i ly • Tested Total Ionizing Dose TID Survivability Level • Up to 228 User I/Os • Radiation Performance to 100Krads (Si) (ICC Standby

Orbit Semiconductor

Abstract: CQFP 208 PIN
Contextual Info: Pr el imin a ry v1 .4 54SX Family FPGAs RadTolerant and HiRel F e at u re s H i g h D e n s i ty D e v i c e s R a d T o l e r a n t 5 4 S X F a m i ly • 16,000 and 32,000 Available Logic Gates • Tested Total Ionizing Dose TID Survivability Level • Up to 225 User I/Os

54SX32

Abstract: TRANSISTOR ASY 28 tIRD12 DSA0036603 CQFP 256 PIN actel CQ25 54SX16
Contextual Info: Preliminary v1.5 54SX Family FPGAs RadTolerant and HiRel Fe a t ur es • Up to 225 User I/Os Rad To ler ant 54S X Fam i ly • Up to 1,080 Dedicated Flip-Flops • Tested Total Ionizing Dose TID Survivability Level E asy L ogi c In teg ra ti on • Radiation Performance to 100Krads (Si) (ICC Standby

TQFP176

Contextual Info: BACK Pr el i mi nary v 1. 0 54SX Family FPGAs Features High Performance • 320 MHz Internal Performance • 4.0 ns Clock-to-Out Pin-to-Pin • 0.6 ns Input Set-Up • 0.25 ns Clock Skew High Density • 8,000 to 32,000 Available Logic Gates • 246 User-Programmable I/O

208-Pin CQFP

Abstract: Actel PQFP208 RTSX32
Contextual Info: v2.1 SX Family FPGAs RadTolerant and HiRel Features High Density Devices • • • RadTolerant SX Family • • • • • • Tested Total Ionizing Dose TID Survivability Level Radiation Performance to 100 Krads (Si) (ICC Standby Parametric) Devices Available from Tested Pedigreed Lots