DASF0041602.pdf by Micrel Semiconductor

Partial File Text RELIABILITY REPORT DATE: 4/28/2004 QUALITY ENG : Herb Grimm PURPOSE: Matte Tin Reliability Test Summary. HTOL - High Temperature Operating Life Test TA= + 125°C PACKAGE TYPE : PART N
Datasheet Type Original
RoHS Unknown
Pb Free Unknown
Lifecycle Unknown
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