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    teradyne A360

    Contextual Info: Reliability Summary of SEC450 GaAs:Si IRED Chip Long-Term Operating Life Study Figure 1 IRED CHIP DEGRADATION STUDIES Honeywell is engaged in an ongoing study of degradation of radiant output over time as a function of temperature for the SEC450 GaAs IRED gallium


    OCR Scan     		SEC450 SEP8505 SEP8506 SEP8507 teradyne A360 PDF

    teradyne A360

    Abstract: IRED A360 SE1450 SE2460 SE3450 SE5450 SEP8505 SEP8506 SE1455
    Contextual Info: Reliability Summary of SEC450 GaAs:Si IRED Chip Long-Term Operating Life Study INTRODUCTION Honeywell is committed to the manufacture of reliable, high quality optoelectronic products. An ISO 9001 quality system is maintained, providing the necessary controls to assure that all product meets or exceeds the


    Original     		SEC450 SE1450/1455 SE3450/5450 SEP8505 SEP8506 SEP8507 teradyne A360 IRED A360 SE1450 SE2460 SE3450 SE5450 SE1455 PDF

    teradyne A360

    Contextual Info: Reliability Reliability Summary of SEC450 GaAs:Si IRED Chip Long-Term Operating Life Study Figure 1 IRED CHIP DEGRADATION STUDIES Honeywell is engaged In an ongoing study of degradation of radiant output over time as a function of temperature for the SEC450 GaAs IRED gallium


    OCR Scan     		SEC450 SE1450 SE1470 SE3453/5453 SE3455/5455 SE34705470 SEP8505 SEP8705 SEP8506 teradyne A360 PDF