CY3341DC
Abstract: km350 CY3341PC CY3341
Contextual Info: CY3341 64 x 4 FIFO Serial Memory Features D ata In p u t D ata O utp u t • T he fo u r b its o f d a ta on the Dq through D 3 inputs a re e n te re d into th e first loca tion w hen b o th in p ut ready IR and shift in (SI) are H IG H . This causes IR to go
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CY3341
11ISI
CY3341DC
km350
CY3341PC
CY3341
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cy3341
Abstract: 7C401 cy7c405 EME-6300H 7C404
Contextual Info: Qualification Report April, 1993, QTP# 7191 & 9504, Version 1.0 64 x 4 and 64 x 5 Cascadeable FIFOs MARKETING PART NUMBER DEVICE DESCRIPTION CY3341 CY7C405 64 x 4 Serial Memory FIFO CY7C401/403 64 x 4 Cascadeable FIFO CY7C402/404 64 x 5 Cascadeable FIFO PRODUCT DESCRIPTION (for qualification)
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CY3341
CY7C405)
CY7C401/403
CY7C402/404
CY3341/CY7C401/402/403/404
7C401
cy7c405
EME-6300H
7C404
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CY3341
Abstract: CY3341DMB CY3341PC CY3341DC
Contextual Info: CY3341 CYPRESS . . SEMICONDUCTOR Features Data Input Data Output • 1.2-/2-MHz data rate • Fully TTL compatible • Independent asynchronous inputs and outputs • Direct replacement for PMOS 3341 • Expandable in word length and width • CMOS for optimum speed/power
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CY3341
CY3341
CY3341DMB
CY3341PC
CY3341DC
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CY3341DMB
Abstract: CY3341-2DM
Contextual Info: CY3341 CYPRESS _ SEMICONDUCTOR 64 x 4 FIFO Serial Memory Features Data Input • 1.2/2 M Hz data rate T h e four bits o f d a ta on the Do through D 3 inputs are entered into th e first lo cation w hen both In p u t R eady IR an d Shift In (SI) are H IG H . T his caus
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CY3341
indicati341-2PC
CY3341-2DC
CY3341-2DMB
CY3341
38-00011-B
CY3341DMB
CY3341-2DM
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3341PC
Abstract: CY3341PC CY3341
Contextual Info: CY3341 CYPRESS SEMICONDUCTOR 64 x 4 FIFO Serial Memory Features D a ta Inp u t • 1 .2 /2 M H z d a ta rate • F u lly T T L co m p a tib le • In d ep en d en t a sy n c h r o n o u s in p u ts an d ou tp u ts • D ir e c t r e p la cem en t for P M O S
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CY3341
3341PC
CY3341PC
CY3341
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cy7c9101
Abstract: CY2901 CY7C190 PLD20RA10 CY2149 CY7C122 CY7C148 CY7C149 CY7C150 22V10-Macrocell
Contextual Info: Military Product Selector Guide Static RAMs Size Organization 64 64 1K 1K 4K 4K 4K 4K 4K 8K 8K 16K 16K 16K 16K 16K 16K 16K 16K 16K 32K 32K 32K 32K 32K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 64K 256K 256K 256K 256K 256K 256K 256K 1M 1M
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MILSTD883D
22pin
24pin
28pin
32pin
300mil
cy7c9101
CY2901
CY7C190
PLD20RA10
CY2149
CY7C122
CY7C148
CY7C149
CY7C150
22V10-Macrocell
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verilog for SRAM 512k word 16bit
Abstract: CY62512V CYM74P436 192-Macrocell 62128 sram 7C1350 Triton P54C palce16v8 programming guide 7C168A intel 16k 8bit RAM chip
Contextual Info: Product Selector Guide Static RAMs Organization/Density Density X1 X4 4K X8 X9 X16 X18 X32 X36 7C148 7C149 7C150 16K 7C167A 7C168A 7C128A 6116 64K to 72K 7C187 7C164 7C166 7C185 6264 7C182 256K to 288K 7C197 7C194 7C195 7C199 7C1399/V 62256/V 62256V25 62256V18
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7C148
7C149
7C150
7C167A
7C168A
7C128A
7C187
7C164
7C166
7C185
verilog for SRAM 512k word 16bit
CY62512V
CYM74P436
192-Macrocell
62128 sram
7C1350
Triton P54C
palce16v8 programming guide
7C168A
intel 16k 8bit RAM chip
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cy3341
Abstract: 64K X 4 CACHE SRAM CY7C190 pasic380 cy7c189 palce22v10 programming guide palce16v8 programming algorithm STATIC RAM 6264 vhdl code for 8-bit parity checker 64x18 synchronous sram
Contextual Info: Product Selector Guide Static RAMs Organization/Density Density X1 X4 X4 SIO 7C147 2147 7C123 7C148 7C149 7C150 7C189 7C190 2148 2149 7C122 9122 93422 7C167A 7C168A 7C169A 7C170A 7C171A 7C172A 7C128A 7C187 7C164 7C166 7C161 7C162 7C185 6264 7C182 7C197 7C194
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7C147
7C123
7C148
7C149
7C150
7C189
7C190
7C122
7C167A
7C168A
cy3341
64K X 4 CACHE SRAM
CY7C190
pasic380
cy7c189
palce22v10 programming guide
palce16v8 programming algorithm
STATIC RAM 6264
vhdl code for 8-bit parity checker
64x18 synchronous sram
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CY27S03A
Abstract: 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide
Contextual Info: Thermal Management and Component Reliability slope of the logarithmic plots is given by the activation energy of the failure mechanisms causing thermally activated wear out of the device see Figure 1 . One of the key variables determining the long-term reliability
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CY7C122
CY27S03A
15JC10
CY7C190
cy7c9101
cy7c122 die
VIC068A user guide
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CY7C9101
Abstract: CY7C510 CY7C190 cy7c189 G30-88 CY7c910 EA 9394 cy3341 CY6116 cy7c901
Contextual Info: fax id: 8511 Thermal Management Thermal Management and Component Reliability One of the key variables determining the long-term reliability of an integrated circuit is the junction temperature of the device during operation. Long-term reliability of the semiconductor chip degrades proportionally with increasing temperatures following an exponential function described by the
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Triton P54C
Abstract: cy7c37128 62128 SRAM adapter 48-pin TSOP CY7C37192 CYM74P436 CY3501A CY7C37512 MIB 30 Product Selector Guide
Contextual Info: Product Selector Guide Fast Static RAMs Organization/Density Density X1 X4 X4 SIO X8 4K 7C147 2147 7C123 7C148 7C149 7C150 2148 2149 7C122 9122 93422 16K 7C167A 7C168A 7C128A 6116 64K to 72K 7C187 7C164 7C166 7C185 6264 7C182 256K to 288K 7C197 7C194 7C195
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7C147
7C123
7C148
7C149
7C150
7C122
7C167A
7C168A
7C128A
7C187
Triton P54C
cy7c37128
62128 SRAM
adapter 48-pin TSOP
CY7C37192
CYM74P436
CY3501A
CY7C37512
MIB 30
Product Selector Guide
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