HP83000
Abstract: HP8753E Kingston Technology testing of diode SAMSUNG RLC 4Mx1 Hyundai Semiconductor UPD488385FB-C80-45-BF1 UPD488385FB-C80-45BF1 KM418RD8C-RK80
Text: RDRAM Component Testing Summary As part of Intel’s enabling process, the following test/characterization procedure has been implemented on RDRAM components. A small sample of components 2-5 devices has been characterized on an HP83000 tester with Rebus, a test program written by Rambus. The RLC
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HP83000
HP8753E
Kingston Technology
testing of diode
SAMSUNG RLC
4Mx1
Hyundai Semiconductor
UPD488385FB-C80-45-BF1
UPD488385FB-C80-45BF1
KM418RD8C-RK80
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HP83000
Abstract: 0.7 um CMOS process parameters Nitto 9850 JEDEC20 G226 Nitto MP8000 MP8000 ITS9000 atmel PLCC bottom "marking" MG2RTP
Text: Qualpack MG2RT/MG2RTP Qualification Package MG2RT / MG2RTP 0.5 µm Radiation Tolerant SCMOS3 Technology MG2RT / MG2RTP 0.5 µm SCMOS3 1999 August TEMIC SEMICONDUCTORS IS AN ATMEL COMPANY Rev. 0 – 1999 August 1 Qualpack MG2RT/MG2RTP 1. General Information . 3
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HP83000
Abstract: HP83K HP83K tester TDS784 Tektronix TDS784 HP83000F330 F330 hp83 P6245 PC133-SDRAM
Text: Intel PC 133 Validation Specification INTEL PC133 VALIDATION SPECIFICATION Rev. 1.03 Feb. 23, 2000 Intel Corporation Information in this document is provided in connection with Intel products. No license, express or implied, by estoppel or otherwise, to any intellectual property rights is granted by this document.
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PC133
HP83K,
HP83K
HP83000
HP83K tester
TDS784
Tektronix TDS784
HP83000F330
F330
hp83
P6245
PC133-SDRAM
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HP83000
Abstract: Electro SEX X81D1 HP8300 X41D ECL IC NAND
Text: • 7 Ô1 1 D 7 3 O G lb a ^ O Tas B R K Iil Cyclone Series Cyclone Series GaAs Gate Arrays Rockwell Introduction The sub-micron Cyclone Series™ of GaAs gate arrays from Rockwell represent the culmination of over ten years of research and development.
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HP83000
Abstract: LI-300 Signal Path designer FLIP FLOP toggle
Text: O V A t f k ln f lf A ll Lig h tn in g Series - LI300, LI1000 m m tM m jrtm . W % S m m Ultrahigh-Speed GaAs Gate Arrays Features Figure 1 Photomicrograph of the Lightning LI300 array • Advanced HBT GaAs process for high performance • Two array sizes: 300 or 1000 equivalent gates
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LI300,
LI1000
CMO39-90
AA30450
7A11G73
HP83000
LI-300
Signal Path designer
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