MEGAMOS 13 Search Results
MEGAMOS 13 Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
---|---|---|---|
42N15
Abstract: 079A 42N20
|
OCR Scan |
D00D3b4 IXTH42N20, IXTM42N20, IXTH42N15 IXTM42N15 IXTH42N20 IXTM42N20 O-204 O-247 50-200V, 42N15 079A 42N20 | |
35N25
Abstract: ixtm35n30 35N30 800v mosfet megamos 46 08 09 6 IXTH35N25
|
OCR Scan |
IXTH35N25 IXTH35N30 IXTM35N25 IXTM35N30 35N25 35N30 800v mosfet megamos 46 08 09 6 | |
ID 48 Megamos
Abstract: 35N25 IXTM35N25 ixtm35n30
|
OCR Scan |
IXTH35N25 IXTM35N25 IXTH35N30 IXTM35N30 O-204 O-247 IXTH350 ID 48 Megamos 35N25 | |
megamos
Abstract: f g megamos megamos 48 ID 48 Megamos megamos 13 IXTH40N25 IXTH12N95 IXTH12N100 IXTH26N50 IXTH11N95
|
OCR Scan |
O-204 O-247 megamos f g megamos megamos 48 ID 48 Megamos megamos 13 IXTH40N25 IXTH12N95 IXTH12N100 IXTH26N50 IXTH11N95 | |
a 1712 mosfet
Abstract: ixth67n10 ID 48 Megamos K 1120 megamos 46 08 09 6
|
OCR Scan |
IXTH67N08 IXTH67N10 IXTM67N08 IXTM67N10 IXTH67N10, a 1712 mosfet ID 48 Megamos K 1120 megamos 46 08 09 6 | |
Contextual Info: □ IXYS IXTH 13N110 MegaMOS FET Vd s s D25 D DS on = 1100 V* = 13 A = 0.92 Q N-Channel Enhancement Mode éi Maximum Ratings Symbol TestC onditions V DSS Td = 25°C to 150°C 1100 V v DGR Td = 25°C to 150°C; RGS = 1 M£i 1100 V V GS Continuous ±20 V |
OCR Scan |
13N110 O-247 | |
Contextual Info: nixYS MegaMOS FET IXTH/IXTM 13N80 VDSS = 800 V U =13 A ^D S on = O ' * * ß N-Channel Enhancement Mode Symbol Test Conditions Maximum Ratings V * DSS Tj =25°Cto150°C 800 V VDGR Tj = 25° C to 150° C; RGS= 1 Mi2 800 V VGS v GSM Continuous ±20 V Transient |
OCR Scan |
13N80 Cto150 O-247 O-204 O-204 O-247 C2-60 IXTH13NB0 IXTM13N80 C2-61 | |
IRFP 260 M
Abstract: 5n100 6n80 42n20 12N50A IRFP IXTN 36N50 C 67N10 irfp 240
|
OCR Scan |
67N10 75N10 42N20 50N20 35N30 40N30 12N50A 21N50 24N50 30N50 IRFP 260 M 5n100 6n80 IRFP IXTN 36N50 C irfp 240 | |
Contextual Info: IXTH14N100 MegaMOS FET V DSS =1000 V ID25 = 14 A RDS on = 0.82 Q N-Channel Enhancement Mode Symbol Test Conditions v DSS Tj =25°Cto150°C 1000 V v D0H Tj = 25° C to 150° C; RGS= 1 Mft 1000 V VGS v GSM Continuous ±20 V Transient 130 V ^025 Tc =25°C |
OCR Scan |
IXTH14N100 Cto150 O-247 | |
1XTH5N100
Abstract: xth6n90 IRFP460 equivalent IXTH7P50 ixth10p50
|
OCR Scan |
IXTD67N10 IXTD75N10 IRFC250 IXTD42N20 IXTD50N20 IXTD68N20 IRFC254 IXTD40N25 IXTD35M30 IXTD40N30 1XTH5N100 xth6n90 IRFP460 equivalent IXTH7P50 ixth10p50 | |
BSC 031 N 06 NS 3
Abstract: 21N50 ixth21n50 IXTM21N50
|
OCR Scan |
IXTH21N45 IXTH21N50 IXTM21N45 IXTM21N50 IXTH21N50, BSC 031 N 06 NS 3 21N50 | |
Contextual Info: 11 Y\. YS mma f X 1 .1 O v DSS MegaMOS FET IXTH / IXTM 11N80 800 V IXTH / IXTM 13N80 800 V p ^D25 DS on 11 A 0.95 fì 13 A 0.80 Q N-Channel Enhancement Mode Symbol Test Conditions V * DSS ^ V DGR VGS v GSM ' d 25 •d m PD Maximum Ratings = 25°C to 150°C |
OCR Scan |
11N80 13N80 11N80 13N80 O-204 O-247 IXTM13N80 | |
11n80Contextual Info: p V DSS IXTH/IXTM 11N80 800 V IXTH / IXTM 13N80 800 V MegaMOS FET ^D25 DS on 11 A 0.95 Î2 13 A 0.80 Q N-Channel Enhancement Mode Symbol Test Conditions Maximum Ratings V 'o s s Tj = 25°C to 150°C 800 V V«, Tj = 25°C to 150°C ; Ras = 1 M£i 800 V VGS |
OCR Scan |
11N80 13N80 O-247 O-204 C2-67 | |
21N100
Abstract: 21N10 ixtw DIXYS IXTN21N100
|
OCR Scan |
21N100 O-264 Cto150 OT-227 21N100 21N10 ixtw DIXYS IXTN21N100 | |
|
|||
21n50
Abstract: 24n50
|
OCR Scan |
21N50 24N50 to150 O-247 T0-204A T0-204 | |
C246
Abstract: IXTK33N50 C-246
|
OCR Scan |
IXTK33N50 O-264 C2-46 1XTK33NS0 C2-47 C246 IXTK33N50 C-246 | |
17N55
Abstract: MOSFET 17N60 17N60 IXTM17N55 IXTH17N60
|
OCR Scan |
IXTH17N55 IXTM17N55 IXTH17N60 IXTM17N60 O-204 O-247 IXTH17N60, IXTM17N60, 17N55 MOSFET 17N60 17N60 | |
40n50
Abstract: 40n60 equivalent megamos 48 40n60 40N50A megamos IXGM40N60A ID 48 Megamos f g megamos IXGH40N60
|
OCR Scan |
50kHz 40n50 40n60 equivalent megamos 48 40n60 40N50A megamos IXGM40N60A ID 48 Megamos f g megamos IXGH40N60 | |
ixtn15n100Contextual Info: MegaMOS FET IXTN15N100 v ¥ dss ^D25 P DS on = 1000 V = 15 A = 0.6 Q N-Channel Enhancement Mode 6s Symbol Maximum Ratings Test Conditions V DSS Tj = 25°C to 150°C 1000 V vDGH Tj = 25°C to 150°C; RGS = 10 kD 1000 V vas Continuous ±20 V V GSM Transient |
OCR Scan |
IXTN15N100 OT-227 000E21D ixtn15n100 | |
Contextual Info: 1IXYS I MegaMOS FET IRFP470 V DSS D cont N-Channel Enhancement Mode p DS(on) Symbol Test Conditions Maximum Ratings V DSS ^ = 25 °C to 150°C 500 V v DGR ^ = 25 °C to 150°C; RQS = 1 M il 500 V V GS V GSM Continuous ±20 V Transient ±30 V ^D25 Tc = 25 °C |
OCR Scan |
IRFP470 13onditions | |
ixys ixtn 36n50
Abstract: 36N50 IXTN 36N50 C IXYS 36N50 ac motor forward reverse control ixtn36n50 IXTN 36N50
|
OCR Scan |
36N50 10ki2 OT-227 E153432 C2-46 36N50 ixys ixtn 36n50 IXTN 36N50 C IXYS 36N50 ac motor forward reverse control ixtn36n50 IXTN 36N50 | |
35N30
Abstract: rm 1117 ixtm35n30
|
OCR Scan |
35N30 40N30 40N30 O-247 O-204 O-204 O-247 C2-26 rm 1117 ixtm35n30 | |
75n08
Abstract: megamos 46 08 09 6 TL 1074 CT Mosfet K 135 To3 p 75n08 k 1120 P-Channel MOSFET 800v f g megamos
|
OCR Scan |
IXTH75N08 IXTH75N10 IXTM75N08 IXTM75N10 IXTH75N10, IXTM75N10, 0-100V, O-247 75n08 megamos 46 08 09 6 TL 1074 CT Mosfet K 135 To3 p 75n08 k 1120 P-Channel MOSFET 800v f g megamos | |
diode T88
Abstract: f g megamos ixys ixtn 79n20 megamos megamos 13 LD25 IXTN79N20 ixtn 79n20 79N20 425al
|
OCR Scan |
IXTN79N20 OT-227 diode T88 f g megamos ixys ixtn 79n20 megamos megamos 13 LD25 ixtn 79n20 79N20 425al |