MOSFET J 114 Search Results
MOSFET J 114 Result Highlights (5)
Part | ECAD Model | Manufacturer | Description | Download | Buy |
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TCK423G |
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MOSFET Gate Driver IC, 2.7 to 28 V, External MOSFET Gate drive / Inrush current reducing, WCSP6G |
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TCK425G |
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MOSFET Gate Driver IC, 2.7 to 28 V, External MOSFET Gate drive / Inrush current reducing, WCSP6G |
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TCK401G |
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MOSFET Gate Driver IC, 2.7 to 28 V, External MOSFET Gate drive / Inrush current reducing / Auto-discharge, WCSP6E |
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TCK420G |
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MOSFET Gate Driver IC, 2.7 to 28 V, External MOSFET Gate drive / Inrush current reducing, WCSP6G |
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TCK422G |
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MOSFET Gate Driver IC, 2.7 to 28 V, External MOSFET Gate drive / Inrush current reducing, WCSP6G |
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MOSFET J 114 Datasheets Context Search
Catalog Datasheet | Type | Document Tags | |
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2N6756 JAN
Abstract: 2N6755
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OCR Scan |
2N6756 MIL-S-19500/542A contro17) 2N6755 2N6756 JAN | |
Contextual Info: j Ordering number : ENN7005~] P-Channel Silicon MOSFET FTS1018 ISAf/YOl Load Switching Applications Features Package Dimensions • Low O N -resistance. • 4V drive. • M ounting height 1,1mm. unit : mm 2147A [FTS1018] 0.65 3.0 . 0.425 _ £ J Drain Source |
OCR Scan |
ENN7005~ FTS1018 FTS1018] | |
IXFN170N10
Abstract: 170N10 125OC IXFK170N10
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IXFN170N10 IXFK170N10 200ns O-264 170N10 ID125 Figure10. IXFN170N10 170N10 125OC IXFK170N10 | |
Contextual Info: HiPerFETTM Power MOSFET IXFN170N10 IXFK170N10 VDSS I D25 RDS on trr 100V 100V 170A 170A 10mW 10mW 200ns 200ns Single MOSFET Die TO-264 AA (IXFK) Preliminary data Symbol Test Conditions Maximum Ratings IXFK IXFN 170N10 170N10 VDSS VDGR T J = 25°C to 150°C |
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IXFN170N10 IXFK170N10 200ns O-264 170N10 ID125Â Figure10. | |
K1397
Abstract: Shindengen Electric Mfg LTD141 2SK1397 F40W25
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2SK1397 F40W25] K1397 K1397 Shindengen Electric Mfg LTD141 2SK1397 F40W25 | |
44N60
Abstract: 125OC
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44N60 247TM O-264 125OC 44N60 125OC | |
Contextual Info: HiPerFETTM Power MOSFETs IXFX 44N60 IXFK 44N60 VDSS ID25 RDS on Single MOSFET Die trr £ 250 ns Symbol Test Conditions VDSS VDGR T J = 25°C to 150°C T J = 25°C to 150°C; RGS = 1 MW 600 600 V V VGS VGSM Continuous Transient ±20 ±30 V V ID25 IDM IAR TC = 25°C |
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44N60 247TM 125OC | |
Contextual Info: HiPerFETTM Power MOSFETs VDSS trr 900 V 26 A 0.30 W 250 ns 900 V 25 A 0.33 W 250 ns IXFK/IXFX 26N90 IXFK/IXFX 25N90 Single MOSFET Die IDSS RDS on Preliminary data sheet Symbol Test Conditions Maximum Ratings VDSS VDGR T J = 25°C to 150°C T J = 25°C to 150°C; RGS = 1 MW |
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26N90 25N90 25N90 247TM O-264 | |
Contextual Info: PD-9.1000 International j»g Rectifier IRF744 HEXFET Power MOSFET • • • • • Dynamic dv/dt Rating Repetitive Avalanche Rated Fast Switching Ease of Paralleling Simple Drive Requirements Description Third Generation HEXFETs from International Rectifier provide the designer |
OCR Scan |
IRF744 O-220 D-6380 | |
AP9563GH
Abstract: P-Channel mosfet 40V ap9563gh AP9563GJ a12t
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AP9563GH/J-HF O-252 AP9563GJ) 100us 100ms AP9563GH P-Channel mosfet 40V ap9563gh AP9563GJ a12t | |
Contextual Info: AP9563GH/J RoHS-compliant Product Advanced Power Electronics Corp. P-CHANNEL ENHANCEMENT MODE POWER MOSFET Lower Gate Charge BVDSS D -40V RDS ON Simple Drive Requirement Fast Switching Characteristic 40m ID G -26A S Description G Advanced Power MOSFETs from APEC provide the |
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AP9563GH/J O-252 AP9563GJ) O-251 100us 100ms | |
Contextual Info: AP9563GH/J-HF Halogen-Free Product Advanced Power Electronics Corp. P-CHANNEL ENHANCEMENT MODE POWER MOSFET Lower Gate Charge BVDSS D -40V RDS ON Simple Drive Requirement Fast Switching Characteristic 40m ID G -26A RoHS Compliant S Description G Advanced Power MOSFETs from APEC provide the |
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AP9563GH/J-HF O-252 AP9563GJ) 100us 100ms | |
AP9563GH
Abstract: AP9563GJ a12t
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AP9563GH/J O-252 AP9563GJ) O-251 100us 100ms AP9563GH AP9563GJ a12t | |
TO 505Contextual Info: I ^ S S S k ll PRELIMINARY àSPII SFF50N20M SFF50N20Z SOLID STATE DEVICES, INC 14849 Firestone Boulevard • La Mirada,CA 90638 Phone: 714 670-SSDI (7734) • Fax: (714) 522-7424 J in 50 AMP"— 200 VOLTS 0.055 Q N-CHANNEL POWER MOSFET D esigner’s Data Sheet |
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SFF50N20M SFF50N20Z 670-SSDI IXTH50N20 O-254 O-254Z 100-r TO 505 | |
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27n80qContextual Info: HiPerFETTM Power MOSFETs IXFK 27N80Q IXFR 27N80Q IXFX 27N80Q Q-CLASS VDSS ID25 RDS on trr £ 250 ns Single MOSFET Die PLUS 247TM (IXFX) N-Channel Enhancement Mode Avalanche Rated, Low Qg, High dV/dt, Low trr G Symbol Test Conditions VDSS VDGR T J = 25°C to 150°C |
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27N80Q 27N80Q 247TM O-264 | |
Contextual Info: IXYS Advanced Technical Information HiPerFET Power MOSFETs IXFX 180N10 IXFK 180N10 Single M O S FE T D ie Symbol Test Conditions v T j DSS 100 100 V V Continuous Transient i20 i30 V V T0 = 25° C MOSFET chip capability External lead (current limit) Tc =25°C, Notel |
OCR Scan |
180N10 180N10 247TM Cto150 O-264 | |
2sk2673Contextual Info: H V X -n v 'J -X /t^-MOSFET H V X -n SERIES POWER MOSFET • O U T L IN E D IM E N S IO N S Case : IT 0 -3 P 2SK2673 F P 5 W 9 0 H V X 2 5.5 ' 0-3 900v 5a 0.7 • «2 [Unit ’ mm] I R A TIN G S il A b s o lu te Maxim um R a tin g s 3J CJ pL ^ H Item (Tc=25°C ) |
OCR Scan |
2SK2673 FP5W90HVX2) 2sk2673 | |
Contextual Info: IRFS254 A d van ced Power MOSFET FEATURES B V = 250 V ^D S o n = 0 .1 4 Q dss ♦ Avalanche Rugged Technology ♦ Rugged Gate Oxide Technology ♦ Lower Input Capacitance lD = 16 A ♦ Improved Gate Charge ♦ Extended Safe Operating Area ♦ Lower Leakage Current: 10(j,A (Max.) @ V DS = 250V |
OCR Scan |
IRFS254 | |
Contextual Info: IRFP254A A d van ced Power MOSFET FEATURES B V = 250 V ^D S o n = 0 .1 4 Q dss ♦ Avalanche Rugged Technology ♦ Rugged Gate Oxide Technology ♦ Lower Input Capacitance lD = 25 A ♦ Improved Gate Charge ♦ Extended Safe Operating Area TO-3P ♦ Lower Leakage Current: 10(j,A (Max.) @ V DS = 250V |
OCR Scan |
IRFP254A | |
Contextual Info: IRFW710S A d van ced Power MOSFET FEATURES B V DSS - 400 V ^D S o n = 3 .6 Î2 ♦ Avalanche Rugged Technology ♦ Rugged Gate Oxide Technology ♦ Lower Input Capacitance lD = ♦ Improved Gate Charge 2 A ♦ Extended Safe Operating Area ♦ Lower Leakage Current: 10(j,A (Max.) @ V DS = 400V |
OCR Scan |
IRFW710S | |
Contextual Info: IRFP254 A d van ced Power MOSFET FEATURES B V = 250 V ^D S o n = 0 .1 4 Q dss ♦ Avalanche Rugged Technology ♦ Rugged Gate Oxide Technology ♦ Lower Input Capacitance lD = 25 A ♦ Improved Gate Charge ♦ Extended Safe Operating Area TO-3P ♦ Lower Leakage Current: 10(j,A (Max.) @ V DS = 250V |
OCR Scan |
IRFP254 | |
TPCA*8064
Abstract: TK12A10K3 TPCA8077 2SK3567 equivalent SSM3J328 TPCA8077-H TJ11A10M3 TK50E06K3A TPCA*8077 TPCA8028
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BCE0082B TPCA*8064 TK12A10K3 TPCA8077 2SK3567 equivalent SSM3J328 TPCA8077-H TJ11A10M3 TK50E06K3A TPCA*8077 TPCA8028 | |
Contextual Info: IRFS254A A d van ced Power MOSFET FEATURES B V = 250 V ^D S o n = 0 .1 4 Q dss ♦ Avalanche Rugged Technology ♦ Rugged Gate Oxide Technology ♦ Lower Input Capacitance lD = 16 A ♦ Improved Gate Charge ♦ Extended Safe Operating Area ♦ Lower Leakage Current: 10(j,A (Max.) @ V DS = 250V |
OCR Scan |
IRFS254A | |
IXFN40N50Contextual Info: DIXYS IXFN 55N50 IXFN 50N50 IXFK 55N50 IXFK 50N50 Single MOSFET Die rr Test Conditions Maximum Ratings IXFK IXFN IXFN 50 55 50 IXFK 55 Td = 25°C to 150°C T j = 25°C to 150°C 500 500 500 500 V V VGS v GSM Continuous Transient ±20 ¿30 ±20 ±30 V V »D25 |
OCR Scan |
IXFN55N50 IXFN50N50 IXFK55N50 IXFK50N50 O-264 OT-227 IXFK55N50 IXFN55N50 BffW80N50 IXFN40N50 |