CY7B173 Search Results

Contextual Info: CY7B173 CY7B174 CYPRESS SEMICONDUCTOR Features • S u p p orts 50-M H z cach e system s • 3 2 K by 9 com m on I/O • B iC M O S for op tim u m speed/pow er • 14-ns a ccess delay clock to ou tp u t • Two-bit w rap arou nd co u n ter su p p ort­ in g th e 486 b u rst seq u en ce (7B 173)

7b174

Contextual Info: PRELIM INARY CY7B173 CY7B174 r^ y p p u c Q Features • Supports 50-MHz cache systems • 32K by 9 common I/O • BiCMOS for optimum speed/power • 14-ns access delay clock to output • Ttoo-bit wraparound counter support­ ing the 486 burst sequence (7B173)

Contextual Info: PRELIMINARY CYPRESS SEMICONDUCTOR F eatures • S u p p o rts 66-M H z P e n tiu m lu C PU ca ch e system s • A vailab le in stan d ard PLC C /LC C CY7B173A CY7B174A 32K x 9 Synchronous Cache R/W RAM • D irect in terface w ith the p ro cesso r and extern al ca ch e con tro ller

intel 80486

Abstract: CY7B174 44-Square block diagram of processor 80486 80486 circuit AADS
Contextual Info: CY7B173 CY7B174 CYPRESS SEMICONDUCTOR Features • S u p p orts 50-M H z ca c h e system s • 3 2 K by 9 com m on I/O • B iC M O S for op tim u m speed /p ow er • 14-ns a ccess delay clock to ou tpu t • Two-bit w rap arou nd cou n ter su p p ort­

CY7C169

Abstract: 54600
Contextual Info: Thermal Management CYPRESS Part Number CY7B173 CY7B174 CY7B180 CY7B181 CY7B185 CY7B186 CY7B191 CY7B192 CY7B194 CY7C122 CY7C123 CY7C128 CY7C128A CY7C130 CY7C131 CY7C132 CY7C136 CY7C140 CY7C141 CY7C142 CY7C146 CY7C147 CY7C148 CY7C149 CY7C150 CY7C157 CY7C161A

Contextual Info: CY7B173 CY7B174 CYPRESS = SEMICONDUCTOR • Supports 50-MHz cache systems • Asynchronous output enable • 32K by 9 common I/O Functional Description • BiCMOS for optimum speed/power 14-ns access delay clock to output • Two-bit wraparound counter support­

Contextual Info: CY7B180 CY7B181 s CYPRESS SEMICONDUCTOR 4K x 18 Cache Tag Features • Can be used as 4K x 18 SRAM • Supports 66-MHz cache for all major high-speed processors Functional Description T he CY7B180 and CY7B181 are high-perform ance B iC M O S cache tag R A M s orga­

Contextual Info: CY7B180 CY7B181 PRELIMINARY CYPRESS SEMICONDUCTOR Features 4K x 18 Cache Tag • Can be used as 4K x 18 SRAM Functional Description Supports 50-MHz cache for all major high-speed processors 4K x 18 tag organization BiCMOS for optimum speed/power High speed

Contextual Info: CY7B180 CY7B181 I CYPRESS SEMICONDUCTOR 4K x 18 Cache Tag Features • C an be used as 4K x 18 SRAM • Supports 66-MHz cache for all major high-speed processors • 4K x 18 tag organization • BiCMOS for optimum speed/power • High speed — 10-ns match delay

HESE12

Abstract: cd3510
Contextual Info: PRELIM INARY r^ Y p p p C Q - 4K x 18 Cache Tag SEMICONDUCTOR Features • Can be used as 4K x 18 SRAM • Supports 50*MHz cache for all major h ig h sp eed processors F unctional D escription • 4 K x 18 tag organization • BiCMOS for optimum speed/power

ue09

Abstract: CY7B180-12GC cd 2313 UE 09
Contextual Info: CY7B180 CY7B181 AD VAN C ED IN F O R M A T IO N CYPRESS SEMICONDUCTOR 4K x 18 Cache Tag Features Functional Description • 4K x 18 tag organization T h e CY7B180 and CY7B181 are high-perform ance B iCM O S cache tag R A M s orga­ nized as 40% words by 18 bits. Each word

CY62256LL-PC

Abstract: VIC068A-GC VIC64-NC VIC64-UMB PALCE22V10-JI PALC16L8Q PLD VME A113 CY7B923 JESD22-A113
Contextual Info: Cypress Semiconductor Product Reliability 1997 Published June, 1997 CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY TABLE OF CONTENTS 1.0 OVERVIEW OF CYPRESS SEMICONDUCTOR TOTAL QUALITY MANAGEMENT SYSTEM. 1 2.0 ELECTRICAL AVERAGE OUTGOING QUALITY. 2

CY7B180-12JC

Abstract: CY7B181
Contextual Info: CY7B180 CY7B181 ' r CYPRESS SEMICONDUCTOR 4K x 18 Cache Tag Features • Can be used as 4K x 18 SRAM • Supports 66-MHz cache for all major high-speed processors • 4K x 18 tag organization • BiCMOS for optimum speed/power • High speed — 10-ns match delay

11ax

Abstract: 80486 microprocessor pin out diagram
Contextual Info: PRELIMINARY CYPRESS SEMICONDUCTOR Features 32K x 9 Synchronous Cache R/W RAM • D irect interface with the processor and external cache controller Supports 66-M Hz Pentium " CPU cache systems • TWo complementary synchronous chip enables Available in standard PLCC/LCC

7H17

Contextual Info: AD VAN C ED IN FO R M A TIO N CYPRESS SEMICONDUCTOR 32,768 x 9 Synchronous Cache R/W RAM Features • Asynchronous output enable • 32K by 9 common I/O • 44-pin PLCC and LCC • BiCMOS for optimum speed/power Functional Description • 14-ns access delay clock to output

CY27S03A

Abstract: 15JC10 CY7C190 cy7c9101 cy7c122 die VIC068A user guide
Contextual Info: Thermal Management and Component Reliability slope of the logarithmic plots is given by the activation energy of the failure mechanisms causing thermally activated wear out of the device see Figure 1 . One of the key variables determining the long-term reliability

Contextual Info: /D1/J/4A: iü/e/90 Revision: Monday, January 11,1993 -W £3 *993 PRELIMINARY r^ Y P P F Q c — SEMICONDUCTOR 32K x 9 Synchronous Cache R/W RAM • IWo complementary synchronous chip selects • Asynchronous output enable Features • Supports 66-MHz cache systems

CY7C9101

Abstract: CY7C510 CY7C190 cy7c189 G30-88 CY7c910 EA 9394 cy3341 CY6116 cy7c901
Contextual Info: fax id: 8511 Thermal Management Thermal Management and Component Reliability One of the key variables determining the long-term reliability of an integrated circuit is the junction temperature of the device during operation. Long-term reliability of the semiconductor chip degrades proportionally with increasing temperatures following an exponential function described by the

Gunn Diode symbol

Abstract: cy202 CY7C190 WSP-109BMP3 pal22V10D cy7b166 cy7c291 CY7C371 EV film cap calculation gunn diode datasheet
Contextual Info: CYPRESS SEMICONDUCTOR PRODUCT RELIABILITY APPENDIX A: FAILURE RATE CALCULATION Thermal Acceleration Factors Acceleration factors AF for thermal stresses (High Temperature Operating Life, Data Retention and High Temperature Steady State Life) are calculated from the Arrhenius equation.